Wafer Resistivity
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Oil Based Resistance Standards
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Precision electrical resistors designed for high-accuracy resistance calibration in fluid/oil baths or in air.
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Product
Resistivity Meter for Concrete
Ohmcorr Test System™
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OhmCorr has two probes spaced 1.97" (5cm) apart which are placed in holes drilled to a depth of 3/8th" (8mm) and filled with conductive gel. The direct digital read-out of resistivity is displayed on the LCD when the control switch is activated. OhmCorr and CorMap, when used together, provide an economical and sound diagnostic system of corrosion in reinforced concrete.
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Product
Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
