Mapping
See Also: Wafer Mapping, Survey
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Product
Temperature Mapping
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Measure temperature between two surfaces, utilizing a thin and flexible sensor. The resulting data and our analysis tools offer insights to enhance product design, manufacturing, quality, and research.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Pressure Mapping
NIP PRESSURE MEASUREMENT SYSTEM
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A completely wireless system for measuring nip pressure between rollers in real-time
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Product
Continuous Surface Current Mapping & Wave Monitoring System
SeaSonde
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The SeaSonde HF radar system by CODAR Ocean Sensors is your solution for making continuous, wide-area ocean observations. The SeaSonde will provide you with years of real-time data over large coverage areas, with ranges up to 200 km — This is not possible with any other technology!
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Large Area Mapping Spectroscopic Ellipsometers for Flat Panel Display and Photovoltaic Industries
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HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Pressure Mapping
BPMS
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Measure pressure distribution between the human body and support surfaces such as seats, mattresses
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Product
Industry Standard in GPR for Utility Mapping and Locating
GSSI’s Utility Scan Pro GPR
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Geophysical Survey Systems, Inc.
With UtilityScan Pro, users can quickly identify and mark the position and depth of metallic and non-metallic objects; including utilities such as gas, communications and sewer lines as well as underground storage tanks and PVC pipes. Based on the SIR 4000 controller, the UtilityScan Pro provides the GPR professional with solutions to any underground locating situation.
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Concrete Corrosion Mapping System
15620
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Our Concrete Corrosion Mapping System (CCMS) can be used to satisfy the ASTM C-876 standard test method and the kit contains all equipment items that are needed to perform a corrosion survey on virtually all types of reinforced concrete structures, such as bridges, highway slabs and parking garages.
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RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Product
Color Sensor
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The color sensor product family includes both RGB (Red, Green, Blue) and high-accuracy XYZ light sensors for precise color measurement, determination, and discrimination. XYZ sensors are capable of providing xy chromaticity co-ordinates in accordance with the CIE 1931 color map. The ams color sensors include filters to block unwanted IR light in the visible spectral range, enabling highly accurate color measurement. Their high sensitivity coupled with their wide dynamic range make them well suited to continuous color temperature measurement of ambient light in display management systems, and automatic-white-balance assistance in camera applications. Some products have additional IR channels to assist with IR light source identification.
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Product
3D Software
Geomagic Wrap
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Geomagic Wrap 2017 delivers a new and improved 3D scan-to-model workflow. From expanded file format support to manipulating texture maps for bringing your printed parts to life, the 3D scan data toolbox of Geomagic Wrap provides a wealth of possibilities.
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Hydrogen Testing Solutions
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The widespread introduction of hydrogen is a necessary and essential part of the path to a climate-neutral future. AVL is ideally equipped to support and help shape this transfer. In terms of content, we provide extraordinary expertise in the fields of engineering, simulation and testing and act as a reliable innovation and development partner. With our test solutions, we support you specifically with your challenges, from development, through industrialization, to further operation. Depending on the technological maturity of your product, the test solutions offer you full flexibility within the planned development tasks or a customized proportion of supporting and automated functions, if quality assurance in the production environment is involved. The guarantee of safe operation is obligatory and is of course also mapped.
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Product
Spectroscopic Reflectometer
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– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
LAN Cable Tester PRO
PK-168 NextPRO S2
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PK-168 is capable of wire mapping by pin & pair up to 600 meters,PK-168P: Remote unit come with PoE detector. It detects presence of PoE and displays type of PoE either end-span A or mid-span B or ultra power over 4 pairs and either 802.3af (PoE) or 802.3at (PoE+) is present.
