Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Physical Layer Test System
N19301B
Test System
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
PCI Cards
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The PCI bus has been largely overtaken by PCI Express, introduced in 2004. DekTec has been very successful in vending a range of PCI cards, most of which are still available. All functions are now also available on PCI Express, generally with improved specifications.
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Product
Controller Card
GPIB-PCI-XL
Controller
The GPIB-PCI-XL is a flexible PCI GPIB controller card that converts any PC with a PCI bus slot into a GPIB controller.
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Product
Probe Card
T40™ Series
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Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
PXIe Card
pi827
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Sundance Multiprocessor Technology Ltd.
The pi827 is a COTS integration combining the flexibility of a Kintex-7 FPGA PXIe card (PXIe/700) and a 12bit 2.7GSPS ADC with 16-bit dual channel 2.8GSPS DAC (DAQ2P5)
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Product
Processor Card
CHAMP-XD1S
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Curtiss-Wright Defense Solutions
For highly compute-intensive industrial, aerospace, and defense applications where security is critical, the CHAMP-XD1S digital signal processor (DSP) provides enhanced Trusted Computing features alongside leading-edge processing technology for unmatched performance.
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Product
Express Card
DAS-429ExCARD/RT10
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Both cards contain 64 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table.The card's small size (54 millimeter wide) and suitability for Express Card compatible notebook computers make it a complete solution for developing and testing ARINC-429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The cards are supplied with C drivers, including source code, Mystic Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
FPGA Card
VP780
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The VP780 is a high-performance Virtex-7 VPX card with advanced digital signal processing capabilities. The design has been optimized for the implementation of complex FPGA algorithms with high throughput requirements.
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Product
Probe Cards
Direct Dock
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Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Product
Probe Cards
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These cards are compatible with WLCSP and can be customized according to pin positions. They can be used for a pitch of up to 180 μm. We are developing a product for a pitch of 150 μm, to be compatible with narrower pitches.
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Product
PC Card
I/O Mezzanine modules
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MAX Technologies’ IPM mezzanine modules are available for MIL-STD-1553, ARINC 429, ARINC 561, ARINC 568, ARINC 629, ARINC 708, ARINC 717, SERIAL ASYNC RS-232/422/485, CSDB, ASCB, HDLC/SDLC, Pulse/Frequency generator, Analog, Single and Differential Discrete I/O and more.
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Product
PC Card
MAXPCIe 502
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The MAXPCIe 502 carrier board is a high performance, modular multi-protocol PCI-Express solution to your tests and simulation requirements, supporting one or two MAX Technologies mezzanine I/O modules. It is powered by a 800MHz RISC processor and 16MB of shared memory, permitting it to buffer and process communication with the host computer.
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Product
PMC-WMUX for F-16 16PP194 Interface
PMC-WMUX
Interface Card
Alta Data Technologies’ PMC-WMUX interface module (PCI Mezzanine Card for Carriers and Single Board Computers) is a single or dual-channel (A-B Redundant = 4 Busses per Channel) WMUX card supported by the latest software technologies. This product is based on the industry’s most advanced 32-bit WMUX FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer, highly portable ANSI C architecture. This hardware and software package provides increased system performance and reduces integration time.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Probe Card
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Product
PCMCIA Card
DAS-429PCMCIA/RT10
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Both cards contain 68 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table, mapped within the Common Memory space. The card also contains a FLASH-based Card Information Structure (CIS) within the Attribute Memory space.The cards comply with the Personal Computer Memory Card International Association (PCMCIA Release 2.1) standard, including Plug and Play. The card's small size and suitability for PCMCIA compatible notebook computers with Type II and Type III slots make it a complete solution for developing and testing ARINC-429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The cards are supplied with C drivers, including source code, Mystic Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Product
SD Card
SD Card v.3.0 / eMMC v.4.51 IP Family
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Designed for embedded applications that require high performance, small form factor, and high storage capacity, eMMC provides the support for embedded mass storage memory on embedded host systems. The eMMC protocol simplifies the access to NAND flash memories (such as MLC) to the host by hiding the functional differences among suppliers. Compliant to the latest JEDEC eMMC specifications, Arasan’s eMMC IP supports power-on-booting without the upper level software driver. The explicit sleep mode allows the host to instruct the controller to directly enter the sleep mode. The interface supports interface voltage of either 1.8V or 3.3V.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Daughter Cards
FMC/BPX
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Daughter cards provide extensions to HES or TySOM boards providing additional devices and peripherals not included in these boards. Due to using non-proprietary connectors like FMC or BPX the daughter cards can be reused across different hardware platforms.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
