Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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CAM/TRAC Test Kits
Series 40
The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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General Purpose Twin-Lead Tester
69136
Tests voltage in 90-250 volt range, AC or DC.Neon lamp glows indicating live circuit.The 5'' (127 mm) test leads have probes on the ends.Handy pocket clip.
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Non-Contact Voltage Testers
PeakTech Prüf- und Messtechnik GmbH
User-friendly tester for non-contact voltage testing from 50 V to 1000 V AC. Suitable for outlets, lamp sockets or against wire insulation testing. If AC voltage is present at the relevant measuring point, this is indicated visually by a flashing red LED and the integrated buzzer sounds. If the measuring point is voltage-free, the test probe lights up permanently green.
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Retractable Cable With Magnet Adsorption
3701
Peaceful Thriving Enterprise Co Ltd
*2 x 6m retractable test leads.*Used as an extension cord for cars, trailers, boats and more.*Optional accessory included alligator clips, test probes and banana plugs.*The tester can be used with any multi meter or device equipped with banana jack connectors.*Embedd A Magnet on the back to fix on suitable metal sheet of cars easily.
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Pilot VX
Pilot VX is a flexible, configurable flying Probe test system with an unrivaled set of technologically advanced tools, able to provide the test solutions required by the huge diversity which characterizes today’s electronics.
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Hardness Testers
Dalian Taijia Technology Co.,Ltd
Digital durometer for shore hardness testing pocket size model with integrated probe● Test scale: shore hardness● Standards: DIN53505, ASTMD2240, ISO7619, JISK7215● Parameters displayed: hardness result, average value, max. value● Measurement range:0-100HA(HD)(HC)● Measurement deviation:＜1%H● Resolution: 0.1● Auto switch off● With RS232C interface● Operating conditions: 0℃ to 40℃● Power supply: 4x1.5V AAA (UM-4) battery● Battery indicator: low battery indicator● Dimensions: 162x65x38mm● Weight (not including probe):173g● Application:Shore A is designed to measure the penetration hardness of rubber, elastomers and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D is designed for plastics, Formica, Epoxies and Plexiglass.shore C is designed for various foam and sponge.
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Handheld Digital Multimeter, AC/DC Voltage, Continuity, Diode, 3.5, 2000, Manual, 250 V
72-13440
*Palm size digital multimeter with 2000 count clear LCD display*CAT II 250V environment safety rating*Manual functional select and manual range selection*2m drop test, precision protection*Auto backlight off*Knobs shift smoothly, in-line with ergonomics*Equipped with comfortable protective cover and test probe holder*Powered by AAA 1.5V x 2 batteries*Non-contact voltage (NCV) detection*12-month limited warranty *view Terms & Conditions for details
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Test Probe Leads, With 19-mm Tips And 4-mm Tips
U1169A
The U1169A consists of one pair (red and black) of insulated test leads, one pair of test probes with 19-mm tips and another pair of test probes with 4-mm tips. Recommended for use with Keysight handheld digital multimeters. Rated at CAT III 1000V, CAT IV 600V, 15A.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Short Test Pin Probe
Probe 13
Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 The model CX-13 short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements.
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IEC61032 Test Probe 12 Figure 8
CX-12
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 12 Figure 8 is intended to be used on appliaces for verifying the inaccessibility of hazardous live parts or hazardous mechanical parts.
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Fingernail Test Probe
CX-Z11
Shenzhen Chuangxin Instruments Co., Ltd.
The Fingernail Test Probe is used to test to IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and a Delrin?handle. Handle has a threaded hole for use with force gauges.
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Heat Test Probe 43
CX-43
Shenzhen Chuangxin Instruments Co., Ltd.
It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliances.
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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Fault Injection and White-Box Testing
VectorCAST/Probe
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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LUTHER & MAELZER BARE AND LOADED BOARD TEST PROBES
SERIES LMP 60
MechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24 Kt gold plated over nickelBARREL: Nickel silver, 24 Kt goldplated over nickel
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Kelvin Test Leads
Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 93
ElectricalMAXIMUM CURRENT: 7 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS mean
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Interface Solutions
Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.
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SMT & THRU HOLE LOADED BOARD TEST PROBES
SERIES 43
MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel
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Environmental Test Probe, Temperature
72-8364
Type K Surface Temperature Probe Surface probe is ideal for flat stationary surfaces such as molds, heating elements, integrated circuits, transistors and transformers. Very low sensor element mass enables fast response measurement time. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs. See the complete line of Tenma Thermocouple Probes and Accessories
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Test Probe
UE
Qosmotec Software Solutions GmbH
Qosmotec UE Test Probe offers more flexibility to testers of mobile networks. It is a compact plug & play multi-UE test probe that allows for tests in UMTS, HSPA+ and LTE standards from any location. It can hold a custom set of up to 8 UEs.
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Multimeter Electronic Test Leads Kit
VERSATILE KIT includes 2 alligator clips with removable insulation, 2 extended range plunger mini-hooks with pass-through banana plugs, 2 heavy duty test probes, 2 42” lead extensionsUNIVERSALLY COMPATIBLE with either 0.16” banana plugs or shrouded banana plugs on all ends
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
