Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Product
Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Incoherent Sources
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Our Incoherent Sources include unmounted LEDs, mounted LEDs, collimated LEDs, LED light sources, superluminescent diodes, and broadband light sources. Our collimated LEDs are particularly popular and are compatible with many microscopes. Versions are available with center wavelengths from the UV into the NIR or that emit white light.
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Product
Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
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Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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FOV Micro Measuring Microscope 4.0
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The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Reticles / Graticules
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With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Optical Tweezers
PicoTweezers
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Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Light Source
pE-300white
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CoolLED's pE-300white offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. The pE-300white Light Source can be fitted directly to the microscope or specified with a liquid light guide. The system is a mercury-free alternative that is safer, more controllable, and repeatable than conventional high-pressure gas discharge illuminators. Spectral coverage is from the UV (DAPI excitation) to the Red region (Cy5 excitation). The system is perfect for hospital and regular research laboratory environments.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Microscope Cameras From ZEISS
Axiocam Family
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In contrast to digital cameras for photography or industrial inspection, many aspects of the microscope cameras are optimized to meet specific requirements of applications in science, research and documentation. As each application has very specific requirements, there is a wide range of different digital camera models to choose from. Different pixel sizes, for example, regulate camera sensitivity and spatial resolution. Lower pixel count enables higher frame rates and larger sensors offer better coverage of the field of view.
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Magnetic Field Visualization
mageye
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Our mobile "magnetic field sensor" allows you to visualize and evaluate magnetic stray fields. Our mageye, matesy’s miniaturized magneto-optical USB microscope, provides information about the magnetic fields on the surface of a wide variety of samples with resolutions in the micrometer range.
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Low to Modest Volume Clean, Inspect, Test
KI-TK034
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1310/1550 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO/APC, SC, LC connectors (EAR99 Restricted)
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Double Monochromator
Gemini 180
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The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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High-Speed Video Camera
Hyper Vision HPV-X2
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Medical science and engineering have made dramatic progress thanks to visualization technology. Examples include the invention of microscopes capable of enlarged observations of phenomena occurring in the microscopic domain, invisible to the human eye, X-ray inspection systems, which enable the observation of images utilizing light at imperceptible wavelengths, and infrared cameras. Our eyes are incapable of capturing phenomena occurring at times shorter than 50 to 100 ms. As a result, high-speed video cameras have become necessary in order to record phenomena occurring at intervals that cannot be seen with the human eye, and then replay them at a slower rate so that they can be visualized. As the standard tool for visualizing ultra high-speed domains, the Hyper Vision high-speed video camera contributes to our understanding of ultra high-speed phenomena in a variety of fields.
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Monocular Microscopes
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ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes come with a standard selection of 4x, 10x and 40x DIN objectives (“DIN” is an international standard for type of thread and focal length). Depending on the series, 60x dry or 100x oil immersion objectives are available.
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Low to Medium Test
KI-TK035
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1310/1550 nm & 850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO, MPO/APC, SC, LC connectors (EAR99 Restricted)
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Product
Thermal Microscope Stage For Large Petri Dish
TS-4LMP
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Thermal Microscope Stage For Large Petri Dish
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
