System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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DC Power Supplies
XG 850
AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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PXI High Density Precision Resistor Module, 4-Channel, 2.5Ω to 3.55kΩ
40-298-123
The 40-298-123 is a high density programmable resistor module with 4 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Automatic Hysteresis Graph Test System
DX-4DMT
X-4DMT automatic hysteresigraph system accords with the standard permanent magnet test system, GB3217-92, used to measure the major and minor hysteresis loops, demagnetization curves, recoil hysteresis loops and initial magnetization curves in different temperature of ferrite, AlNiCo, SmCo, NdFeB and quenched material, and gives the magnetic parameter, Br, Hcb, Hcj, (BH)max, Hk and so on, and could meet different requirements on test function, precision, power capability, reliability, efficiency, price, local environment from laboratory to enterprise's production line.
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3U 7th Generation Intel® Core™ i5-7440EQ Processor-Based PXI Express Gen3 Controller
PXIe-3977
The ADLINK PXIe-3977 PXI Express embedded controller, based on the 7th gen Intel® Core™ i5 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 510 Ohm
40-294-014
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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High-Precision Programmable DC Power Supply
MPS-3600H Series
MPS-3600 HSeries is a new generation of high-precision programmable DC power supply. This series of products is equipped with a standard communication interface, which has both desktop and system characteristics. It can be arbitrarily matched with other instruments and integrated into a special function test system to complete the measurement requirements in different occasions.
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Damped Oscillatory Magnetic Field Immunity Tester
DOMF61000-10
DOMF61000-10 damped oscillatory magnetic field immunity test system included damped oscillating wave generator and single ring coil, it’s designed for to do damping oscillation magnetic field immunity test and fully meet IEC 61000-4-10, EN61000-4-10 and GB/T 17626.10 standards requirement.
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PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 1.51MΩ
40-298-050
The 40-298-150 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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YUV Color Bar Generator
CBG460Y
The CBG460 is designed to provide an accurate and affordable signal source for system testing. It also provides the necessary components for aligning color monitors to the proper brightness, color and hue.
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Automatic Transformer Comprehensive Test System
TH2837LX
Changzhou Tonghui Electronic Co., Ltd.
Automatic Transformer Comprehensive Test System
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PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 6.97kΩ
50-298-130
The 50-298-130 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 925Ω
40-298-021
The 40-298-021 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Mechanical Design
In support of system, test and our tooling business, our mechanical engineering team is second to none in offering innovative, yet cost effective solutions for your needs.Whether it is a scalable test fixture solution or a complex, high accuracy torque tooling solution, our team of dedicated mechanical engineers can offer the right solution, with the right level of innovation to give your solution a competitive edge.
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Flight Line Avionics Test
The TS 717 Test Set for ARINC 717 is a convenient, easy-to-use tool for test and maintenance of aircraft systems that are tied to the Digital Flight Data Recorder (DFDR). The compact interface/cable hardware is conveniently stored in a rugged carrying case for easy transport and quick deployment.The webFLT™ is a wireless functional tester for aircraft systems using the Digital Flight Data Recorder ARINC 717 bus. It connects directly to the aircraft system test plug and transfers data to the test computer via an 802.11 b/g wireless link, eliminating cabling in the crowded cockpit that can be tripped over or damaged.
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MTM Evaluation Kit
Get everything you need to evaluate MTM and develop your next functional test system with Acroname's MTM Evaluation Kit. The MTM Evaluation Kit includes: one MTM Development Board, one MTM USBStem Module, one MTM 1 Channel Power Module, one MTM IO Serial Module, one AC/DC 12V/5A power supply and one USB A to mini-B cable.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Flexible Test System Automation Platform
RF2000A
The Ranatec RF2000A is a flexible test system automation platform that helps you to integrate your complete test system into a single box. No more cables and discrete parts on your desktop!
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Replacement Protective Cover, I1, Receiver
310113524
The receiver protective cover is designed to protect your modules and contacts while the test system is not in use. A protective cover is included with the i1 Receiver.
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Coaxial Test Contactor
ICON
The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.
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Miniature Electrodynamic Shakers
Miniature electrodynamic shakers are small, portable units designed to simplify your vibration testing needs. From the SmartShaker™ with an integrated amplifier, to an Inertial Shaker System for testing in hard-to-reach areas, mini shakers offer flexibility when testing. Miniature shaker systems range from 2 lbf (9 N) to 7 lbf (31 N) sine peak force excitation.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Solar Simulators
TriSOL CPV
Concentrating Photovoltaics (CPV) has the promise of producing solar cells with high cell efficiencies, which result in a reduction in the cost of operating a PV module. However, a CPV system requires the integration of CPV solar cells, modules and CPV optics into one efficient system. OAI’s focus is CPV cell testing methodology. The CPV cells can now be tested using OAI’s advanced standalone CPV Simulators for low dose and high dose configurations. The low dose CPV Solar Simulator provides exposure up to 50 Suns, whereas, the high dose CPV Solar Simulator provides exposure up to 1500 Suns. The low and high dose simulators provide exposure in varying Sun concentrations in various beam sizes from 1.5cm x 1.5cm to 7.5cm x 7.5cm, and may be configured with OAI’s I-V Test Systems.
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PCI Programmable Resistor Card 2-Channel 3 Ohm To 131k Ohm - SPST
50-294-134
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Solar
Chroma Systems Solutions, Inc.
This auto test system uses the unique test command optimization technology to prevent the repeating control commands from sending to the system hardware devices. This improves the system test speed dramatically and makes Chroma 8000, which uses open software architecture, highly efficient as a close or optimized auto test system.
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Electro-Dynamic Vibration Test System (Air Cooled)
HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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PXI 16 Bank 5 Channel 1 Pole Multiplexer
40-616-021-16/5/1
The 40-616 16-Bank, 5-Channel, 1-Pole Multiplexer Module forms part of the System 40 PXI Programmable Switching system. The Module consists of 16 electrically isolated banks of multiplexers controlled by a PXI/ PCI interface. Each bank is a 1 to 5 multiplexer and operates with break-before-make action when a new channel is selected. Any Individual multiplexer bank can have a channel set by itself, alternatively, multiple banks can have channels selected simultaneously. The module is suitable for cascading in applications that require large multiplexer systems, it is also suitable for test systems that require the switching of a large number of signals in parallel.
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Pulse Instruments Data Acquisition and Test Software
PI-DATS
PI-DATS is Pulse Instruments Data Acquisition and Test Software, our user-friendly system software that allows complete control over Pulse Instruments test systems and test equipment. PI-DATS can dramatically increase your testing productivity by decreasing the amount of time it takes to set up and change test plans.
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PCI Resistor Card 2-Channel 2 Ohm To 65.5k Ohm With SPDT
50-293-133
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
