Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
-
Product
Microscope Automation
-
Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
-
Product
Industrial Microscope Solutions
-
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
-
Product
Atomic Force Microscope
XE-PTR
-
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
-
Product
LED Illumination Systems
pE-100
-
The pE-100 series is a mercury-free family of compact and simple to use LED illumination systems which can be configured to deliver light directly to a microscope, or via a liquid light guide or multimode fiber. Systems can be specified at any one of 20 different LED wavelengths. Operation is by a remote manual control pod with instant on/off and intensity control from 0-100%. Remote control is available via a TTL trigger.
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Microscope
-
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
-
Product
Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
-
Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
-
Product
AFM & NSOM
-
A new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.
-
Product
Inspection Microscope
Z-NIR
-
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
-
Product
Brinell Hardness Tester
-
Using a carbide ball penetrator, and applying loads of up to 3,000 kgf, Brinell hardness tester following ASTM E-10 are widely used on castings and forgings. This method requires optical reading of the diameter of ball indentation, and using a chart to convert the average measurement to Brinell hardness value. We offer low cost handheld Brinell scopes as well as a popular line of Automatic Brinell Microscopes for high frequency of testing. . Qualitest also offers Automatic In-line hardness testers for high volume testing.
-
Product
Pinhole Detection Devices
-
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
-
Product
Scanning Electron Microscope w/ EDX Laboratory
-
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
-
-
Product
TOC-L For Monitoring A Microscopic Algae Biomass
-
Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
-
-
Product
Easycheck Fiber Endface Inspector
CA3002
-
The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.
-
Product
Single Mode & Multimode Test Kit
KI-TK037
-
1310/1550 nm & 850/1300 nm source & power meter, inspection microscope & cleaning materials with Interchangeable SC & LC connectors
-
Product
Incoherent Sources
-
Our Incoherent Sources include unmounted LEDs, mounted LEDs, collimated LEDs, LED light sources, superluminescent diodes, and broadband light sources. Our collimated LEDs are particularly popular and are compatible with many microscopes. Versions are available with center wavelengths from the UV into the NIR or that emit white light.
-
Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
-
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
-
Product
Testing, Inspecting & Cleaning Kit
KI-TK033
-
850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO, SC, LC connectors
-
Product
Microscope Software
-
Discover more with Olympus microscope software. With intuitive operations that offer a seamless workflow, Olympus microscope software supports your ever-evolving research needs.
-
Product
Create Topographic Profiles from SPM Images
TopoStitch
-
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
-
Product
Scanning Tunneling Microscope for Ultra High Vacuum
STM
-
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
-
Product
Electrical Probe Systems
-
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
-
Product
Micro Vickers Hardness Tester
900-392
-
The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
-
Product
Upright Light Microscopes
-
Get the publication-quality imaging and customizable upright microscope solution you need for your Life Science research with Leica Microsystems. These powerful imaging systems feature constant color, natural light illumination, superior optics, and configurable options to provide high contrast, brilliant images for your cutting-edge biological research.
-
Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
-
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
-
Product
AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
-
Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
-
Product
Microscopic Four-Point Probes
M4PP
-
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
-
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
