IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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8 Channel Sample & Hold and Signal Conditioning Board for Group3
All channels provide for voltage division ahead of transient suppression before going into the S&H ICs. Channels that are sampled and held use a common sample and hold pulse that samples while high and holds while low. Jumpers on each S&H chip allow buffering of analog signals where sample and holds are not required. An advantage to the buffers is that it provides a high input impedance for high impedance voltage dividers.
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Power ICs - VRPower® (DrMOS) - Power Stage
The Next Generation VRPower® Power Stage, Vishay’s family of VRPower modules offers an integrated MOSFET and driver power stage with unsurpassed performance. The flagship device, SiC620R is capable of 70 A and achieves more than 95 % efficiency in a typical multiphase buck converter design. The device has several package enhancements that enable it to offer superior MOSFET dynamic performance. Combined with Vishay’s state-of-the-art Gen IV MOSFET technology, these enhancements enable 3 % better efficiency and over 50 °C lower operating temperatures compared to previous generation DrMOS devices while shrinking the footprint by 33 %.
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Stepper Motor Drivers
ST's portfolio of STSPIN stepper motor drivers spans from relatively simple ICs with current control and phase generation to more complex solutions.
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Hall Effect Sensor Elements/ICs
ChenYang Technologies GmbH & Co. KG
is a sophisticated Hall Effect Gear Tooth IC featuring an on-chip 12-bit A/DConverter and logic that acts as a digital sample and hold circuit. A separate 6-bit D/A converterprovides a fixed hysteresis. The sensor does not have a chopper delay. It uses a single Hall platewhich is immune to rotary alignment problems.
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Compact Professional IC Tester
ChipMaster
The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices.
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Passive Probe, 20:1, 500 MHz, 1.3 M
N2875A
A compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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Strainer-Recorder
To ensure reliable operation of the measuring complex in the harsh conditions of ice tests, it is based on the industrial measuring platform NI CompactRIO, which provides mechanical strength and operation at negative temperatures.The system provides for operation both under the guidance of an operator with displaying the voltages removed from the ship's hull in the form of graphs on a computer screen connected to the strain gauge station via an Ethernet line, and in stand-alone mode, when the recording of a given duration is initiated by the station on pre-configured events: amplitude exceeding by one of channels, an external discrete signal or periodically at specified intervals.
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Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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DC-to-60MHz 1:10 Oscilloscope Probe Kit (HP-9060 Or HP-3060)
PRB-HP-9060
Up to 60MHz, Includes a handy storage pouch and includes an IC test-hook adapter for the probe., The BNC connector rotates to avoid cable tangle or kink., Cable length is 1.4 meters.
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Advanced Design System (ADS) Core
W2200BP
Advanced Design System (ADS) is the flagship product from Keysight EEsof EDA, the technology and innovation leader in high-frequency, mixed-signal electronic design automation (EDA). It is the only design simulation platform that enables the co-design of IC, package and board in high-frequency and hi-speed applications. ADS seamlessly integrates system, circuit, and full 3D electromagnetic simulation with Keysight's test instrumentation to perform single pass successful electronic designs repeatedly.
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Test Handlers
Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Accelerometor, Gyro, Magnetometer Breakout Board
SEN-38001
The LSM9DS1 is a highly configurable, flexible and precise motion sensing solution from ST Microelectronics - the latest in a wide-ranging inertial product line. It integrates a 3-axis accelerometer, 3-axis gyroscope and 3-axis magnetometer into a single IC , giving you a full nine degrees of freedom (9-DOF) in a tiny 3mm x 3.5mm package. Even with support components, square mounting pattern and connection breakouts for both SPI and I2C, this board is barely the size of a quarter.
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Multi-Output Driver ICs
Housing multiple half-bridges and high-side switches on a single IC, our multi-output driver ICs are designed to drive small automotive loads and medium current DC motors as well as providing protected supply lines.
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HUSKIE 2.0 roboRIO MXP Expansion Board
FRC3061-MXP2-R1
The Huskie Board, designed by FRC Team 3061, is an FRC qualified expansion board for the NI roboRIO robotics controller. In addition to breaking out all available signals on the MXP expansion port, this board uses a Parallax Propeller IC (8 symmetrical logical cores with shared memory and peripheral access) to enable tasks such as advanced data logging, on-field driver control and status, and NeoPixel control. Additional GPIO and analog inputs are added with open source code to allow further customization.
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Voltage References
Maxim offers an industry-leading portfolio of shunt and series voltage reference ICs. We were the first to develop a series reference in a 3-pin SC70 and in chip-scale packaging. Our hundreds of voltage references include high-accuracy, low-power, low-noise, and automotive-grade products.
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PLCC-to-DIP Adaptor
Series 652000/653000
PLCC to DIP Adapter. Converts PLCC packaged ICs to DIP footprints. Ideal for prototyping and testing/evaluation. Available with PLCC sockets or PLCC pads on top side. Consult factory for panelized form or for mounting of consigned ICs.
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PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Switches And Latches
With 30 years of leadership in digital position sensor ICs, we offer the broadest portfolio of magnetic switch, latch, and speed and direction solutions in the industry to serve almost any application need.
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IC-3172, 1.80 GHz Intel Core i5 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784228-01
The IC‑3172 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3172 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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Universal Programmer Superpro 610p
Until now,Support 243 IC manufacturer, 33941 pcs devices and keeps growing.Support devices with Vcc from 1.2V to 5V.Extremely fast speed hign than SUPERPRO/500P.Built with 48 universal pin-drivers.PC hosted mode and stand-alone mode. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip.Only IC manufacturer approved programming algorithms are used for high reliability. (+5%~-5%) and (10%~-10%) Vcc verification enhances programming reliability.Advanced and powerful functions.Production mode start chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Serial numbers generators are available as standard or customer-specific functions.Log file is useful for quality tracking.Over-current and over-voltage protection for safety of the chip and programmer hardware.WINDOWS XP/Vista compatibility/Win7/Win10
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SparkFun USB To Serial Breakout
FT232RL
This is the SparkFun USB to Serial Breakout for the FT232RL, a small board with a built in USB to serial UART interface. This little breakout is built around the FT232RL IC from FTDI, with an internal oscillator, EEPROM, and a 28-pin SSOP package this is a serious little chip.
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IC-3173, 2.20 GHz Intel Core i7 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784227-01
The IC‑3173 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3173 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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Pick And Place Test Handlers
Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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IC Test Clips
Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
