Mapping
See Also: Wafer Mapping, Survey
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SSD
MSATA SSD (iSLC) 3IE4 Series
Innodisk mSATA 3IE4 is SATA III 6.0 Gb/s flash-based disk, which adopts the latest Marvell NAND controller with Innodisk’s exclusive L³ FW architecture. The upgraded L³ FW architecture, combining Innodik signature 4K mapping algorithm L² FW architecture with powerful LDPC technology, makes 3IE4 series have outstanding high IOPS, better data integrity, and extended lifespan by reducing the occurrence of bad block numbers. Built-in thermal sensor and iData Guard ensure data integrity and reliability of mSATA 3IE4 for industrial applications.
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Touch Screen Mini SM OTDR 1310/1550nm
TR1600D Series
Shenzhen Sharingtek Communication Co., LTD
Small size and beautiful, easy to carry5-inch high-definition full touch screen, support multi-touch, interactive friendlyRich functions, one machine in hand, all installation and maintenanceWorking wavelength: 1310 and 1550nmBattery working time is more than 8 hours, safety guarantee1.5m event dead zone, 6m attenuation dead zone, maximum test range 100kmHigh-performance processor for smooth handlingIntelligent link analysis to visually display analysis eventsAutomatic OTDR, expert OTDR, event map, optical power meter, red light, stable light source, loss test
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SSD
M.2 SSD (MLC)
Innodisk M.2 (S42) 3ME4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Power Solutions for the More Electric Aircraft
The aerospace industry is experiencing a revolution with the wide-scale development of Electric Vertical Take-Off & Landing (eVTOL) and the More Electric Aircraft (MEA). These aerial vehicles, many of them unmanned (UAV), will serve a variety of service-related functions: Search and Rescue (SAR), Medivac, delivery and lift operations, aerial mapping, and of course, human transport. Astronics leads the industry with the next generation of aircraft power electronics serving this new and exciting market as an extension of our best-in-class CorePower® product line.
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Professional Cable Tester
1EA560
Multifuncional tester with LCD display enables to show wire maps and combination of pairs and their lenghts. It also measure the lenght until the broken line / cable. It is suitable for CAT5, CAT5E, and CAT6 cables. With special interface is also suitable for testing of coaxial and telephone cables. It has special unit for testing of cable ends in the other room.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Geophysical Services
GF Instruments provides methodical research, near-surface measurements, consulting and services in: engineering-geological surveys (for civil engineering, dams and dikes monitoring, utility mapping, landslides). environmental monitoring and mapping (waste sites, leakages, pollution plumes). UXO surveys. hydrogeological surveys (ground water explorations and protection).
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FTIR Microscopes & Imaging Systems
Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Multibeam Echosounder - Deep Water
HydroSweep DS
The HydroSweep DS is a deep water multiebeam echosounder ideally suited for seabed mapping in deep water up to full ocean depth based on a sonar frequency between 14 kHz to 16 kHz. Beside bathymetric depth information from 10 m to more than 11,000 m, sidescan data and backscatter data for seabed classification are acquired. The HydroSweep DS does not only gather sea floor information, but also uses adaptive bottom tracking windows to identify sonar targets in the water column and can be optionally operated as a parametric sub-bottom profiler without additional transducers and electronics.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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SF30/C High Speed Laser Rangefinder – 100 M
28058
The SF30/C High Speed Laser Rangefinders can output an amazing 18317 readings per second. Lightweight and compact, this 0–100 meter rangefinder is designed to detect terrain and obstacles or create maps from moving vehicles and UAVs. It uses a time-of-flight system to make accurate distance measurements that are not affected by surface texture, speed, wind, changes in barometric pressure, noise, ambient light, terrain, or air temperature.
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Real-time Ocean Data Solutions
Saildrone is the world leader in providing ocean data solutions with uncrewed surface vehicles, offering unrivaled payload, range, and reliability. Saildrone vehicles have sailed almost 1,000,000 nautical miles and spent almost 25,000 days at sea collecting data that provides unprecedented intelligence for climate, mapping, and maritime security applications.
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MMSI Module
M4KMMSI
The M4KMMSI is an intelligent, Mini Munitions Store Interface [MMSI] module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards. Each module of the M4KMMSI contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped and may be accessed in real time. Each M4KMMSI module may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT/Concurrent Monitor and Bus Monitor.
