Embedded System
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Product
cRIO-9034, 1.91 GHz Quad-Core CPU, 2 GB DRAM, 16 GB Storage, and Kintex-7 325T FPGA, 4-Slot CompactRIO Controller
783453-01
Embedded Controller
1.91 GHz Quad-Core CPU, 2 GB DRAM, 16 GB Storage, and Kintex-7 325T FPGA, 4-Slot CompactRIO Controller - The cRIO-9034 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9034 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Product
Edge AI Inference System
AIR-021
Edge AI Inference System
Edge AI Inference system powered by NVIDIA® Jetson Orin™ NX/Nano and Super mode. Compact and high performance AI box. NVIDIA® Jetson Orin NX 16GB/8GB and Orin Nano 8GB Modules. 12~24V wide power and -20~50 °C (NX) -10~50°C (NANO) supported.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
3U System For Micro-ATX Motherboards With Up To 4 PCIe Expansion Slots
EPC-B3000 Series
Embedded PC
EPC-B3000 Series is a 3U System for Micro-ATX Motherboards with up to 4 PCIe Expansion Slots.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Modular Breakout System 160-Pin Plugin Module
95-190B-003
Modular Breakout System
The 95-190B-003 Plugin Breakout Module is designed to be fitted to a PXI 40-190B Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
PXIe System Sync Module, 5 Port
M9033A
System Sync Module
The M9033A PXIe System Synchronization Module is a dual-slot, 5-port module that provides multi-module and multi-chassis synchronization and triggering for Keysight's modular instruments.
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
AI Inference System Based On NVIDIA Nova Orin For AMR Applications
MIC-732-AO
Edge AI Inference System
Fanless and ultra-compact design. Embedded with NVIDIA® Jetson AGX Orin™ up to 275 TOPS. Supports 1 x 10GbE, 1 x 2.5GbE, 3 x USB 3.2 Gen 2 (10 Gbit/s). Supports 2 x CANbus, 1 x mPCIe, 2 x Nano SIM slots. Support Total 8-ch GMSL3.0/2.0 with FAKRA connectors.
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Product
Data Processing System
CRS-D8I-3VF1
System
The CRS-D8I-3VF1 VPX system’s I/O flexibility is capable of meeting a large number of configurations. It is designed to support Abaco Systems’ Intel 3rd generation Core i7 3U SBCs, Gigabit Ethernet switch, video compression card, CUDA-based graphics cards and a MIL-STD-1553/ARINC429 multi-protocol card.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
VPX Development System
VPX370 3U
System
The VPX370 is a second generation VPX development platform that delivers, performance, flexibility, and scalability all in a compact 3U VPX form factor.
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Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
788817-01
Embedded Controller
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
FRAMOS Sensor Module Ecosystem
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Embedded Vision applications have specific vision requirements. Image sensors (IMS) are not only part of stand-alone camera systems anymore. Today, IMS are very tightly integrated with processors into heterogenous “Embedded Systems“. The FRAMOS Ecosystem of Sensor Modules and Adapters provides vision engineers and developers with ready-to-use compositions of hardware, software and reference designs to accelerate time-to-market and optimize resources.
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Product
Mezzanine System
5041
System
ECM P/N 5041 provides eight channels of RS485 / RS422 I/O with fixed 120 ohm termination for each channel. Speeds are up to 30M bits per second. All channels power up as inputs. Also transceiver inputs are always enabled for loop back diagnostic use when the outputs are enabled. Software can enable outputs on a channel by channel basis.
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Product
19” Rackmount Data Collection System
DCS-211
Data Acquisition System
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
AXIe High Performance Embedded Controller: 2.8 GHz Quad-Core, 8 GB
M9537A
Embedded Controller
The M9537A is a second-generation AXIe embedded controller which enables new capabilities such AXIe wide PCIe support, multiple 4K video outputs, and optional high speed disk cache. It is designed for high performance, compact AXIe systems.The embedded controller is a powerful, one-slot module that easily integrates into hybrid test systems using the GP-IB, USB, and LAN front panel interfaces. Built upon a high-performance Intel Core i7 quad-core processor with Hyper-Threading Technology, it is perfect for high-performance applications and multi-tasking environments.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
PXIe-8862, 2.6 GHz 8-Core PXI Controller
788817-0118
Embedded Controller
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
IPC Systems
System
Industrial Server-Grade System delivers a scalable high performance platform for a wide array of industrial applications.
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Product
Embedded Computing Systems
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Whether it's an AppliPak or a Development System, your platform choices include a variety of board choices from our list of native and partner products.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
