Stimulus
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Product
True-Mode Stimulus
S95460B
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S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
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Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Product
True-Mode Stimulus
S96460B
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S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
True-Mode Stimulus
S97460B
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S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
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Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Signal Analyzer
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Product
16-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2353A
Data Acquisition Module
The U2353A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2353A to simulate simultaneous analog input acquisition.
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Product
Portable RF Signal Generator
ACE 5400
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The ACE 5400 portable RF signal generator has four carriers that can be activated individually or in any combination. Each frequency and amplitude is adjustable by the user. The ACE 5400's basic and straight forward performance is perfect for applications that require a precise, stable RF stimulus. Applications: Testing and aligning CATV return bands; Great for institutional networks.
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Product
COTS VME Board Tester
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*Developed for support of Virginia Class Submarine at the COATS Integration Facility.*Provides Stimulus and Measurement Subsystem (SMS) to control, monitor, and evaluate VME assets used in the Non-Propulsion Electronic System (NPES) of the submarine.*Provides Native Environment Subsystem (NES) that simulates the operational configuration of typical NPES installations, and permits the test and evaluation of several types of VME assets.
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Product
Overview of features and functionality
NoiseCheck Software
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NoiseCheck is essentially SoundCheck without a stimulus editor, as it is designed for manufacturing the noise made by your product. It is a powerful piece of software, ideal for both R&D and production line acoustic measurements of fans, blowers, motors, gears, bearings, pumps and other electromechanical products.
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
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DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Product
Frequency Response Analyzers
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Frequency Response Analysis (also referred to as Transfer Function Analysis) measures the output spectrum of a system relative to a stimulus, and is used to characterize the dynamics of the system under test. The technique measures the magnitude and phase relationship between output and input waveforms as a function of frequency. The input signals may be from a wide range of sensors including acoustic (microphones/sonar), mechanical (accelerometers/displacement transducers), optical (photodetectors), and electrical (amplifiers).
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Product
Modular Power
RFP AC Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Bus Analyzer / Exerciser
PCF650
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The PCF650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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Product
Signal Generator
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Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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Product
NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
Signal Generator
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Product
Graphical Debugging for Verilog, VHDL, and C++ Simulators
BugHunter Pro
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BugHunter uses the SynaptiCAD graphical environment and supports all major HDL simulators. It has the ability to launch the simulator, provide single step debugging, unit-level test bench generation, streaming of waveform data, project management, and a hierarchy tree. The unit-level test bench generation is unique in that it lets the user draw stimulus waveforms and then generates the stimulus model and wrapper code and launches the code. It is one of the fastest ways to test a model and make sure that everything is working correctly. The debugger also has exceptional support for VCD waveform files.
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Product
Arbitrary Waveform Generator
AWG70000B
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The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
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Product
JTAG Boundary-Scan I/O Modules
SCANIO Family
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The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Product
VXI Single/Dual Channel Arbitrary Waveform Generator
3100M
Waveform Generator
The Astronics Test Systems 3100M Waveform Synthesizer Series combines 300 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3100M is a greatly improved version of a field-proven instrument ideal for VXI test stimulus generation. It replaces one or two of the popular 3152A Precision PLL Waveform Synthesizers, which are standard on many military and commercial test platforms.
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Product
Chroma LCR Meters
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Chroma Systems Solutions, Inc.
Some of the key features to look for in an LCR meter (also known as an impedance meter) are: accuracy, test frequency, measured parameters, test voltage and test current. Additionally, an easy to understand display of test results and the ability to access and use these results has become increasingly important. Component testing often requires much more than simply a resistance, capacitance or inductance value at a given test frequency and stimulus voltage. An LCR meter or impedance meter must have the flexibility to provide multi-parameters over wide frequency and voltage ranges.
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Product
64-Channel 1MSa/s USB Modular Multifunction Data Acquisition
U2331A
Data Acquisition Module
The U2331A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2331A to simulate simultaneous analog input acquisition.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Frequency Response Analyser
DP-cPCI-7554
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DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