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BlueViewer Software
Quickly view .xyz 3D point clouds filesTake accurate point-to-point measurementsSupports a variety of color maps including jet, gradient, and intensityOverlay multiple point clouds
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Biaxial Inclinometers
Columbia Research Laboratories
Columbia's Biaxial Inclinometers use the same force balance accelerometer technology used in our single axis inclinometers. These Biaxial Inclinometers are used in applications where dual axis tilt measurements are required. The SI-702B series is intended for use in applications such as platform stabilization, surface mapping and measuring tilt angles in remote locations. The SI-701AI series, is designed with an output circuit configuration made for use in 4-20mA data transmission systems.
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ETL Testing
Data is of utmost importance in digital systems. Protecting data, therefore, is of utmost importance. ETL refers to Extract, Transform, and Load. It supports the movement of data from its source to storage. With ETL testing we ensure that the data is not lost or corrupted during this movement. Huge volumes of data are collected in various formats and sources. The mapping process of these data is error-prone and can have quality issues.
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Field Portable NIR Spectrometers For Mineral Identification And Analysis In Mining Exploration
With Spectral Evolution field portable NIR spectrometers and EZ-ID mineral identification software, geologists can measure and identify minerals within seconds and cover more ground than by using traditional methods. They can identify different mineral phases, create mineral alteration maps and more accurately identify mineral pathfinders for vectoring to ore deposits. Spectral Evolution's field portable, battery-operated oreXpress, oreXplorer and oreXpert ultra-high resolution NIR spectrometers are designed for mineral identification in mining exploration. The oreXpress, oreXplorer and oreXpert provide quick payback with faster, more accurate mineral identification in exploration for gold, silver, diamonds, iron, nickel, copper, uranium, aluminum - in the field, core shack, or in the lab, and provide:
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Coaxial Cable Tester
6106
Peaceful Thriving Enterprise Co Ltd
This device is designed to test the connection of F type coaxial cable. The testing includes continuity and cable mapping. The tester includes 4 mapping terminals with different color and a F type adapter, which are very helpful for cable identification.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Avionics Data Bus Tester
CORVUS-300
CORVUS-300 is an all-in-one avionics data bus tester combining Bus Monitoring, Time-Domain Reflectometer and Wire Mapping capabilities. Its modularity allows the addition of a Vector Network Analyzer or a Spectrum Analyzer based on testing requirements. CORVUS-300 is stock-listed, NSN 6625-01-703-0413, and managed by AFSC/PZAAC.
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ElcoMaster Oven Profiling Software
*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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High Voltage Isolator for Logic Analyzers
LX-08
The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Magnetic Susceptibility Meter for Multi-Layer Survey
MULTI KAPPA
Multi Kappa instrument serves for fast field survey allowing both spot measurement and mapping by means of several probes. Together with GF Instruments traditional pocket magnetic susceptibility meters cover wide range of demands for accurate susceptibility measurement on ground surface, outcrops and samples of rock and soil. geological survey, archaeology, agriculture and forestry, raw material prospecting, mineralogy, sedimentology, detection of metallic objects, UXO survey.
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Large Area Mapping Spectroscopic Ellipsometers for Flat Panel Display and Photovoltaic Industries
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Fixture Building Software
FixGenius
Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Low Cost Emulator
EB-51X2
* Emulates 8051 Derivatives with 6/12 Clocks/Cycle * 64K Code And 64K Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 40MHz * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software * Performance Analyzer * Emulation Header and Signal Testpoints * Serially Linked to IBM PC at 115Kbaud
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Network Management
PLANET Universal Network Management System is designed to monitor all kinds of deployed network devices, such as managed switches, media converters, routers, smart APs, VoIP phones, IP cameras, etc., compliant with the SNMP Protocol, ONVIF Protocol and PLANET Smart Discovery utility. It thus enables the administrator to centrally manage a network of up to 1024 nodes from a central office, greatly boosting network and power management efficiency. The NMS solution includes the software, hardware and Touch LCD controller series to attend to different applications. They all feature dashboard, topology and map viewing to make network management efficient and effective.
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kSA Emissometer
The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.
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Defect Isolation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB





























