Discrete Semiconductor Testers
check connected individual semiconductor components.
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Product
Semiconductor Interconnect
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Materials that are usable in all backend BI/reliability applicationsHigh IO count capabilityFine pitch down to 0.25 The industry’s smallest DDR4 and DDR5 socket outlineAdvanced plating technologies and custom outlines
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Semiconductor
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Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
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Semiconductor Material Evaluation Equipment
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Equipment for evaluating semiconductor materials using various measuring methods is available.
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Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Semiconductor Test Services
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Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
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Product
Semiconductors
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Meets SDIO card v2.0 specificationSupports SDIO SPI, 1-bit, and 4-bit SD modesHost clock rate from 0-50 MHzSingle SDIO function interfaceSD commands processed in hardwareReset output on completion of initializationIndication of high speed and high power enabling to application logicMaximum block size supported is 1024 bytesThree I/O mode selection pinsCRC7 and CRC16 modulesSupports direct R/W (IO52) and extended R/W (IO53) commandsAPB bus interfaceParallel bus interfaceStandard 8051 split bus interfaceGeneric 8051 bus interfaceUART interface
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Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Semiconductor Testing Equipment
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We provide you with various inspection equipment mainly for the semiconductor post-production process. Also, "inspection boards", "measurement control" and "test applications" are available for you to meet your various needs.
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Product
DISCRETE TMTC INTERFACE BOX
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The Discrete TM/TC Box is a 6U custom 19’’ rack equipment that could be filled with 6U, 4HP plug-ins covering the main ECSS compliant discrete I /Fs. The I/O signals of this box are all arranged in the rear side of the box, keeping clear the front side: in this way no accidental operation could be performed on the box.
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Semiconductor Products
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International Testware Corporation
International Testware supports all major ATE models for today's semiconductor products.CredenceAdvantestCaesarHewlett-PackardLTXIMSSchlumbergerAndo...and MANY moreTeradyneMosaidOur Solutions offer:Mixed-SignalEMI ReductionR/FCustom TailoredLow NoiseReliable PerformancePrecise Length MatchingSuperior Impedance ControlCrosstalk "Immunity"Minimal Inductance
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
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Product
Semiconductor Technology, Micro Scriber
Precision Micro Diamond Scriber MR200
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Optik Elektronik Gerätetechnik GmbH
Precision micro diamond scriber MR 200 for exact manual scribing for defined cutting of structured silicon wafers.
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NI Semiconductor Test Systems
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The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Semiconductor
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You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Complete Solution for Developing & Testing Discrete Voltage-Level Interfaces
M4KDiscrete Module
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The M4KDiscrete module provides a complete solution for developing and testing discrete voltage-level interfaces. The M4KDiscrete contains control I/O registers that are memory-mapped and may be accessed in real time. The module supports twenty programmable I/O discretes that can record or control the external discretes that are connected to it. In addition, the module can record changes in the input discrete with an associated time tag via a built-in FIFO. Output discretes are open collector, capable of handling up to 32V with a maximum sink current of 100 mA each. Ordering Information:The user can set each discrete:• Either as input or output.• Either to TTL (0 – 5V) or Avionics (0 – 32V) voltage levels on inputs and• Either enable or disable external debounce on inputsThere is a 4092 Word FIFO (a string of 1023 discrete entries) containing the data and time tags.The M4KDiscrete module is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Product
RTM Discrete Signal Conditioning Board
MS 3632I
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CPCI Rear IO Discrete Signal Conditioning Board is a signal conditioning and interface board for CPCI based Advance Compute & IO Module (MS3639i). This board primarily focusing on signal conditioning of TTL/CMOS DIO levels to required type of discrete input and output interface. Digital IO from ACIO board to discrete IO at Rear IO interface. Board takes 144 DIO from ACIO and does Open/Ground, 28V/Open, 28V/Ground configuration. In addition it shall generate additional 32 discrete input / output signals with signal conditioning and all IO interfaces are brought to two 96 Pin Euro Connector.
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Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Rad-Hard Discretes
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ST's portfolio of rad-hard discrete products for Space applications includes:
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Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Product
32-CH Discrete Input Daughter Board Module
HSL-DI32-DB-N
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*Slave ID consumption: 2 - N: for 32-CH NPN sinking type sensor inputs or dry contact*Photo couple isolation voltage: 2500Vrms*Input impedance: 4.7KΩ*Input current: ??10mA (Max), ??12.5mA (Peak)*Input voltage: ??40V (Max)
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32-CH Discrete Input Modules
HSL-DI32-M-N/HSL-DI32-M-P
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- Slave ID consumption: 2 consecutive from odd- "N" type for NPN sinking type sensor or dry contact; "P" type for PNP sourcing type sensor or wet contact- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ± 10 mA (Max), ± 12.5 mA (Peak)- Input voltage: ± 40 V (Max)- LED indicator: Power, Link and Input status- Power supply: +10 V to +30 VDC
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32-CH Discrete Output Module
HSL-DO32-M-N/HSL-DO32-M-P
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Slave ID consumption: 2 consecutive from odd"N" type for NPN sinking type outputSwitch capacity: Single channel 500 mA; all channels 60 mA at 24VDCPhoto couple isolation voltage: 2500 VrmsResponse time: ON→OFF: 180µs, OFF→ON :1.2µsLED indicator: Power, Link and Output statusPower supply: +10V to +30 VDCOperating temperature: 0 to 60°C
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16-CH Discrete Input 16-CH Discrete Output Module with US Type Connector
HSL-DI16DO16-US
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*16-CH digital input and 16-CH digital output*Shrounded-type connector*Isolation Voltage: 2500Vrms*Higher output current up to 90mA/channel*Easy installation and wiring
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Combination Module: 2 Ch. MIL-STD-1553 & 12 Ch. Discrete I/O
CM8
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The CM8 module is a combination of NAI's MIL-STD-1553B module, FTB, and Enhanced Discrete I/O module, DT4. The CM8 offers twelve channels of discrete I/O and two channels of MIL-STD-1553B communications. The twelve discrete I/O channels are programmable as either input (voltage or contact sensing with programmable, on-module pull-up/pull down current sources), or output (current source, sink, or push-pull) up to 500 mA per channel from an applied, external 3-60 VCC source. The discrete I/O channels also provide additional functionality modes such as Pulse Width Modulation (PWM) output mode and Pattern Generator output mode. The two MIL-STD-1553B communications channels feature a dual, redundant, balanced-line, physical layer; a (differential) network interface; time division multiplexing; half-duplex command/response protocol; and up to 31 remote terminals (devices).
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Product
Cable Tester
CT100
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The intelligent, CPU-controlled CT100 accepts virtually any connector type: XLR, mono and TRS phone ( 1 /4 ", 1 /8 ", TT), RCA and MIDI. It shows which input pin is connected to which output pin. Separate LED's indicate proper shield connection and phantom power presence. The CT100 also offers an installed cable test mode and a continuity check plus a test tone generator.
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Stater/Field Tester
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FISHER TESTERS AUTOMATIC TEST EQUIPMENT
Touch Screen Interface. Windows® 10 Pro. High Reliability with Proven Design. USB Interface – No I/O boards in Computer. Remote Control Software for Factory Diagnostics/Updates. Full Network Compatibility.
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Insulation Tester
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Nippen Electrical Instruments Co.
DIGITAL METERS NIPPEN electronic energy meters are panel mounting type innovative energy monitoring devices ,having state of the art electronic microcontroller circuitry for reliability and accuracy. They can be used for 1Ø / 3Ø balanced and unbalanced loads.
