Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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16-Channel VME AC Power Analysis Module
V180
The V180 is a single-width VME module that allows accurate and comprehensive measurement of AC power circuits. The V180 acquires powerline current and voltage inputs using approved current transformers and model C750 remote potential transducers.
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Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Flexoplate Analysis
Quality Engineering Associates Inc.
QEA has the most comprehensive and sophisticated lineup of evaluation tools for flexography, one of the fastest-growing sectors in commercial printing. Our test tools quantify flexo plates, film, masks, photopolymer- and metal-backed plates and sleeves, letterpress, newsprint and direct-engraved plates, as well as the final print.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Inorganic Elemental Analysis
Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Multifunction Data Collection and Analysis System
9000
The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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4G Analysis & Drive Studies
Berkeley Varitronics Systems, Inc.
Portable, calibrated test transmitters and receivers to simulate and analyze cellular 4G LTE, CDMA, UMTS and WiMAX base station coverage for drive study engineers and technicians.
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WAFER MVM-SEM
E3300 Family
The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Measuring & Analysis Equipment
Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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IP Video Stream Analysis And Monitoring
TSM100
The Mividi TSM100 is an MEPG transport stream analyzer and IP video monitoring system for monitoring the quality of digital video services (QoS) delivered via IP or ASI interfaces. It can simultaneously monitor up to 300 services and perform deep MPEG analysis and video quality check 24 x 7. The system can be used for analyzing MPEG-2, H.264 and HEVC programs delivered over the Internet, as well as head-end equipment that uses IP for video transmission. The TSM100 provides IP layer analysis, MPEG transport layer analysis, key frame decoding, audio loudness measurement and service profiling. The system receives IP encapsulated digital audio and video data via 1 Gbits or 10Gbits Network adaptor. It will monitor all media flows in the network, perform extensive tests on standard compliance and user profile matching, and generate alarms when TS, video or audio errors occur.
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Circuit Breaker Analysis System
Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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Materials Analysis
Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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Malware Analysis Tool
ThreatAnalyzer®
See how you can defend your network from targeted attacks, advanced malware and Zero-days with ThreatAnalyzer®, the industry''s premier malware analysis sandbox. Our dynamic malware analysis sandbox (formerly known as CWSandbox) is used to dig deep into malware to reveal its impact on your organization so you can respond quickly – knowing what''s happening on your network and what systems or data are at the greatest risk.
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Analysis Software
The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
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BT Imagine New wafer Thickness System
IS-T1
Measurement Technique Laser Triangulation1-3 Laser Sensor SpotsLaser Spot Size Optimized for Accuracy and Precision.
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Portable Fuel Analysis
MINISCAN IR Vision
The MINISCAN IR VISION is a high speed, compact and robust FTIR fuel analyzer for the comprehensive and automatic measurement of gasoline, jet and diesel fuels. The analyzer is configured to measure more than 100 fuel parameters and components for fuel blending, for quality inspection and to check compliance with fuel specifications directly at the point of sale.
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Structural Analysis
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Image Analysis & Management System
IA44
The IA44 Image Analysis/Management System easily transforms raw data into valuable information that can be communicated with professional results. The combination of powerful image management capabilities and point-and-click simplicity provides a comprehensive solution for users with various levels of expertise.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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Real-Time Broadcast Analysis
Mediaproxy provides a comprehensive suite of software-based analysis applications to help you attend to on-air issues quickly and resolve them efficiently. Employing the latest user interface technologies, complex analysis tasks are made easy and seamless, including your mobile devices.
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Website Analysis Software
Site Content Analyzer 3
Site Content Analyzer 3 is new generation in website analysis software. It parses website on- and offline for keywords, suggests the most relevant and weighty phrases, analyzes link structure, and many more.
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Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Automated Titration Analysis Systems
MANTECH is a leading manufacturer of multi-parameter and titration analysis systems. We can deliver custom analysis systems that perform the following functions: pH, Chloride, Oxygen, Turbidity, Alkalinity, Fluoride, Oxidation-Reduction Potential (ORP), Nitrate, Electrical Conductivity, Color, Salinity, Total Hardness, Acidity, Ammonia, Temperature and Soil pH & Conductivity.
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Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Radio Monitoring and Signal Analysis
Shoghi has a full portfolio of products which fulfill the customer requirements for radio monitoring and signal analysis. Shoghi has a very robust SDR based wideband radio monitoring solution which can be implemented both in static or mobile versions for HF and VHF/UHF frequency bands. The Shoghi Radio Monitoring and DF system is the full-fledged product which provides the facilities for wideband signal reception and advanced signal analysis capabilities in addition to both wideband and narrowband D capabilities. The signal analysis capabilities include the ability to demodulate and decode both narrowband and wideband signals and advanced signal protocol analysis for detection of specific data protocols used in the intercepted RF signals.
