System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
Distributed Test Manager
DTM
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The Distributed Test Manager (DTM) is a Windows™ application which enables many different types of system level testing by simulating multiple devices in a system. DTM is a system level simulator that is unique compared to other Triangle MicroWorks tools which test the communications of a single device. DTM is a highly extensible tool with multiple options for configuring devices, creating test cases, and simulating data in the system.
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Product
Test Cell Controller
RAPID
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The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.
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Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
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The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Force Measurement & Torque Measurement Test Stands
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Mark-10 offers the industry's most extensive line of manual force measurement and torque measurement test stands. Test stands are useful in eliminating variability inherent in hand testing and can help to automate test processes. A wide range of capacities, loading methods, and configurations are available. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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High Impact Shock Test System
KRD16 series
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High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Product
PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
42-878-241
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
PCI High Density Pecision Resistor Card, 4-Channel, 2.5Ω To 3.55kΩ
50-298-123
Programmable Resistor Module
The 50-298-123 is a high density programmable resistor card with 4 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
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HIL/V&V Solutions
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SPHEREA designs test systems derived from our modular platform for V&V applications, for the whole development chain, from design to qualification
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 3Ω to 1.51MΩ
40-251-050
Programmable Resistor Module
The 40-251-050 is a programmable resistor module with 2 channels which can be set between 3Ω and 1.51MΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Continuous Time Interval Analyzers
GT668PXIe-40
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GuideTech’s GT668PXIe-40 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration. Some of the GT668PXIe-40 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.
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HEV / EV / Grid Emulators and Test Systems
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With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Quality Control for more Precision in Press Hardening
PRESS-CHECK
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The automated test system PRESS-CHECK works with two powerful high-end thermographic cameras for continuous measurement of two-dimensional temperature distribution. This measurement is carried out before the pressing operation on the surfaces of the boards to be processed and subsequently on the resulting molded parts, ultimately enabling exact compliance with the thermal process parameters.
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OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
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OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
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PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 2.97MΩ
40-298-151
Programmable Resistor Module
The 40-298-151 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 2.97MΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Measurement & Test
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Electronic test engineers use a variety of precision instruments for R&D, vendor verification, and production testing. ETPS can supply a number of general test instruments that can be used in stand alone mode or automated for high throughput testing. Dedicated battery test systems with automatic charge and discharge modes with data logging are available. The standard 16 and 32 channel systems have range up to 5VDC ensuring their suitability for a wide variety of cells.
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Product
NTSC/PAL Color Bar Generator
CBG360
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The CBG360 is designed to provide an accurate and affordable signal source for system testing. It also provides the necessary components for aligning color monitors to the proper brightness, color and hue.
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Combo Unit, 7.5 Digit Digital Multimeter (DMM) with 10-Bit 1GHz Digitizer in a Single VXI Slot
6084A
Digitizer
Increases test system performance and density with this combo unit, which packages a 7.5 digit Digital Multimeter (DMM) together with a 10-bit, 1 GHz Digitizer into a single VXI slot.Replaces the Wavetek 1362 DMM, Analogic DBS Series, and Agilent VXI DigitizersDigitizer with 4 Inputs, 10-bits, 1 GHz, up to 4 GS/s and Ranges up to 500V DMM with 7.5 Digits for DC Volts, Current and Ohms with AC Volts up to 1 MHzIVI-COM Drivers and Soft Front Panels ProvidedMore Dynamic Range (by 20 dB for DMM and 12 dB for Digitizer) for Better Legacy Range Mapping
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Charge Plate Monitors
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Our easy-to-use charge plate monitors allow you to accurately evaluate air ionization systems used to neutralize static charge accumulation. Benefit from our economical solutions and products that offer onboard data storage to automate ionization system testing.
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15V6A Battery Pack Test System
TOB-BTS-15V6A
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Xiamen Tob New Energy Technology Co., Ltd
8 Channels 15V6A Battery Pack Test System Laptop Battery Performance Testing. TOB-BTS-15V6A Battery tester equipment is an eight-channel battery analyzer to analyze polymer battery and cylindrical batteries from 12 mA to 6000 mA, up to 15V.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-252-053
Programmable Resistor Module
The 40-252-053 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Industry Standard in Noise Measurement
PN9000
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The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range(2 MHz to 140 GHz). Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a compact instrument.
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Product
Thermal Shroud
BC8-55/150C
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When combined with a thermal conditioner such as the Bemco PCL3L-III or PCL3M-III, this shroud converts a 24 inch inside diameter by 30 inch high vacuum only vertical bell jar into a 19 inch inside diameter by 20 inch high thermal vacuum testing system. With a convenient clam shell door, test objects are easily loaded by simply raising the bell jar above the top of the door opening.
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Product
Cogging Test System
CTS
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Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 62.1Ω
40-298-111
Programmable Resistor Module
The 40-298-111 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)
Model 3648
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Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.
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Meter Testing
METES
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Meter test systems with high accuracies of up to 0.02% and a wide measuring range for precise measurements in single- and three-phase applications. The meter test systems of the METES series are used to test the accuracy of Ferraris meters and electronic electricity meters under any operating conditions. The impact of system perturbations such as harmonics or flicker on the meter can be taken into consideration during tests.
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Test Software
ATI
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The ATI Test System Software and its utilities are built on a core of mature, object-oriented software components that have been thoroughly field tested and refined over many years. All of ATI's systems share a common core functionality and an easy to use program interface. Our highly skilled software and engineering experts are able to integrate nearly any OEM test or embedded systems equipment into the test system's design whether it's standard or proprietary.
