Wafer Resistivity
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Automated Wafer Prober for Magnetic Devices and Sensors
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Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Product
Earth Contact Resistance Tester
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SCR ELEKTRONIKS have developed an equipment namely Earth Contact Resistance Tester to test the appliance. To ensure the safety of operator it is essential that the Earth path (connection) should offer minimum impedance to by pass short circuit Current to Earth. This is ensured by measuring Resistance of the Earth path by passing heavy Current say 25 A. The Earth Contact Resistance Tester essentially comprises of a Variable Current source with digital Ammeter to measure the Current supplied. The Voltage drop across the Earth path is measured with a digital Voltmeter. Optionally for a particular Current (25 A) the meter can be calibrated in terms of Resistance. A timer is provided to switch off the Current after the Set Time.
