Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Compact Manual Laser Repair System
LRS-2400
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LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Thermal Microscope Stage For Large Petri Dish
TS-4LMP
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Thermal Microscope Stage For Large Petri Dish
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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Confocal Raman Microscopes
NRS Series
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Include Class 1 laser safety as standard and share the same comprehensive Spectra Manager™ Suite of measurement and micro-imaging software.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Incoherent Sources
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Our Incoherent Sources include unmounted LEDs, mounted LEDs, collimated LEDs, LED light sources, superluminescent diodes, and broadband light sources. Our collimated LEDs are particularly popular and are compatible with many microscopes. Versions are available with center wavelengths from the UV into the NIR or that emit white light.
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Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Optical Tweezers
PicoTweezers
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Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Light Microscopy
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Materials Evaluation and Engineering
MEE has a variety of light microscopes with magnifications ranging from 5X to 2400X. Each microscope is connected to a camera with digital image capture for subsequent measurements and/or additional image analyses.
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Non Contact Measurement
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There is no one-size-fits-all solution for accurate measurement, and different applications require different measurement systems. At Vision Engineering, we design and manufacture a broad range of non-contact measurement systems from toolmakers’ measuring microscopes to fully automated CNC video measuring systems with optional contact measurement available. Combined with the latest metrology software solutions available, we offer the right tool for the job.
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Low to Medium Test
KI-TK035
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1310/1550 nm & 850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO, MPO/APC, SC, LC connectors (EAR99 Restricted)
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Microscopes
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A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Digital Slide Scanner
ZEISS Axioscan 7
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Discover high-performance digital slide scanning tailored to your application needs. Whether your focus is spatial biology at scale, life science research, clinical applications or geology, the Axioscan 7 slide scanning microscope brings you advanced automation capabilities and exceptional image quality.
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Plastic And Reconstructive Surgery Microscopy Solutions
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Leica plastic and reconstructive surgery (PRS) microscopes give you the performance and reliability you need to repair intricate and fine structures during the most delicate reconstructive procedures. They feature high-quality optics, easy operation, and integrated visualization technologies, such as fluorescence filters and augmented reality (AR) fluorescence.
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Single Photon Counting Camera
LINCam
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Photon counting is the only way to get as much information brought by light as it is physically possible. Here we present the system allowing to detect not only arrival time of individual photons but also a position as straightforward as camera. Standing on the shoulders of night vision technology LINCam allows to extend any simple wide-field microscope to the powerful fluorescence lifetime imaging system.
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Low to Modest Volume Clean, Inspect & Test
KI-TK071A
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1310/1550 nm & 850/1300 nm source & Autotest power meter + acceptance reporting software, inspection microscope, cleaning materials. Interchangeable MPO, MPO/APC, SC, LC connectors (EAR99 Restricted)
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Confocal Microscopes
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Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Laser Scanning and Emission Tools
InfraScan™ ES400
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The InfraScan™ ES400 family provides the groundbreaking combination of Checkpoint Technologies, world leading laser scanning microscope and its best in class emission system into a single tool.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Pinhole Detection
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
A pinhole detector checks coatings by means of electrical voltage. Microscopically small defects (>20µm) can then be detected in the coating of a surface. Even minimal defects in surface coatings can have fatal consequences so careful testing with the right pinhole detector is vital. Urgent action is required when just the smallest defect is found during pinhole detection of surface coatings. Minimal defects in the coating are sufficient to cause major damage. The PoroTest 7 pinhole detector from ElektroPhysik is an indispensable aid in the search for pores, cracks and other defects in non-conductive coatings on conductive base materials – go to the technical data.
