Thin Film
layer of material ranging < a nanometer to > a micrometer in thickness.
See Also: Film, Ellipsometers
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Explosion Proof In-line Hydrogen Process Analyzer
HY-OPTIMA™ 2700 Series
The HY-OPTIMA™ 2700 Series uses a solid-state, non consumable sensor that is configured to operate in process gas streams. The H2scan thin film technology provides a direct hydrogen measurement that is not cross sensitive to other gases. The HY-OPTIMA™ 2700 Series is ideal for applications where real-time, hydrogen specific measurements can enhance process plant efficiencies, diagnostics and maintenance management.
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Instrumented Indentation Tester
With Anton Paar’s versatile indentation testers you can precisely determine the mechanical properties of thin films, coatings, or substrates such as hardness and elastic modulus. The instruments handle almost any type of material, whether soft, hard, brittle, or ductile. You can also conduct creep, fatigue, and stress-strain studies on surfaces in the nanometer range.
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Large Area Mapping Spectroscopic Ellipsometers for Flat Panel Display and Photovoltaic Industries
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Low Noise Amplifiers
RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.
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Chip Resistors
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide range of Chip Resistors including conventional Thick Film Chip Resistors, Specialized Resistors such as Thin Film, Current Sense, Anti-Sulfur, Anti-Surge and Metal Film Chip Resistors.Panasonic’s standard Thick Film Chip Resistors are offered in cases sizes from 01005 to 2512.
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Vacuum Process And Chamber Environment Monitors
Our process monitors are innovative in-situ process monitoring instruments that are fully integrated, application-specific packages, including component residual gas analyzers (RGAs), analytical equipment, and control software. Process mass spectrometers are used in varied applications, including; Semiconductor, Thin Film (CVD, Etch, PVD and degas), pharmaceutical lyophylization and bulk gas purity monitoring.
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Metrology System
IMPULSE V
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Spectroscopic Ellipsometer
PH-SE
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Time-Resolved Electrochemical Quartz Crystal Microbalance
400C Series
The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
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100GHz Dense Wavelength Division Multiplexer
DWDM-1000
Hangzhou Huatai Optic Tech. Co., Ltd.
DWDM series is based on mature thin film filtering technology and adopt metal sealing technology to encapsulate. It has the feature of flat channel bandwidth, flexible channel configuration, low insert loss and high isolation. The flexibility of channel configuration and modularized design make it convenient for system upgrading and expanding. All the Huatai products have no epoxy glue in optical line and can be used in high power optical communication system.
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Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Ellipsometer
alpha-SE®
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
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ALD Knowledge Center
As one of the first companies to market with a flexible commercially available atomic layer deposition system (ALD), we have a tremendous ALD Knowledge Center for researchers to draw upon. We have gathered together a wide range of information about ALD applications and thin films technology. This includes images and explanations of the exciting uses for ALD. We also gather and provide access to theses on the subject and a searchable database of scientific abstracts.
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Quartz Crystal Microbalance
QCM200
Stanford Research Systems, Inc.
The QCM200 Quartz Crystal Microbalance measures mass and viscosity in processes occurring at or near surfaces, or within thin films. This system includes a controller, crystal oscillator electronics, crystal holder, three quartz crystals, and Windows / Mac software.
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FWDM Module
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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RFoG 4-Band Multiplexer. 1550, 1590 & 1310/1490nm MWDM
WD5943
Hangzhou Huatai Optic Tech. Co., Ltd.
WD5943 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Ozone Gas Delivery Systems
MKS ozone gas delivery systems provide field-proven, high concentration, ultra-clean ozone generation for advanced thin film applications such as Atomic Layer Deposition (ALD), Chemical Vapor Deposition (CVD), Tetraethyl Orthosilicate (TEOS)/Ozone CVD (HDSACVD), contaminant removal and oxide growth. Gas delivery models have integrated ozone concentration monitoring, flow control, and power distribution. Additional system options include safety monitoring, status indicators and ozone destruction capability.
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Fully Integrated Modular Ozone Delivery System
SEMOZON® AX8580
The SEMOZON® AX8580 Ozone Delivery System generates and delivers high flow, high concentration, ultra-clean ozone for advanced thin film applications. The SEMOZON AX8580 is specifically designed for use with an increasing number of semiconductor process applications such as ALD, CVD and TEOS/Ozone CVD.
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Hybrid Amplifiers
Gain Block
Macom Technology Solutions Holdings Inc.
MACOM’s portfolio of hybrid amplifiers cover a frequency range of 10 kHz to 6 GHz. Each amplifier is designed to be unconditionally stable and have excellent cascadability. Our amplifiers are designed using thin film technology and are integrated components thindat include internal DC biasing circuitry, allowing them to maintain excellent electrical performance over the 55˚C to 100˚C range. Hermetically sealed and screened up to space level, these amplifiers are ideally suited for hi-reliability and mission critical applications.
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Polarization Maintaining Band Pass Filter
Zhongke Rayzer Optical Technology Co.,Ltd
Selects the thin film filter withgood performance to ensure the high quality opticalperformance, stability and reliability. It is uses to shieldnoise signal in EDFA and fiber laser system. It has thecharacteristics of high isolation, low insertion loss, highreturn loss and high power.
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100G,200G DWDM OADM Module (4,8-Channel)
Flyin Optronics 100GHz/200GHz wavelength multiplexer(100,200G DWDM OADM Module) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging to achieve optical add or drop at a ITU wavelength. It provides ITU channel center wavelength, low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path . It can be used for wavelength add/drop in telecommunication network system.
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TFProbe Wafer Measurement Tools
Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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RF Amplifiers
UST specializes in the testing, repair and refurbishment of all types of RF amplifiers (broadband and narrowband), microwave amplifiers and millimeter-wave amplifiers: solid state, thin film, traveling wave tube (TWT), low noise RF amplifiers, intermediate power RF amplifiers, limiting RF amplifiers, doubler RF amplifiers, driver RF amplifiers, variable gain RF amplifiers, and active frequency multipliers.
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Remote Plasma Sources
Semiconductor and Electronic Thin Film applications use plasma sources to generate low-energy ions and radicals to react with material surfaces and chamber walls to remove contaminants and act as a precursor to aid in material deposition. MKS provides multiple options for radical generation including Toroidal and Microwave based Remote Plasma Sources supporting Fluorine, NF3, oxygen, nitrogen and hydrogen process chemistries.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
