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EMC & RF Solutions
Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Laser Source
TW3109
Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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Transceiver Driver
S-112
Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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Supercontinuum White Light Lasers
SuperK series
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Test & Measurement
NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
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Digital Wideband Transceiver Analysis
S94610B
Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Phase Noise Analyzer and VCO Tester
FSWP
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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High Power Devices
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Cell Isolation & Analysis
Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
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Oil-in-Water Analyzer
LR100
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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LXI Microwave Matrix, 20GHz, Single 4x4, Terminated
60-751-144-B
The 60-751-144-B is a single4x4 20GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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ENA-X Vector Network Analyzer
E5081A
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Ultrastable Lasers
Menlo Systems offers ultrastable, frequency stabilized lasers at basically any wavelength. We supply fully characterized systems with linewidths <1Hz and Allan deviations of 2 x 10-15 (in 1 s) as well as modules and components allowing for state-of-the-art systems tailored to customers' needs.
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Modulation Distortion Up To 90 GHz
S930709B
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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SparkFun Spectral Sensor Breakout
AS7263 NIR (Qwiic)
The SparkFun AS7263 Near Infrared (NIR) Spectral Sensor Breakout brings spectroscopy to the palm of your hand, making it easier than ever to measure and characterize how different materials absorb and reflect different wavelengths of light. The AS7263 Breakout is unique in its ability to communicate by both an I2C interface and serial interface using AT commands. Hookup is easy, thanks to the Qwiic connectors attached to the board --- simply plug one end of the Qwiic cable into the breakout and the other into one of the Qwiic shields, then stack the board on a development board. You’ll be ready to upload a sketch to start taking spectroscopy measurements in no time.
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Liquid Cooling High Amp
qCf 12 High Amp
qCf Liquid Cooling High Amp: Our system for the professional characterization of fuel cells for high current densities and direct flow field cooling.
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Infared Refractometer
PRISM PRO - IR
The Prism Pro - IR is a state of the art Infrared Refractometer. It is the ideal instrument for characterizing infrared material properties of dispersion and refractive index.
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Ultra-Wideband (UWB) Test System
IQgig-UWB
The IQgig-UWB is ideal for both R&D characterization, high-volume production, and certification. Making it the perfect platform to enable a cost-effective, seamless transition from the lab to the manufacturing floor.
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Field Comm Analyzer
S5800E
S5800E Series Field Comm Analyzer is an economic instrument which is designed specifically for wireless communications field engineers and technicians. S5800E series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interference.
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Spectroscopic Ellipsometers
M-2000
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
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40 Channel Single-Ended Multiplexer Module for 34970A/34972A
34908A
Use the Keysight 34908A module for the 34970A/34972A Data Acquisition/Switch Unit for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing. Each module switches 40 one-wire inputs. All two-wire internal measurements except current are supported. The module low connection is isolated from earth and can float up to 300 V.
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Moisture Testers for Wood
Here you will find a moisture tester for wood to determine absolute moisture in different wood types. Newly-cut logs can have a moisture content of 80% or more, depending on the type. Since wood shrinks substantially when dried, it must be dried before being used in construction or most other applications. This is most often done using a large furnace called a kiln. The air drying method may also be used, but this is much slower. With the help of the moisture tester for wood you will be able to measure with high accuracy moisture in, not only raw wood, but also rolled paper products, planks, slats, beams, plywood, panels, particle board, main beams, window frames, etc., anything wooden. There are two ways of measuring moisture, these two ways are with or without damaging the material. The majority of types of moisture testers we offer at PCE do not damage the wood, or damage it very slightly.The moisture tester for wood is characterized by the measuring principle and the moisture sensors that can be adapted to it. The moisture tester for wood has special characteristics such as an automatic compensation of temperature. Besides, data can be stored and transferred to a PC or laptop, or characteristic curves can be programmed for specific wood types (only with the model FMD). Our moisture tester are of the highest quality standards in the industry, and are durable and easy to use.
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High-Performance Computers
EnsembleSeries™
Our high-performance compute blades are characterized by their compute power and density achieved by embedding the most contemporary processors, including Scalable Intel® Xeon® datacenter processors.
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Noise & Vibration Tester
System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
