Defect
other than specified, imperfection .
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Product
Sensor for Filament Inspection
EyeFI
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EVT presents the EyeFI - the sensor for the inspection of filaments. The sensor contains two cameras with an Aptina sensor and S-Mount lenses. The cameras are perpendicular to each other. It is therefore possible to inspect two sides of the filament, which means that the EyeFI can detect if the filament is out-of-roundness. Additionally the errors and defects can be detected. For example the occurring flaws are point-shaped or partly flaked, or point-shaped and transverse, or also looking like a longitudial rib, or only spots in different shapes. The defects can be detected with the EyeFI sensor. The EyeFI contains board cameras with sensors from Aptina, the IoCap and an evaluation processor. The housing is about 14x10x4 cm in size. The IoCap is the image-capture-IO-board, which is designed and developped by EVT.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
Ultrasonic Flaw Detector
MFD500B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD500B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-9999mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.
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Product
Dual Filament Source
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Get the optimal thermal profile for different materials and situations with the Veeco Dual Filament Source. This source is designed for growing high-quality Ga- and In-containing materials, while preventing charge material recondensation and significantly reducing defects. Dual Filament Sources are available for use with both SUMO and conventional crucibles (including Group III production crucibles).
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Product
DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
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Identifies defect position instantly- contributes to saving inspection time
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Product
Upsetting Testing Machine
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JINAN PRCISION TESTING EQUIPMENT CO., LTD
The full-automatic rapid upsetting testing machine adopts hydraulic loading and manual control. The metal material applies pressure along the axis of the sample at room temperature or hot state to compress the sample, test the ability of the metal to withstand upsetting plastic deformation under the specified forging ratio, and display metal surface defects. It is mainly used in the upsetting test of metal materials such as iron and steel enterprises, standard parts manufacturers, and tool manufacturers to test the ability of metal to withstand upsetting plastic deformation under the specified forging ratio and display the metal surface characteristics.
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Product
EasySegment
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Unsupervised mode: train only with “good” images to detect and segment anomalies and defects in new imagesSupervised mode: learn a model of the defects for better segmentation and detection precisionWorks with any image resolutionSupports data augmentation and masksCompatible with CPU and GPU processingIncludes the free Deep Learning Studio application for dataset creation, training and evaluationOnly available as part of the Deep Learning Bundle
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Product
Electrical Testing
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Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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Product
Agile Application Performance & Security Resilience Test Tool
Developer
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Keysight Network Applications and Security
Ixia Developer is an agile application performance and security resilience test tool that helps developers find bugs early in the development cycle. Ixia Developer features an integrated debugger that helps locate the primary source of defects. An easy-to-use, fast, and responsive web-based user interface significantly reduces the time it takes to move from test configuration to actual packets on the network. And by leveraging a robust ATI engine, Ixia Developer always includes the most up-to-date apps and security strikes.
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Product
Power Capacitor
POLB HD 7%
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Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
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Product
Downward-Looking SUMO Source For Gallium And Indium
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Attain large capacity, excellent flux uniformity, negligible shutter flux transients, and minimal depletion effects with Veeco’s Downward-Looking SUMO® Source for MBE. It combines a dual filament source with an asymmetric SUMO crucible featuring a narrow offset orifice and tapered exit cone with hot-lip heating. Result: excellent material quality, low defect counts, and good thickness uniformity. NOTE: This source is not for use with aluminum.
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Product
Drone Inspection Software
Qii.AI
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Qii.AI automates the detection and analysis of defects. It is the only enterprise AI platform that combines drone inspection software with an AI labeling tool, AI-assisted computer vision, and machine learning.
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Automated Optical Inspection (AOI)
TR7700 SIII 3D
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TRI’s ground breaking 3D AOI solution delivers the fastest hybrid PCB inspection combining optical and blue-laser-based true 3D profile measurement for the highest automated defect symptom coverage possible. Integrated state-of-the-art software solution and third generation intelligent hardware platform offer stable and robust 3D solder and component defect inspection and with high inspection coverage and easy programming.
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Product
Automated Excise Stamp Control System
Kama
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The automated control (verification) system of excise stamps allows for blotting accounting of alcohol, dairy and other products (inspection of the readability of DataMatrix, PDF, QR, Barcode and other barcodes of excise or federal stamps) at a speed of up to 20 pcs / s. This visual inspection allows you to quickly identify defects in DM and PDF printing. The recognition system also analyzes gaps and doubles in a sequence of codes. The system has its own mechanism for rewinding a roll with a volume of up to 5000 marks. All types of stamps (old and new, large and small) are supported. Wide range of options for configuring scanning parameters and automatic generation of reports for the EGAIS department. Possibility of manual scanning (by hand scanner).
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Product
Halt Hass Chambers
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HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
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Product
Static Code Analysis Tool
Klockwork
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Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Product
DI Lab System™
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Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
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Product
CT Ratio/Burden Tester
1047
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TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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Product
Automated Visual Quality Control System for Lid Assembly
Angara-form
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The automated visual inspection system is designed to identify and reject covers that have defects that have arisen during industrial production, as well as visible defects in the form of black dots or dirt on the surface of the cover.
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Product
VisualDetect LCD Voltage Detector / Interface Tester
VDL-01AB
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Hachmann Innovative Elektronik
VisualDetect LCD is an easily operated voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces. Additionally the LC-display indicates the measured current [I/A] and frequency [f/Hz]. Thanks to the integrated configuration menu it can be adjusted to switchgears operated below nominal voltage on-site.
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Product
E-beam Metrology And Inspection
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Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
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Product
Data Analytics
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KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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Product
Manufacturing Defects Analyzer
eloZ1-400
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Product
X-ray Inspection System
X-eye SF160 Series
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High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Product
High-precision Surface Inspection for Wind Turbine Blades
waveCHECK™
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8tree's waveCHECK is a handheld-portable 3D-inspection tool for inspecting wind turbine blades in manufacturing and operation. Its efficient detection of surface defects and instant visual feedback revolutionize surface inspection.It can detect wrinkles, steps, gaps, rain erosion and any other surface damage.
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Product
Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Product
Thermal Shock Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc. The thermal shock test can cause faulting or cracking by the expansion and contraction on the products, indicates the hidden manufacturing defects. Bell’s Thermal Shock Chamber ensure you to launch qualified product to the market.
