Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Transcoding Card
VEGA-3310
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2-ch 4Kp60 or 8-ch real-time 4:2:2 10bit HEVC,AVC & MPEG-2 encode, decode & transcodeUltra-low latency supportLess than 35W power consumptionSimple-to-use API and example code for FFmpeg and GStreamer multimedia frameworks
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Product
Avionics PXI Express (PXIe) Interface Card - Multi-Channel, Multi-Protocol, 1553, ARINC, WMUX Interface for PCIe
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Alta Data Technologies’ PXI Express interface modules offer a wide range of MIL-STD-1553, ARINC and WMUX configuration options using Alta’s PMC cards on a single-slot PXI Express 3U carrier. The cards are based on the industry’s most advanced 32-bit FPGA protocol engines, AltaCore™, and by a feature-rich application programming interface, AltaAPI™ (with LabVIEW SDK).
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
FADEC/EEC Test Platform
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The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
NTS Platform
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Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Product
Compact Functional Test System
E2230C / TS-5040
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The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
Digital/Pattern/PE Card
PA64S
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The PA64S represents a new level of performance and capabilities for PXI-based digital instrumentation. The PA64S offers high performance pin electronics and 16 sites of TMU/SPI/I2C/CLK generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be integrated, supporting up to 256 sites (16 boards).
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Product
AINC 429 Multichannel Interface with Additional ARINC-717 Receive & Transmit Channels
DAS-429UNET/RT8-717
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The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Advanced SoC/Analog Test System
3650-EX
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Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
SSD Test Systems
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Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
ARINC PCI Interface Card
PCI-A429
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Alta Data Technologies’ PCI-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Test Systems
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Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
IDoor Module: 24-Channels Isolated Digital I/O With Counter MPCIe, DB37
PCM-27D24DI
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Meets Advantech Standard iDoor TechnologyPCI Express® Mini Card Specification Revision 1.2 compliantSupports wide-input/output voltage (10-30 VDC/5-30 VDC)High over-voltage-protection (70 VDC) and voltage isolation (2,500 VDC)Easy configuration & efficient programming by Advantech DAQNaviI/O address automatically assigned by PCIe plug & playKeeps the output settings and values after system hot resetSupports Embedded Automation PC UNO-2200/2300/2400 seriesSupports Control DIN-Rail PC UNO-1300/1400 seriesSupports Control Cabinet PC UNO-3200/3300/3400 seriesSupports Control Panel Computers TPC-xx81/xx82 seriesSupports Thin Client Panel Computers TPC-xx51 series
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Product
Quad Port Fiber 25GbE Ethernet PCI Express Server Adapter With Intel E810-CAM1. Ideal For Data Center Networking And Storage Area Networks.
PCIE-2531NP
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Intel E810 Controller4 25GbE SFP28 portsPCIe Gen. 4 x16 host interfaceLow profile (half length) form factorsSupports SR-IOV based virtualization
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Product
Benchtop Automated Functional Test
midUTS
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Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
PCIe X16 Intel Arc A380E Embedded GPU Card
EAI-3101
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PCIe x16 Intel Arc A380E Embedded GPU Card with 4x DP 1.4a. Intel Arc A380E with 2000 MHz Base Clock, GDDR6 6GB 96 bit Memory, up to 5.018 TFLOPS. 4x DP1.4a up to 8K UHD resolution. 0-60°C working temperature support w/ auto smart fan.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
PCI Express Graphic Card With NVIDIA RTX 2000E Ada
NVIDIA RTX 2000E Ada
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- NVIDIA Ada Lovelace Architecture- 5-year Longevity Support- Half height, half length design- PCIe Gen4x8 Interface- 16GB GDDR6 Memory, 128-bit Bandwidth- 2816 CUDA Cores, 12 TFLOPS SP Peak- 88 Tensor Cores, 191.9 TFLOPS- 4 x mDP (mini Display Port 1.4)
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Product
In-Service Electrical Continuity Test Card
Cisco ONS 15454
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The Cisco ONS 15454 In-service Electrical Continuity Test Card is a solution for confirming proper DS-1 and DS-3/EC-1 cabling between the Cisco ONS 15454 shelf assembly electrical interface adapter (EIA) panels and the user's patch panels. The solution is designed for shelf installations that are presently carrying traffic and tests for common wiring errors including electrical shorts, opens, wrong connections, and tip/ring reversals.
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Product
Terotest iTest
iTest
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iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices. In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
14-Bit, 12-Ch Analog Output Universal PCI Card With 32-Ch Digital I/O
PCI-1727U
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12 independent analog output channelsFuse on each channelUniversal PCI for 5 V and 3.3 V supportBoardID™ switchSynchronized output function
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
