IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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Product
PathWave IC-CAP Simulation and Analysis
W7010E
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The W7010E PathWave IC-CAP Simulation and Analysis add-on enables simulation, tuning, and optimization of device behavior using Keysight's PathWave Advanced Design System (ADS) or the provided SPICE3 simulator or by linking directly to supported external simulators.
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Product
IC Tester
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The Peritec adopted the NI products, to build in 1/10 the cost of the commercial product functions of the IC tester. It offers original brand as "ECOIC".IC tester on the market, yet very expensive that several tens of million, part of its function could only really used. Therefore, it possible to continue to build the only really necessary function in Peritec, we have created a mechanism to be completed at a lower cost and development, high-performance, short-term.
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Product
Metering ICs
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Smart metering Analog Front End (AFE) ICs offer high accuracy when measuring DC and AC energy down to extremely low currents typical of home appliances in standby mode.
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Product
Ion Chromatography
Hyphenated Techniques
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Extend the scope of ion chromatography by interfacing your Metrohm IC with various sampling system and detection techniques
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Product
10M/100M/1G Ethernet Network Emulator
VirtualNetTM GE
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VirtualNet-1G is a high-performance Network Emulator that replicates real world Ethernet network effects such as latency and errors on user traffic in a controlled environment. The VirtualNet-1G emulator uses customized ICs to support full line rate performance at all frame sizes and impairment settings. The emulator can be transparently installed in-line as shown in the diagram below. VirtualNet-1G emulator has an intuitive and easy to use GUI interface and a very powerful TCL based CLI to aid in configuration and testing.
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Product
Surface Mount Package Emulation
SMT Adapters
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Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Circbord
8003
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VECTOR Electronics and Technology, Inc.
Pad per hole & peripheral ground plane.0.085” Square pads etched around each hole on wiring side.Accommodates any type DIP IC device or discrete component.Single sided board with pads and peripheral GND plane on one side only.Single-sided with no etch and plating on reverse side.
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Product
Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Product
Detection And Navigation System
Ice Navigator™
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sigma S6 Ice Navigator™ is a radar-based system that provides enhanced ice detection, tracking and analysis. The system can identify open water leads, ice bergs and ridges in ice fields. Ice Drift Analysis (IDA) is now an optional feature of Ice Navigator that gives operators unprecedented visibility and information on the movement of ice floes within X-band radar coverage. Capital expenditure and costs typically associated with activities in ice-threatened areas, can be dramatically offset.
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Product
Serial to Parallel Analysis Package
B4601C
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Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
Bus Analyzer
Scribe I2C
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The Blackhawk Scribe is an entry level, yet feature-packed and robust I2C debugging tool. The Scribe was designed to help engineers developing products which utilize the IC and SMBus interfaces.
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Product
Memory Products
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The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applications. Our extensive testing protocols have ensured industry-leading robustness and endurance along with best-in-class quality to provide you with reliable products, dependable technical support and a consistent supply of devices throughout your product’s lifecycle.
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Product
Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
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You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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Product
PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
Analog Input Module
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
PathWave IC-CAP PSP Model Extraction Package
W7021E
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The W7021E PathWave IC-CAP PSP Model Extraction Package provides measurement and extraction procedures for PSP, a CMC industry-standard model advanced surface potential model for MOSFET devices.
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Product
IC Card Meters
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Shenzhen Star Instrument Co., Ltd.
Single-phase IC card energy meter adopts dual measurements and raises the bar on tamper detection.
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Product
ESD Tester
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Tokyo Electronics Trading Co., Ltd.
Is performed to test the susceptibility of ICs and electronic devices to ESD.
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Product
Pick And Place Test Handlers
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Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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Product
Digital Multimeter
7125
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Peaceful Thriving Enterprise Co Ltd
This is a low power consumption, high accuracy and stable hand held multi-meter; with special designed IC to support true RMS measurement. It performs measurements of AC/DC voltage, DC current, resistance, diode and square wave output.
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Product
TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Product
Silicon heavy-doped Tweezer Tester
HS-MRTT
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Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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Product
High-Density Precision SMU (10 PA, 30 V)
PZ2131A
Source Measure Unit
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
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Product
InCarrier Loader/Unloader
NY32-LU
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NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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Product
Immunity
ESD coupling
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is used for conducted coupling of Langer ESD pulses (200ps rise time) into ICs.
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Product
Octal 4 Gsps 12-bit ADC
ADF-O4012
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The DEG ADF-O4012 FMC includes eight 12-bit, 4 Gsps RF analog-to-digital converters (ADC). The ADF-O4012 features a 16-lane, 24.75 Gbps JESD204C interface, flexible clocking and triggering options. This ADF-O4012 leverages two Analog Devices AD9209 MxFE (Mixed Signal Front End) ICs, elevating the technology to a new level of integration.
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Product
PathWave IC-CAP BSIM3 Model Extraction Package
W7024E
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The W8553EP IC-CAP BSIM3 Model Extraction Package provides complete measurement and extraction procedures for DC, CV and RF model parameters. The intuitive, Windows-style user interface enables engineers to quickly produce an accurate model.
