Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Transformer Oil Gas Analysis
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It is necessary to analyze outgas in transformer insulation oil in power plant facilities. Shimadzu offers a System GC compliant with ASTM D 3612 Method B (oil stripper sampling) or ASTM D 3612 Method C (headspace sampling). The Nexis GC-2030TOGAS3 system, equipped with a PDHID, enables the analysis of more trace amounts of permanent gas than conventional systems.
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Veracode Dynamic Analysis
DAST
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Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Materials Analysis
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Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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Battery Test and Analysis System
BTAS-16
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The task of testing an aircraft’s Nickel-Cadmium batteries is complicated and involved because of the high number of cell voltage readings that need to be taken during testing. Taking voltage readings from all 20 cells in the typical nickle-cadmium aviation battery multiple times is laborious and error prone, but must be done to properly estimate the condition of the battery under test.
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CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Spectrum Analysis For E5081A Up To 20 GHz
S960904B
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The Keysight S960904 spectrum analyzer (SA) software application adds high-performance spectrum analysis to the E5081A ENA-X up to 20 GHz. With fast-stepped FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The application enables simultaneous spectrum measurements using test and reference receivers. The multichannel SA pairs with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application uses source-power and receiver-response calibration and fixture de-embedding, providing highly accurate in-fixture and on-wafer spectrum measurements.
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Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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OC-3/STM-1 And OC-12/STM-4 Analysis And Emulation Card(w/ GigE And USB 2.0)
LightSpeed1000™
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Voice, data, and video traffic is exploding as smartphones, IP TV, video streaming, and "cloud" based services takeoff. A majority of the backbone transport for these applications continues to be SONET and SDH optical transmission networks. A dominant protocol for IP transport is PoS (Packet over SONET) and another is ATM (Asynchronous Transfer Mode). Both schemes are packet based, with ATM using fixed size packets of 53 bytes called "cells", and PoS using variable packet sizes closely matching to Ethernet frames. GL's LightSpeed1000™ hardware platform (PCIe Card and USB Pod) is capable of OC-3/12 and STM-1/4 wire-speed processing on quad optical ports for functions such as wire-speed recording and wire-speed playback of Unchannelized and Channelized ATM, PoS, and RAW Traffic.
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Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Spectrum Analysis For P50xxB Up To 44 GHz
S970907B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Bug Finder Analysis
Polyspace
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Polyspace Bug Finder checks compliance with coding rule standards such as MISRA C, MISRA C++, JSF++, and custom naming conventions. It generates reports consisting of bugs found, code-rule violations, and code quality metrics, including cyclomatic complexity. Polyspace Bug Finder can be used with the Eclipse IDE and integrated into build systems.
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Impact Analysis
MetaDex™
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Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Dynamic Particle Image Analysis System
iSpect DIA-10
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Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Software Composition Analysis
SCA
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Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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C and C++ Testing, Static Analysis, Code Review
C++test
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Parasoft C++test is a complete C/C++ developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes. Available for common enterprise and embedded environments.
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Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Manual Media Analysis Solutions
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Truly one tool to view them all. The Ultimate Analyzing Tool for manual in-depth analysis, verification and validation of various file formats and containers. Metadata extraction and stream manipulation available.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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RF And Microwave Signal Generation And Analysis
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The need for microwave test and measurement technology is even more urgent than the need for microwave equipment itself. Therefore, Shengbo Technology is relying on its own research and development capabilities to strive to become one of the comprehensive microwave test and measurement equipment suppliers. We provide a wide range of RF microwave test products, including a good-quality full-band broadband up-down converter . You can provide 2GHz real-time bandwidth signal up-down conversion function in the frequency range of 0.1 ~ 40 + GHz. With our channel simulator , we Became the first company in the world to provide channel analog solutions in such a wide range of broadband signals. At the same time, we are also an innovativesupplier of noise sources and multi-channel microwave signal sources in the industry.
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Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
Analyzer
WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Organic Elemental Analysis
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Elementar Analysensysteme GmbH
Carbon, hydrogen, nitrogen, oxygen and sulfur are the basic elements of living nature. Their quantitative determination in the most versatile combinations of substances, the elemental analysis, is the origin and essence of the Elementar product portfolio.
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Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
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Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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Advanced Antenna Acquisition & Analysis
SW-A4
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Introducing Advanced Antenna Acquisition and Analysis (A4), the newest antenna measurement software from NSI-MI, expertly engineered for data collection, analysis, automation, and plotting. A4 builds upon the decades of experience and optimization built into NSI-MI’s legacy software platforms, NSI2000 and MI-3000, while adding modern features and capabilities that meet the challenges of today. A4 seamlessly blends the user-friendly interface of NSI2000 with the performance and versatility of MI-3000. Its intuitive design and powerful Application Programming Interface (API) deliver the adaptability needed to handle even the most challenging measurement tasks. A4 offers multicore, multithreaded support to greatly improve processing time while adding the ability to parallelize analysis and transformation tasks. Choose the perfect solution with NSI-MI's four software tiers, each packed with tailored features to match your specific requirements. Let NSI-MI help you choose the ideal package to fully unlock the potential of your antenna measurement range.
