System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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PCI High Density Potentiometer Card 9-Channel, 8-Bit, 0 To 255 Ohm
50-296A-121-9/8
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 102kΩ
50-298-140
The 50-298-140 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Safety Chamber, Hydrostatic Test
9901HTX-72x24x12
The 6 ft wide by 2 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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RMC-8357 , 2.1 GHz, 1U Rugged Rack-Mount External Controller for PXI
785672-01
2.1 GHz, 1U Rugged Rack-Mount External Controller for PXI—The RMC‑8357 is a rugged 1U rack-mount controller for PXI- or PXI Express-based systems intended for test and measurement applications requiring rack-mount controllers. It features up to two Intel Xeon eight‐core processors that support up to 32 GB of RAM. The RMC‑8357 offers hot-swappable fans, options for redundant power supplies, and support for RAID arrays, which allows multiple hard drives to be configured for high performance for mission‐critical, physically demanding applications. The RMC‑8357 meets the PXI standard’s mechanical shock and vibration specifications and functions over wide operating ranges.
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PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 11.4MΩ
40-298-153
The 40-298-153 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Automation System
RT-Tester
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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DC Power Supplies
XG 850
AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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3U Rackmount Appliance for PCI Express® Gen4
R300-G4
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
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Flexible KRT Relay Testing Software Support
ISO9001
KINGSINE Electric Automation Co., Ltd.
Kingsine relay testing system V2 is the newest relay testing system which developed by kingsine Electric Automation Co., LTD. It is the professional software platform customized for power plant, transformer substation , protection realy producer and other related enterprises through our long-term R & D accumulation and practice and intergrated the newest technic and design concept from world-wide.
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Drop Testers
This process is vital for ensuring that products travel to customers safely and securely, eventually arriving damage free. In turn, drop test systems help companies save money and maintain positive brand-owner reputations by helping to design packaged products that will deliver products with their intended inherent quality intact. Lansmont Drop Test Systems are the gold standard for accurate and repeatable drop testing. Every drop tester we manufacture is factory-tested to ensure it meets flatness-of-drop requirements and exceeds industry specifications.
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Unbalance Tester
BK2027
If you need to test displacement in hard drive motors with speeds up to 10,000rpm, think about BaKo's Type BK2027 Unbalance Tester. It's both easy to set up and easy to use and as a 2 channel DSP based system, it can test 2 motors at once and display the balance results as either unbalance (cm.g), acceleration (m/s2) or vibration strength (g).
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5050
The GX5050 is a high speed Dynamic Digital I/O card that provides a full set of features that is comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GC5050, but the GX5050 is a PXI card (6U) and the GC5050 is a PCI card. Both have the ability to operate independently of the host computer when in RUN mode.
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PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 925Ω
40-252-121
The 40-252-121 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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VCS
Test Specimen Parameters
a program from the scope of ZETLAB VIBRO software suite. The update of the software suite ZETLAB VIBRO includes a new user-friendly interface as well as a wide range of new functions, allowing the user to configure parameters of the vibration test system with the maximal possible prevention of errors occurrence.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-251-140
The 40-251-140 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Electric Motor Test Systems
Electric Motor Test Systems feature our highly successful water brake dynamometer which is used as an electric motor loading device.
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ESI Test Jig
MS 1543
This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 1.81kΩ
40-251-022
The 40-251-022 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 10W Programmable Resistor Module, 1-Channel, 2Ω to 13.6kΩ
40-253-031
The 40-253-031 is a programmable resistor module with 1 channel which can be set between 2Ω and 13.6kΩ with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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MIMIC® Cable Modem Simulator
MIMIC Cable Modem Simulator, is the industry's first integrated simulation tool supporting DOCSIS, allows cable modem developers and cable companies to perform real world, integrated cable and internetworking device simulations. MIMIC allows suppliers of cable modems to design, develop and test their products in a virtual and scalable network environment, assuring customers that their cable modems will work properly when deployed across heterogeneous environments. Cable providers can use MIMIC to simulate the 1000s of households that use cable modems to assure the scalability of cable management software. In addition, providers can also use MIMIC for large-scale Operations Support System (OSS) testing deployments in place of large banks of cable modems, which would be cost prohibitive.
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Software Drivers and Application Software Packages
In test system development, the best hardware is only usable if its software control environment is robust and easy-to-use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
