System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
Optical OTDR
TLM-01D
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Hangzhou Tuolima Network Technologies Co., Ltd.
OTDR-01D series handheld optical time domain reflectometer (OTDR) is a new generation of intelligent optical measuring instrument designed for the optical fiber communication system testing by TUOLIMA Network Technologies Co., Ltd.. This product is mainly used to measure the parameters of optical fibers and cables, such as length, loss, and connection quality, etc.; it can realize the accurate positioning of event points and fault points, and can be widely used in the construction, maintenance testing and emergency repair of the optical fiber communication systems as well as the research, production and production measurement of optical fibers and cables and so on. This product can provide you with the highest performance of solutions for installation and construction of fiber optic network construction and the subsequent fast and efficient maintenance and troubleshooting testing.
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Product
PCI High Density Resistor Card 18-Channel, 8 Bit, 0 To 255 Ohm
50-295A-121-18/8
Programmable Resistor Module
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Panelized PCB Tester
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Removable nests are designed to configure base test system to accept panelized circuit boards for rapid functional test.
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Product
Waveguide Harmonic Mixers (smart mixer), 75 to 110 GHz
M1970W
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The Keysight M1970W 75 to 110 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of N9030A PXA, N9020A MXA,and N9010A EXAsignal analyzers up to 110 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve your DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Product
PXI Precision Resistor Module 4-Channel, 1.5 to 925
40-297-121
Programmable Resistor Module
This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
PCI High Density Resistor Card 6-Channel, 24-Bit, 0 To 16M Ohm
50-295A-121-6/24
Programmable Resistor Module
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Universal Testing Systems (Up To 300 KN)
6800 Series
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Instron’s 6800 Series universal testing systems deliver high-performance mechanical testing up to 300 kN. Designed for precision and durability, these systems offer exceptional measurement accuracy (±0.5% down to 1/1000th of load cell capacity) and fast data acquisition rates up to 5 kHz. Ideal for tensile, compression, flexure, torsion, peel, lap shear, and many other test types, the 6800 Series provides the flexibility and control needed to handle everything from delicate specimens to high-strength materials, making it a trusted solution for demanding testing environments.
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Product
In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Product
PCI Precision Resistor Card 9-Channel, 1Ω To 122Ω
50-297-112
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Brazil 127/220VAC
781630-12
GPIB Controller
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
Chassis and Controllers Accessories
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Keysight offers high-performance chassis and controller accessories to synchronize multiple Keysight USB modular products to accelerate your test system integration and development.
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Product
Contact Resistance Measurement System
CRMS
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The CRMS is a system designed to allow any user to measure the resistance of each set of relay contacts associated with the relay under test. The test system consists of a CONTACT RESISTANCE MEASUREMENT UNIT (CRMU), a MULTIPLE RELAY TEST RACK, as well as an interconnect CABLE ASSEMBLY. Either DC or AC energy to pick and drop relay coils under test for all contact measurements is supplied from the CRMU and easily interfaces with the Multiple Relay Test Rack. For additional and more thorough testing of relays an external relay tester can be interfaced to the Multiple Relay Test Rack to supply energy to the relay coil. It is recommended that the UTE Relay Tester With Timer/Counter (UTE Product # 15967-00) be utilized so the operator can take full advantage of the unique features it offers
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Product
AUTOMATED SAFETY AND COMPLIANCE
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DMC's test and measurement system offerings include designs and development of Automated Safety, Compliance, and Benchmark Testing. These serve interests of commercial product certification, including fire hazards, safety and signaling, lighting, building safety, energy, and hazardous location testing. These also serve interests of product and technology benchmarking, including brand quality protection, consumer quality, and energy efficiency. Test systems have been developed by DMC to support many standards, including UL (Underwriters Laboratories), Consumer Reports, Intertek, Energy Star, and EN / CEN European Standards.
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Product
Tensile/Compression/Bending/Torsion Testing Kits
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With the constantly growing competitive pressure in today`s market are quality and product innovation basic requirements for any company.For this purpose TIRA is developing accurate and high quality material testing machines and testing systems which are manufactured according to the national and international standards DIN 5122, EN ISO 7500-1, GOST. With our testing machines you can carry out the static testing of metals, parts, wood, building materials, glass, plastics, fibers, composites etc.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Universal Counter/Timer
2461A VXI
Counter/Timer Module
The Astronics Test Systems 2461A is a high performance, 2-channel, universal 200 MHz counter, a functional replacement for the obsolete Racal Instruments™ 2461 and also recommended to replace the Keysight™ E1420A/B.
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Product
JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
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The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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Product
PXI Embedded Controller
PXI-3982
Controller
The ADLINK PXI-3982 PXI embedded controller, based on the 6th generation Intel® Core™ i7 processor, is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
MB-OFDM Protocol Test System
WiMedia Explorer 300
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The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Product
PCI Resistor Card 2-Channel 1.5 Ohm To 2.04k Ohm With SPDT
50-293-122
Programmable Resistor Module
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Autoinjector Testing System
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Instron’s Autoinjector Testing System is designed to perform full functionality testing on a wide variety of drug delivery devices, including safety syringes and both needle shield and button-activated formats. Developed in collaboration with pharmaceutical manufacturers and CDMOs, the system captures essential performance requirements such as activation force, injection time, dose accuracy, needle depth, and click detection. It supports compliance with international standards like ISO 11608 and can be configured for integration with collaborative robots to enhance automation and throughput.
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Product
Handover Emulator
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Qosmotec Software Solutions GmbH
The Qosmotec handover test system QPER is a versatile test platform for emulating the RF signal between radio devices in a wireless network, e.g., between mobile stations and radio infrastructure of a mobile network. It is employed in test beds where radio signals are transmitted through coaxial cables and specifically manipulated by testers. QPER can be based on various hardware platforms, from attenuator arrays to digital channel emulators.
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Product
PCI Programmable Resistor Card 4-Channel 2 Ohm To 510 Ohm
50-294-014
Programmable Resistor Module
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 6.97kΩ
40-253-024
Programmable Resistor Module
The 40-253-024 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 6.97kΩ with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-252-114
Programmable Resistor Module
The 40-252-114 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 925Ω
40-251-021
Programmable Resistor Module
The 40-251-021 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
