Nano Probes
a 5 to 35 nm tungsten wire needle accessing an IC transistor node within 5 nm accuracy. Also known as: Nanoprober
See Also: Probing, Probers, Probing Stations
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Switch Probes
A switch probe is designed primarily for “presence/ electrical” test applications such as detecting the absence or presence of contacts within a wire harness connector. In this case, the switch probe provides electrical interconnection and verifies the connector has been manufactured properly. If contacts are missing or out of place, the part is rejected. If all the contacts are in place, the part is accepted and an electrical test is performed, verifying the electrical integrity of the connector and the wires within the harness.
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Alternate 3.00 (85.00) - 5.70 (162.00) General Purpose Probe
P2664G-1R2S
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z1-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1UN-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1T-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1P-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Test Probes
Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1I35-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1L18-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Debug Probes
J-Link and J-Trace
SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Active Probe
This probe is designed to help auto-technicians in troubleshooting electrical circuits. Apart from using the normal multi-tester, this probe can be used in conjunction with it by providing additional functions to assist in diagnosing electrical or components faults or failures in the vehicle.
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Differential Probe
DP-100
*This is the first detachable design (patent for 15 years)*High frequency, big power using. Max. Measuring is 7000Vp-p.I*t is capable for any brand of digital and analog oscilloscopes.*Additional AC Adaptor.*16MΩ high input impedance.
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Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-J100-3
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 155gf
K100-E150155-SKAU
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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ICT Probes
ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1I-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probes, Clamp-On
EM-6980 | 20 Hz – 50 KHz
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
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Current Probe
Beijing GFUVE Electronics Co.,Ltd.
Used to measure control currents for relays in electronic circuits and in evaluation testing of capacitors' current characteristics.
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Miniature Probes with Cords
Stat MP-1234
This optional probe is used with the Ohm-Stat RT-1000 Standard Resistivity Tester. It accurately measures surface resistivity and conforms to the EOS/ESD 11.11 specifications.
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Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2662AG-1R2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Hall probes
Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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Test Hook Probe
CX-17
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
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Electrical Resistance Probes
Electrical resistance (ER) corrosion probes are commonly used in petroleum, chemical processing, and other environments where on-line corrosion rate readings are required. Whereas test coupons must be removed from the process for evaluation, corrosion probes can allow corrosion rate determination without probe removal.
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Fiber-Optic Probes
Once your Universal Light Probe Sensor has been selected best for your test, the two-part solution is completed by selecting the suitable Fiber Optic Probe which is best for your application.Fiber Optic Probes come in a variety of different aperture sizes, lengths and cable types to suit your application.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1V-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Combined Probe for IAQ
P37AB147
Temperature, relative humidity, atmospheric pressure, CO2 (Carbon Dioxide) and CO (Carbon Monoxide) combined probe, complete with SICRAM module.
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ICT / FCT Probes
*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
