Stimulus
-
Product
True-Mode Stimulus
S95460B
-
S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
-
Product
High Volume Manufacturing Handling, Stimulus
ULTRA P
-
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
Product
True-Mode Stimulus
S96460B
-
S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
-
Product
Stimulus Induced Fault Testing
SIFT
-
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
-
Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
-
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
-
Product
Modulation Distortion Up To 125 GHz
S930712B
-
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
Product
Protocol Analyzer and Exerciser
-
Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
-
Product
Serial Analyzers
-
This product enables passive monitoring, debugging, and target system analysis of all speeds of Serial RapidIO Gen2 and Gen1 from the physical coding-sublayer (PCS), through serial protocol, to full-duplex link protocol exchanges. Stimulus transmitters allow for injection of SRIO packets, control symbols, and 8b/10b characters.
-
Product
HV AC Hipot
-
The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
-
Product
Modulation Distortion Up To 50 GHz
S930705B
-
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
Product
Overview of features and functionality
NoiseCheck Software
-
NoiseCheck is essentially SoundCheck without a stimulus editor, as it is designed for manufacturing the noise made by your product. It is a powerful piece of software, ideal for both R&D and production line acoustic measurements of fans, blowers, motors, gears, bearings, pumps and other electromechanical products.
-
Product
Benchtop Wiring Analyzer
2115
-
The Model 2115's compact size makes it the ideal choice for many benchtop or portable test applications. The small size does not mean you sacrifice any functionality. The 2115 delivers a full 1500 volt isolation and 2 amp continuity test stimulus. With the optional AC breakdown test providing 1000 VAC test stimulus, you will meet all test requirements.
-
Product
Platforms
-
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
-
Product
NI-5742, 16-Bit, 1 MS/s, 32-Channel Signal Generator Adapter Module for FlexRIO
782865-01
Signal Generator
The NI‑5742 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5742 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5742, you must pair it with a compatible PXI FPGA Module for FlexRIO.
-
Product
MEMS Handler
4664-IH
-
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
Product
Modulation Distortion For E5081A Up To 44 GHz
S960707B
-
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
-
Product
16-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2351A
Data Acquisition Module
The U2351A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
-
Product
Arbitrary Waveform Generator
AWG70000B
-
The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
-
Product
Synchro To Digital & Digital To Synchro Converter
DP-cPCI-5031
-
DP-cPCI-5031 is a Resolver to Digital and Digital to Resolver converter module. This module has four S/R to Digital converters(measurement channels) and two Digital to S/R converter(stimulus channels). This module is programmable for simultaneous acquisition and generation of the Resolver signal.
-
Product
Digital Stimulus Response PXI Card
GX5152 Series
PXI Card
The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
-
Product
Diagnostic Test System™
-
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
-
Product
Wide FOV Target Projector
-
The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
-
Product
200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
Pulse Generator
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
-
Product
Bus Analyzer / Exerciser
PCF850
-
The PCF850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
-
Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
-
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
-
Product
Modular Power
RFP Controller
-
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
-
Product
Modulation Distortion Up To 43.5 GHz
S930704B
-
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
Product
64-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2356A
Data Acquisition Module
The U2356A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2356A to simulate simultaneous analog input acquisition.
-
Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
-
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
-
Product
PMC Bus Analyzer / Exerciser
PMC650
-
The PMC650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
