IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
-
Product
Steam Aging Tester
-
Wewon Environmental Chambers Co, Ltd.
These steam aging chamber applied for the testing of sealing property for multi-layer circuit board, IC sealing package, LCD screen, LED, semi-conductor, magnetic materials, NdFeB, rare earths and magnet iron, in which the resistance to pressure and air tightness for above mentioned products can be tested out. Overall of the steam aging tester made of stainless steel SUS # 304HL, simple operation settings. Microcomputer digital LED control with time planning function , the maximum set 9,990 Mins. Parts, connectors, passive components , semiconductors oxidation test pin high temperature and humidity. Metal pin soldering test accelerated aging test. Multiple overtemperature protection / water cut heating and other safety devices. The touch- PID + SSR temperature controller, timer function while a time , set the 9990 maximum fractional unlimited.
-
Product
Clock and Data Recovery/Retiming
-
Analog Devices provides single rate, multiple rate, and continuous tuning clock and data recovery (CDR) ICs for metro, long haul, DWDM, FSO, instrumentation, and other applications. Our any rate CDR ICs allow easy integration into protocol agnostic applications, automatically locking onto incoming data streams at any rate, from 10 Mbps to 2.7 Gbps or from 6.5 Mbps to 11.3 Gbps, without the aid of a reference clock while reporting the acquired data rate over the I2C interface. With a proprietary dual loop design, our any rate CDR ICs feature fast locking with superior jitter performance.
-
Product
600A Digital Clamp Meter
7128B
-
Peaceful Thriving Enterprise Co Ltd
This is a auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC current to 600A and resistance to 60MΩ; also having the capability to test diode, continuity and non contact voltage sensing. Sub switch included Function Select, Max-Min Indication, Value Hold, Range Select, Relative Value Measurement, Inrush Current Indication, Illumination and Back-light.
-
Product
Dip Clip, 14 Pin With Nickel Silver Contacts
5014
-
Pomona DIP Clip test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
-
Product
MAX31855 J-Type Thermocouple Arduino Shield
SEN-30004-J47
-
Four channel MAX31855 digital thermocouple Arduino Shield. Two versions of this shield are avaliable for each thermocouple type: either 'Ch 0-3' (CS pins use Uno/Mega IO pins 7-10) or 'Ch 4-7' (CS pins use Uno/Mega IO pins 3-6), with the only difference being which set of zero-ohm resistors are populated on the board. This allows use of other SPI devices that may be 'hard coded' to specific digital pins on the Arduino, or simply stacking one of each type together to get a total of eight thermocouple channels on one Arduino. The MAX31855J supports a measured temperature range of -210C-1200C with known thermal characteristics and output resolution of 0.25C. Included thermocouple connectors are type-specific to provide proper material continuity as close to the IC as possible. The SEN-30004 is interfaced via 3 or 4-wire SPI and a high-speed level shifter is included to allow the board to plug directly into an Arduino Uno or Mega
-
Product
Analog IC test system
-
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
-
Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
-
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
-
Product
5G Active Antenna Innovator’s Kit
AWMF-0129
-
The AWMF-0129 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +50dBmi output power while consuming just 12W DC power in the RF circuits and has achieved Gb/s data rates in OTA trials. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWMF-0129 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
-
Product
SparkFun Shift Register Breakout
74HC595
-
This is a breakout for the SOIC version of the 74HC595 shift register IC. Clock in data and latch it to free up IO pins on your micro. All pins from the IC are broken out to standard 0.1" spaced headers. The Serial in and out pins are on opposite sides of the board with the remaining pins carried over so that multiple shift register boards can be chained together.
-
Product
IC Side Channel Analysis
-
These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
-
Product
SparkFun Transceiver Breakout
RS-485
-
This is a breakout board for the SP3485 RS-485 transceiver IC, which will convert a UART serial stream to RS-485. The SP3485 is a half-duplex transceiver, so it can only communicate one way at a time, but it can reach transmission speeds of up to 10Mbps. This board requires a very low amount of power and can operate from a single +3.3VDC supply.