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Product
Beacon Monitor
FBM200 Series
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The FBM200 Beacon Monitor is a versatile new application for monitoring. It is a high-gain dedicated 406 MHz receiver that automatically receives, decodes, logs, and maps all Cospas-Sarsat 406 MHz beacon transmissions from a wide surrounding area (self-test and LIVE activation). Applications of the Beacon Monitor include, but are not limited to:
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Product
NEON Squad Tracker
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Accurate location information is critical for enabling improved navigation, situational awareness, targeting, and mapping. GPS-may be denied in triple canopy, urban canyons or indoor and subterranean environments, and can be easily jammed or spoofed. NEON Squad Tracker uses a suite of patented algorithms to opportunistically fuse inertial sensor data, GPS (including resilient GPS sources), warfighter waypoint check-in), and ultrawideband shared constraints and "dropped beacons", along with position location information from third party systems sources (psueodolite, satellite, etc.) to deliver reliable GPS-denied location. Features:Sensor fusion for dismount personnelFlexible 3rd party constraint processingIntegrates with resilient PNT sourcesWarfighter map/waypoint check-inUWB ranging and constraint sharingOperation indoor, underground, and outdoorsAPI delivers warfighter location, motion, gait
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Product
Cycle-ATV Dynamometers
EC997 MC/Quad
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MD-EC997-MC/Quad is the ultimate motorcycle/ATV performance dyno. Mustang’s MC/QUAD Dyno is a specially designed, high-speed, low-inertia motorcycle/QUAD/Kart combination dyno. The low inertia design and eddy current loading features are perfect for precision tuning and diagnostic applications. The base mechanical inertia of the EC997 MC/QUAD is perfectly matched for testing lightweight cycles and quads, while the powerful eddy current power absorption unit provides enough muscle to apply a serious load for steady state testing applications. Quickly and easily diagnose performance problems, break in engines, perform EFI mapping and much more. Mustang has delivered thousands of performance dynamometer systems over the past 35 years and has perfected the art and science of dynamic vehicle loading and dynamometer control. While other dyno manufactures are still trying to catch up with our technology, Mustang continues to lead the industry and is recognized around the world as the industry’s best with regards to dynamic dynamometer controls. Quickly and easily diagnose performance problems, break in engines, perform EFI mapping and much more. Available options include above ground kits, portable models, automatic restraint systems and vehicle cooling fans. For shops wanting to test side by sides Mustang offers the MD-EC997-MC/SS which offers a wider outer track of 80-inches, larger rollers and higher hp/speed capacity!
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Pressure Mapping Technology
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Measure interface pressure between two surfaces, utilizing a thin and flexible sensor. The resulting data and our analysis tools offer insights to enhance product design, manufacturing, quality, and research.
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Product
PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
Digital Pattern
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Multi-Test Resistivity Measurement System
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Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Product
Encoder & Trigger
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High performance counter and multifunction I/O cards and trigger boards provide a variety of mapping functions between comparator and trigger output.
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Wireless Network Penetration Testing
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LGMS wireless network penetration testing uses automated and manual penetration techniques to locate and map authorized and unauthorized wireless access points, review corporate access point configuration and then discover weaknesses that could allow an attacker to penetrate those networks. Potential internal and external threats are documented, and a recommended action plan is developed to address any security risks.
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Satellite Terminal Geolocation System
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Satellite Terminal Geolocation System is designed to identify and locate sources of satellite transmission such as satellite gateway, VSAT Hub and VSAT terminals etc. The system is useful to the intelligence and defense agencies to identify the sources of satellite transmission of their adversaries and locate the terminals on digital map.
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Product
MPI Sorter Series
MPI LED Mapping Sorter Series
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MPI proudly presents the LED Mapping Sorter Series designed using a modular architecture with unsurpassed flexibility allowing every system to meeting each customer’s precise requirements. Utilizing advanced Pick & Place sorting process technology, the MPI LED Mapping Sorters deliver high speed die sorting cycle times of 55msec/chip or less. The Mapping Sorter series feature extra-large sorting area (8”) and bin area (140mm X 140mm) with a unique four-sorting arm design enhancing both the production efficiency and high-volume throughput.
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Product
Microprocessor Development System
DS-M8
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# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Product
Vector Data
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L3Harris Geospatial Solutions, Inc
Need digital vector maps? We have a large selection of maps available for purchase that include vector line, polygon, and point data sets for all areas of the world. These include U.S. Land Use / Land Clutter data, Garmin Digital Vector Maps, AW3D Data Sets, major world linear and point features as well as access to detailed international city mapping. We’ll work as your unbiased broker to deliver the right mapping data or create a fully customized product to meet your needs.
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Product
Multisite Probe Card
T300 ButtonTile™
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The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
