Embedded System
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
Lighting Systems for Aviation
System
Flying on every major platform, Astronics offers decades of proven experience in delivering standard and custom lighting solutions that illuminate the world’s aircraft. From commercial to business to military, chances are we offer experience with your type of fixed-wing or rotorcraft program.
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
cRIO-9038, 1.33 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, Kintex-7 160T FPGA, and Extended Temperature, 8-Slot CompactRIO Controller
783850-02
Embedded Controller
1.33 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, Kintex-7 160T FPGA, and Extended Temperature, 8-Slot CompactRIO Controller - The cRIO-9038 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. The cRIO-9038 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. Additionally, the cRIO-9038 supports an extended temperate range. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Product
3U Intel® Core™ i7-2715QE 2.1 GHz Quad-Core Processor-based PXI Controller
PXI-3980
Embedded Controller
The ADLINK PXI-3980 PXI embedded controller, based on the second generation Intel® Core™ i7 processor is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
cRIO-9043, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 4-Slot CompactRIO Controller
785620-02
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 4-Slot CompactRIO Controller - The cRIO-9043 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 160T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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Product
Intel Atom N3350 DC Barebone Embedded SBC Fanless Slim System
EPC-S201
Embedded PC
Intel® Atom N3350 Dual Core SoC.Semi-Industry Fanless slim systen, Din Rail or Wall mount design.VGA display, COM port, 2 USB3.0, 1 LAN at Front.1 DIO port, 1 COM port at Side.Supports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite.No RED certification.
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Product
Simulation Systems
System
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Product
Embedded Sensing Systems
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Integrate Tekscan technology to improve product design and streamline your manufacturing process
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Fanless Embedded Box PCs
ARK Ultra Rugged Series
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The Fanless Embedded Systems ARK-V&S series are designed for rugged and space-critical in-vehicle and video surveillance applications. These embedded systems feature in-vehicle power (9~36Vdc, ISO-7637-2), in-vehicle certifications (E-Mark, IEC-60721-3-5 5M3), extension capability and wireless communication (GPS/G-sensor/Wi-Fi/3G/CANBus) for in-vehicle NVR applications. As for video performance, these embedded systems provide high graphic power (Up to 1080p/720p @120fps) and support IP Camera (4 Ports 10/100 PoE, IEEE802.3af) to maintain stable performance for mobile NVR
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Product
Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Mini-ITX Embedded Boards
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Industry trends indicate that users require a smaller and lower cost solution for their system requirements. Mini-ITX has a smaller board size and lower keep-out zones to enable a reduced chassis size for systems placed on the user’s desk, mounted on a display, or installed in space-restrictive environments. In addition to deployment in smaller chassis designed around the Mini-ITX form factor, these boards are compatible with ATX and microATX chassis without the need to retool the I/O shield. Mini-ITX embedded boards are ideal for applications in industrial automation, self-service kiosks, and other infotainment driven solutions.
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Product
Embedded Controllers
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AMAX embedded controllers deliver compact automation solutions with CODESYS integration, ideal for space-constrained industrial applications.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Embedded PCs EPC-P Series
Embedded PC
Embedded PC designed for machine vision with rich expansion options.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Embedded Components
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Teledyne Labtech prides itself in being at the forefront of RF/Microwave PCB development. Teledyne Labtech were also one of the first companies to successfully develop techniques for embedding SMD resistors and capacitors within multilayer structures and the embedding of connector pins in buried stripline circuits.The advantages of such a structures ensures a much higher density of interconnect. This then removes the need for via-hole connections to the board surface or the need to create access pockets to the inner layers. Consequently you finish with a board with that exhibits much lower RF/Microwave losses. This is particularly important when designing large RF feed networks or 16:1 power dividers.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
