Pull Force
strength necessary to extract.
See Also: Force, Compression, Crimp Force, Pull off Force, Push Pull Force, Peeling, Tension, Gravity, Electrical, Magnetic
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Product
Snap Tester (Button Pull Tester)
TF145
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TESTEX Testing Equipment Systems Ltd.
Snap Tester (Button Pull Tester), to determine the holding or breaking strength of prong-ring attached snap fasteners onto garments or toys, also as a Push Pull Tester for compression and tensile testing of small samples(special attachments are available).
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Product
Force Tensiometer
K6
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Our Force Tensiometer – K6 is a robust and reliable manual instrument for measuring surface tension and interfacial tension using the ring method. As a quality product from our precision mechanical workshop, it produces fast, easy and accurate measurements for surfactant solutions and solvents.
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Product
Charge Amplifier for Outputs from Piezoelectric- or mV-type Accelerometers, Force Gauges, Microphones & Pressure Pickups
Trig-Tek™ 201AP
Amplifier
Amplify the outputs from piezoelectric- or mV-type accelerometers, force gauges, microphones, and pressure pickups
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Product
Ergonomic Force Gauges
DMG Series
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AMETEK Sensors, Test & Calibration
The DMG ergonomic gauge lets you objectively measure manual muscle strength and functional task requirements for almost any application.
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Product
Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
Force Measuring Instruments
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Force measuring means measuring a certain load in newton, independent of the gravity.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 230gf
K100-A080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000B
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The ThermalAir TA-3000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
Force Tensiometers
Sigma 700/701
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The outstanding versatility of Sigma 700 and 701 force tensiometers makes them suitable for research and development, industrial quality control, routine measurements as well as academic research. Both instruments are computer controlled and have a high level of automation.
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Product
Force Protection
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The Durham is a high-performance, highly-mobile and easy to emplace Medium Range Day/Night Wireless Surveillance System using a state of the art day camera and a cooled, highly sensitive 640x480 InSb Focal Plane Array thermal camera with 8X continuous optical zoom. The system is image stabilized and has automatic tracking of targets. Each system consists of a Base Station and one Remote Station which can be emplaced up to 5km away for wireless operation or within 500m for fiber optic operation. A single Base Station can monitor and control up to four (4) Remote Stations. The system is powered by a generator, batteries, solar (supplemental power), or vehicle power. Other options available are laser pointers, designators, and a vehicle integration kit.
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Product
Air Force
Alpha 4314 AF
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4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
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Product
Force Transmitter
LKVE/i
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The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 305gf
K100-H080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
Ergonomic Force Gauges
MSE100 Series
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AMETEK Sensors, Test & Calibration
The MSE100 ergonomic gauge is a simple-to-use, ergonomically designed mechanical instrument ideal for muscle strength evaluations and job task analysis.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 305gf
K100-K150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Large Area Bond Tester
Sigma HF
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- For high force and large area- Typically for IGBT, power modules and batteries up to 1000 kgf- High axis speed- Deep access up to 80 mm- SEMI S2 safety cabinet with visual feedback- Flexible positioning of multiple work holders
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 305gf
K100-D080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
Ergonomic Force Gauges
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AMETEK Sensors, Test & Calibration
The ergonomic gauges from Chatillon are ideal for functional capacity evaluations and basic muscle strength measurements where economy and ease-of-use are essential. Simplicity is a key design criterion for these ergonomic gauges.
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Product
Force Data Acquisition Software
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SW-1X data acquisition software is for force gauges with RS-232 output.SW-2X data acquisition software is for collecting force and displacement data from RS-232 output force gauges, with a -s test stand.Force Recorder data acquisition software is for ZTS & ZTA force gauges with USB output. Force Recorder Pro collects both force and displacement data with ZTA gauge and FA test stand.
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Product
Atomic Force Microscope
XE7
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Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
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Product
Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 305gf
K100-A080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
Force Distance Tester
925
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The Model 925 is a low cost force-distance tester. It communicates with a Windows™-based PC to send data into an Excel format. The data can then be viewed and analyzed in tabular or graphical format. Once in the Excel format, the data can be transferred or used in any of the multiple Excel operations. This line of displacement-force test stations has a positional resolution of 0.0025 mm (0.0001 inches). Your test department will appreciate the high accuracy readings provided over the complete travel range.
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Product
48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
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High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
Quartz ICP® Force Rings
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Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load. The through-hole mounting supports platform, integrated link, and support style installations using either a through-bolt or the supplied stud.
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Product
Electromagnetic Force Micro Tester
Micro-Servo
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This is a multi-functional fatigue testing machine suitable for specimens, structures and full-sized parts. It is an overhead actuator type with a broad test space, so it is ideal for various types of environmental tests, such as those in corrosion tanks or constant temperature tanks.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 155gf
K100-I126155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 155gf, Steel with Gold Plating.





























