Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Products for High-Frequency Measurement
This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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Gaussmeter
DX-105
DX-105 Gaussmeter is a desktop gaussmeter. Which is based on the latest progress of the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probe adapts imported GaAs linear Hall-chip, the difference between any two probes is small, which can be replaced directly when it is damaged. DX-105 Gaussmeter is an ideal DC magnetic field test instrument.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Probe And Test Adaptors Set (13PCS)
3601B
Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Test Probe Kit
69600
Kit includes 14 flexible test probes, long straight probe, piercing back probe, crocodile clip, 4mm circuit tester adapter and Deutsch spooned probe. The probes are designed to be used on popular Weather-Pack, Metri-Pack and Micro-Pack style connectors. The test probes are 5" in length and are flexible to help eliminate damage to the connector terminals that can result from testing with a standard test probe. The 4mm adapter allows conversion of some circuit testers to a 4mm banana connector, which provides a better connection. Kit comes in a pouch for storage.
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Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Semi-Rigid Test Probes Up to 6 GHz
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Fine Pitch Test Probes
Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Kid's Finger Test Probe 19
CX-19
Shenzhen Chuangxin Instruments Co., Ltd.
Children Finger Test Probe 19 is intended to simulate access to hazardous parts by children of 36 months or less.
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Single Ended Test Probes
Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Auto-Ranging Digital Clamp Meter
DCM401
Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Pilot V8 Manual/Automatic
The Flying Probe Tester Pilot V8 Next series represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance.
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Multimeter Test Probes
Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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FEA and Strain Gauge Testing
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Rugged Connectors
Guaranteed for a minimum of 100,000 connections, our rugged connectors are designed to meet your industrial & ergonomic demands in harsh testing environments. We offer numerous connector specifications all fitted with interchangeable spring loaded test probes. Supplied as a single hand held unit, panel mounted or fitted to a test lead, the combinations are limitless. Designed directly from your CAD data and thoroughly tested, our rugged & reliable connectors are used worldwide on a daily basis.
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Test Hook Probe
CX-17
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
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Terminal Test Kit (92 Pcs)
3601C
Peaceful Thriving Enterprise Co Ltd
*Total: 92 pcs*Alligator clip x 2 pcs*Testing probe x 2 pcs*Flat terminal x 48 pcs*Testing needle x 4 pcs*1 to 2 connector x 2 pcs*Round terminal x 24 pcs*5K variable resistor x 2 pcs*Polarity tester/stroboscope x 2 pcs*SRS air bag replacement connector x 2 pcs*Male / Female to Male / Female Extension Wire x 4 pcs
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IEC61032 Test Probe 32
CX-32
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 32 is intended to verify the protection provided by fan guards against access to hazardous mechanical parts.
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Mini Back Probes/Wire Piercers
618
*Great for backprobing weather pack style connectors used with numerous automotive sensors *Also very handy for piercing and tapping readings on smaller gauge wires - using the included probe adapters *Works with most Test Lead Kits in the field - with standard 4mm banana plug test lead *Set includes four probes - red, black, green, yellow Test probes 21 mm length
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IEC60068-2-75 Spring Hammer Test
CX-T03
Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
