Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
Interface Card
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
USB Graphics Adapter, Internal Mount, DB-15 connector
DB-UVGA16
Graphics Card
- Mounts in DB9 cutout on chassis or in PCI slot- Uses internal USB pin header- Display resolutions up to: 1600 x 1200 (4:3), 1680 x 1050 (16:10)- Supports multiple display modes: Primary, Extended, Mirr
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
AINC 429 Multichannel Interface with Additional ARINC-717 Receive & Transmit Channels
DAS-429UNET/RT8-717
Interface Card
The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Embedded MXM GPU Module With NVIDIA RTX™ ADA 2000
EGX-MXM-AD2000
Graphics Card
- NVIDIA Ada Lovelace Architecture- Standard MXM 3.1 Type A (82x70 mm)- PCIe Gen 4 x8 Interface- 3072 CUDA® Cores, 24 RT Cores, and 96 Tensor Cores- 14.5 TFLOPS peak FP32 performance
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Product
NomadLAB
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It is equally adapted to application testing in a lab or field environment, providing communication spy and analysis for NFC, ISO/IEC 14443 A/B card signals, FeliCa, ISO/IEC 7816, SWP (HCI/SHDLC), emulation of ISO/IEC 7816, and ISO/IEC 14443 card signals for active testing of card readers.
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Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
High Density Interface Card
PMC-A429HD
Interface Card
Alta Data Technologies’ PMC-A429HD interface card offers an unparalled 16, 32 or 48 channels of ARINC-429 on a single-width, front panel PMC module. The PMC card can be used in almost any PCI/PCIe based backplane system, and can encode or decode almost any ARINC-429 physical layer signal. The card can also support several 717 channels.
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Modular VXI Switch Card Carrier
1260-101
Switch Card
The 1260-101 Switch Carrier accommodates two plug-in switch cards in a single slot VXI module.
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Product
Precision Multi-Channel DC Source PXI Card
GX1838 Series
PXI Card
The GX1838 is a multi-channel programmable DC Source providing multiple discrete outputs for avionics automotive, industrial testing and other ATE applications.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Regenerative Battery Pack Test System
17020
Test System
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
