Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1Z-6
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Universal Test System
LEON System
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A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Mezzanine System
5081
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The 5081 provides four channels of 12 bit digital to analog voltage output, with multiple single ended output ranges. Each channel is software selectable for 0 to +5V, 0 to +10V, +/-2.5V, +/-5V, +/-10V or -2.5 to 7.5V ranges. The outputs reset to 0.0 volts on power up.
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Product
Standard 1.00 (28.30) - 5.40 (153.00) Battery Probe
BIP-10
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 157Full Travel (mm): 4.00Recommended Travel (mil): 126Recommended Travel (mm): 3.20Overall Length (mil): 591Overall Length (mm): 15.00
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Product
Advanced SoC/Analog Test System
3650
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Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Standard 0.66 (18.70) - 4.50 (128.00) Battery Probe
CP-2SB-4
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1L18-2-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 305gf
K100-D080305-SKAU
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K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25H-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1T24-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 155gf
K100-Q080155-SKAU
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K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25I35-8
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1L24-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
CP-2XX-4 Battery Probes
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25Z1-8
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
POGO-62 High Performance Bias Ball Probe
POGO-62
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
SIP-90-5 Test System Interface Probe
SIP-90-5
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Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
Standard 0.95 (26.90) - 4.50 (128.00) Battery Probe
CP-2SB-12
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 128Full Travel (mm): 3.25Recommended Travel (mil): 118.1Recommended Travel (mm): 3.00Overall Length (mil): 472Overall Length (mm): 12.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
In-Circuit Test Systems For Sale
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Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25UN-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1Z1-6-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25T36-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T1-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Power Rail Probe, 6 GHz
N7024A
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The N7024A power rail probe is for users making power integrity measurements that need mV sensitivity when measuring noise, ripple and transients on their DC power rails. The probe is designed for measuring periodic and random disturbances (PARD), static and dynamic load response, programmable power rail response, and similar power integrity measurements. Many of today’s products have tighter tolerances on their DC power rails than the previous generations of these products, and the N7024A power rail probe is designed to help users ensure their products meet these tighter tolerances.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L24-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1J-8
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ambient Single Point Kelvin Probe System
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This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
