Product

Probe Station

EPS500

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ECOPIA

EPS500 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.

Product

Probe Card

T90™ Series

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Celadon

T90™ Series - Celadon

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

Product

Semi-automatic 150mm Probe Station

CM460

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Signatone Corp.

CM460 - Signatone Corp.

CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.

Product

Lab Assistant

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SemiProbe

SemiProbe

The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.

Product

Fully Manual Systems

SPS-1000, SPS-2000, and SPS-2200

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MicroXact, Inc.

SPS-1000, SPS-2000, and SPS-2200 - MicroXact, Inc.

The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.

Product

Custom solutions

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NOVACAM Technologies, Inc.

NOVACAM Technologies, Inc.

Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software

Product

Cryogenic Probe Station

CPX-VF

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Lake Shore Cryotronics, Inc.

CPX-VF - Lake Shore Cryotronics, Inc.

The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.

Product

Probe Station

EPS1000

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ECOPIA

EPS1000 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum pcs of manipulators can be installed on the base unit of probe

Product

Stimulus Induced Fault Testing

SIFT

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FA Instruments

SIFT - FA Instruments

SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

Product

Recirculating Chillers

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Lake Shore Cryotronics, Inc.

Lake Shore Cryotronics, Inc.

Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.

Product

Line Automation Equipment

5000 Series In-line Handler

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Circuit Check, Inc.

5000 Series In-line Handler - Circuit Check, Inc.

The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.

Product

C-V Plotters

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Materials Development Corporation

Materials Development Corporation

MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.

Product

Probe Station

EPS300

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ECOPIA

EPS300 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.

Product

Sealing Kit for PHD-4001A on Cascade Elite E300, Octagon CM300 Probe Station

PHD-4001-TH-Seal

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High Power Pulse Instruments GmbH

PHD-4001-TH-Seal - High Power Pulse Instruments GmbH

*Sealing Kit for PHD-PPM10-H9 and PHD-4001A on Cascade Octagon CM300 probe station*High temperature range -40 °C to +200 °C

Product

Semi-Automated Probe Stations

SPS 2600, SPS 2800, and SPS 12000 Series

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MicroXact, Inc.

SPS 2600, SPS 2800, and SPS 12000 Series - MicroXact, Inc.

The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.

Product

Probe Cards

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Picoprobe

Picoprobe

PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.

Product

Vector Network Analyzer Extenders

VNAX

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Virginia Diodes, Inc.

VNAX - Virginia Diodes, Inc.

VDI''s VNA Extenders deliver high performance network analyzer frequency extension into the THz range. Models cover 50 GHz to 1,100GHz with additional bands in development. VDI modules come in a variety of form factors and configurations including our original Standard-size Modules and new Mini Modules that reduce volume up to 75%. In addition to our full Transceiver (TxRx) modules, VDI also offers Transmit-Reference (TxRef) modules and Receive only (Rx) modules that deliver optimized performance for specific applications. These modules combine high test port power and exceptional dynamic range to deliver industry leading performance. They are compatible with most network analyzers and can be integrated into probe stations and antenna chambers.

Product

Wafer Test Solutions

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AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

Product

Hot Chucks

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Materials Development Corporation

Materials Development Corporation

Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.

Product

Automated DC Parametric Curve Tracer

MegaTrace

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Robson Technologies, Inc.

MegaTrace - Robson Technologies, Inc.

MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.

Product

Electro Optical Terahertz Pulse Reflectometry

EOTPR 3000

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TeraView Ltd

EOTPR 3000 - TeraView Ltd

The EOTPR 3000 system is configured with a manual probe station to meet today’s tough FA environment which requires to isolate fault location in minutes rather than hours or days, while maintaining the EOTPR’s world leading sub-5 μm fault isolation accuracy.

Product

Optoelectronics and Photonics

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SemiProbe

SemiProbe

SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them poses unique challenges that require innovative solutions.