-
Product
PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
Source Measure Unit
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
DUAL-IN-LINE (DIL/DIP) SERIES 97 - 98
-
Pickering’s dual-in-line (DIP/DIL) reed relays are through-hole electronic components that enclose two parallel rows of connection pins on the standard DIL spacing with switching capability up to 2 Amps, 50 Watts. The reed relays come with 5, 12 or 24 V coils with or without internal diode. Many standard build options are available on request, or we can fully customise the parts to suit your exact specifications.It is often possible to replace TTL ICs with their equivalent CMOS ones and replace standard DIL relays with Pickering Series 98, to obtain the benefits of CMOS without any circuit or PCB redesign.
-
Product
Light-to-Analog Sensors (Current)
-
Renesas' light-to-current silicon optical sensors combine a photodiode array and current amplifiers on a single monolithic IC. These devices are ideal for display and keypad dimming, as well as industrial and medical light sensing applications.
-
Product
SparkFun USB To Serial Breakout
FT232RL
-
This is the SparkFun USB to Serial Breakout for the FT232RL, a small board with a built in USB to serial UART interface. This little breakout is built around the FT232RL IC from FTDI, with an internal oscillator, EEPROM, and a 28-pin SSOP package this is a serious little chip.
-
Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
-
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
Product
PLCC-to-DIP Adaptor
Series 352000/353000
-
PLCC to DIP Adapter. Converts PLCC packaged ICs to DIP footprints. Available with PLCC sockets or PLCC pads on top side. Consult factory for panelized form or for mounting of consigned ICs.
-
Product
Micro probes 1 MHz up to 6 GHz
MFA 01 set
-
The micro probes are used to measure magnetic fields and they have a high resolution. They measure magnetic fields up to 6 GHz, e.g. at signal conductors (150µm), SMD components (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the Bias tee BT 706. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee BT 706 to a spectrum analyzer or an oscilloscope. Langer EMV-Technik GmbH includes correction lines in the delivery. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
-
Product
IC/BGA Tester
Focus-2005
-
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
-
Product
Envision Verification Analytics
Envision
-
IC Manage Envision Verification Analytics provides:* Anytime, anywhere, data-driven insights allow engineers and management to rapidly identify and address problem areas to meet tight schedules spanning simulation, formal and emulation tools.* Utilizes big data technology to deliver near real-time verification analytics across the verification tool spectrum, for any mix of EDA vendors* With 10-100X the speed of traditional methods you can instantly understand your verification progress, at local and global levels.* Visual analytics and interactive reporting for regressions, bugs and coverage* Verification results linked to relevant design activity to help identify and resolve bottlenecks
-
Product
Global Design Platform
-
IC Manage Global Design Platform (GDP, GDP-XL) is the semiconductor industry’s most advanced, design & IP management system.
-
Product
Clock & Timing
-
Analog Devices clock ICs and timing solutions enable new architectures, lower development and manufacturing costs, and shorter design times. Products feature low jitter and phase noise for clock cleanup, synchronization, generation, delay, and distribution.
-
Product
High-Speed Digitizers and FPGA Development Kit
-
Keysight unique technology uses proprietary ICs so you can get the most out of the ADCs and FPGAs integrated into the digitizer. On-board real-time algorithm in the FPGA allows fast detection of signal characteristics in various domains.
-
Product
High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Digital I/O Module
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
Memory Test System
T5833/T5833ES
-
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
Product
Transmissive Optical Encoder Module
EM1
-
The EM1 is a transmissive optical encoder module designed to be an improved replacement for the Avago HEDS-9000 series encoder module. This module is designed to detect rotary or linear position when used together with a code wheel or linear strip. The EM1 consists of a lensed LED source and a monolithic detector IC enclosed in a small polymer package. The EM1 uses phased array detector technology to provide superior performance and greater tolerances over traditional aperture mask type encoders.
-
Product
CoreCommander
-
While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
-
Product
Amplifiers & Buffers
-
Renesas amplifiers are among the industry's highest-performance, highest-value amplifier ICs on the market. Our broad operational amplifier (op amp) portfolio provides for a wide range of next-gen precision instrumentation, medical, communication and industrial process control applications where innovation, reliability and dependability is central to the analog designs.
-
Product
LED drivers
-
ST offers a large portfolio of energy-efficient DC/DC powered LED driver ICs for general lighting, display LED backlighting, automotive exterior and interior lighting, RGB and monochromatic LED drivers for signage and traffic signals.
