System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 3.55kΩ
40-251-023
Programmable Resistor Module
The 40-251-023 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PCI Precision Resistor Card 6-Channel, 2.5Ω To 1.51MΩ
50-297-044
Programmable Resistor Module
The 50-297 PCI Precision Resistor card provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Portable Test Systems
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We refer to test meters with an integrated source as test systems. Test systems are particularly useful when you need custom current and voltage values when testing meter installations, but only want to use a single device.
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Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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End-of-Line IC & MEMS Tester
igentic® 841t
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Integrated circuit (IC) and micro electro-mechanical system (MEMS) device manufacturers need to address the challenges of today's global market including increased functionality, speed and complexity while delivering components at reduced costs. Sterner Automation's igentic® 841t automated test systems meet these demanding requirements by providing a flexible platform for comprehensive end-of-line IC and MEMS device handling, testing, grading and packaging. The resulting improvements in quality assurance and process efficiency will maximize customer satisfaction and profitability.
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Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 470Ω
40-298-114
Programmable Resistor Module
The 40-298-114 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 470Ω with 2Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Synchro/Resolver Simulator, Programmable
5330A
Simulator
NAI's 5330A Synchro/Resolver Simulator is a rack-mount or bench-top instrument featuring integrated touch-screen controls and input terminals. This model represents a major step forward as it uses digital technology to produce Synchro and Resolver outputs. Improved flexibility is provided by two fully independent outputs that can be used to simulate two separate Synchro or Resolver signals simultaneously, or can be combined to operate as two-speed outputs. The versatility of this device has been substantially increased by incorporating dynamic modes that enable servo systems to be tested under various simulated stringent field conditions.
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Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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VXI Single/Dual Channel Arbitrary Waveform Generator
3100M
Waveform Generator
The Astronics Test Systems 3100M Waveform Synthesizer Series combines 300 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3100M is a greatly improved version of a field-proven instrument ideal for VXI test stimulus generation. It replaces one or two of the popular 3152A Precision PLL Waveform Synthesizers, which are standard on many military and commercial test platforms.
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Electric Vehicle Service Equipment Test System
T4350
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With the growing demand for electric vehicles (EV), there needs to be a simple and accurate method to test EV charging systems. Test the accuracy of AC and DC voltages and currents with TESCO’s Electric Vehicle Service Equipment (EVSE) Test System TS400. The TS400 is a valuable set with complete testing capabilities and caters to every possible EVSE charging protocol in the world (AC and DC). EV charging stations are popping up all over as the sale of electric vehicles increase. Many states or counties are now mandating testing for these charging stations. TESCO’s TS400 makes testing these chargers easy! TESCO’s EVSE Test Systems test the accuracy of energy delivery using a transactional mode compatible with Handbook 44 provisions. The TS400 Test System includes a T4000 EVSE Tester and a PL4000 EV Load Emulator. Reach out to your TESCO Representative for more information!
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Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
Switching Power Supply ATS (SMPS ATS)
8200
Power Supply
Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.
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PCI High Density Potentiometer Card 4-Channel, 16-Bit, 0 To 65k Ohm
50-296A-121-4/16
Programmable Potentiometer
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Noise Sources
NC1128A
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This noise source by Noisecom produces white Gaussian noise up to +13 dBm. It contains a hermetically packaged noise diode that has been pre-selected for special performance characteristics. This module is ideal for many different applications including CATV, Secure communications, Jamming systems, OC-192 Testing, EW & EC.
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Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Impulse-Calibration-System
KAL1000 Series
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The impulse calibration system KAL1000 is a modular system to perform tests on complete impulse voltage measuring systems and on digital recorders for the measurement of high impulse voltages and impulse currents. The modular design allows an optimal KAL-configuration depending on the actual application.Additional, this modularity allows to up-grade or modify and existing KAL1000 system in case of changing or additional requirements
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PCI High Density Potentiometer Card 2-Channel, 16-Bit, 0 To 65k Ohm
50-296A-021-2/16
Programmable Potentiometer
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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PXI Versatile Multiplexer, Solid State, 125mA, 100V
40-683A-001
Multiplexer Module
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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Field Management
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EAG offers field-to-final report project management for studies to demonstrate human and environmental safety. As on-site study directors, our Field Managers bring decades of study design, protocol development, analytical oversight, and GLP/QA compliance expertise across a variety of field management study types. In addition, EAG’s access to a broad network of field sites across the United States and Canada ensures that we can deliver the test system, soil characteristics and geography necessary for just about any regulatory need.
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Optical Modulation Analyzer
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Signaling has migrated from simple on-off keying to complex modulation formats such as DP-QPSK and PM-16QAM. Advanced test tools are required to test the latest communication systems for 100G, 400G, 1Tb/s and beyond. Tektronix is the only test and measurement vendor that can offer a complete coherent optical test system from signal generation, to modulation, acquisition, and analysis.
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Product
PCI Precision Resistor Card 9-Channel, 1Ω To 31.5Ω
50-297-110
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Stationary Circuit Breaker Test System
ACTAS C160
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Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Test Automation
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PrimeTest Automation delivers custom test, measurement, and data acquisition systems that include the best hardware and software available. Drawing on vast resources from multiple disciplines, each system is carefully designed and constructed to provide the most accurate and repeatable results. Test systems can be deployed as standalone or as part of an automated line such as a rotary index dial or conveyor.
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Battery Fault Insertion Unit
Fault Insertion Unit
The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing. Additionally, a four-wire auxiliary input allows you to connect an external digital multimeter (DMM) instrument to any cell channel for very high-accuracy bypass current and cell voltage measurements. Each FIU provides 24 independently-programmable cell-switching channels for one or two 12-cell Battery Simulator 1200 units. Additional Battery Simulator 1200 and FIU instruments can extend functionality up to 120 series-connected cell channels.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-252-051
Programmable Resistor Module
The 40-252-051 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Protective Cover, G12x, Receiver
310113518
Protective Cover
The Receiver Protective Cover prevents damage to your modules and contacts and keeps your test system in proper working order.
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Modular Test System
IMU-MGS
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Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union.





























