Stimulus
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True-Mode Stimulus
S95460B
S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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True-Mode Stimulus
S93460B
The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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True-Mode Stimulus
S96460B
S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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VXI Precision Waveform Synthesizer
3151B
The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Modulation Distortion Up To 43.5 GHz
S930704B
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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NI-5742, 16-Bit, 1 MS/s, 32-Channel Signal Generator Adapter Module for FlexRIO
782865-01
The NI‑5742 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5742 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5742, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Modular Power
RFP DC High Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Modulation Distortion Up To 125 GHz
S930712B
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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64-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2355A
The U2355A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
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Protocol Analyzer and Exerciser
Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Manufacturing Defects Analyzer
406A
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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6U VME D/S, S/D, I/O & Comm Board
64CS4
NAI’s 64CS4 is a 6U VME multifunction I/O board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five intelligent, function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Modular Power
RFP AC Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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VXI Precision PLL Waveform Synthesizer
3152B
The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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PCI and PCI-X Bus Analyzer / Exerciser
PCI850
The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Modulation Distortion Up To 90 GHz
S930709B
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PCI D/S, S/D, I/O & Comm Board
76CS3
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Compact PCI Bus Analyzer / Exerciser
CPCI650
The CPCI650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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True-Mode Stimulus
S97460B
S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
