Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Sputtering Systems
-
Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
-
Product
Microscopy Software/Hardware
ZEISS Atlas 5
-
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
Product
Etch System
-
When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
-
Product
50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
Beam Splitter
The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
-
Product
33% Beam Splitter
10700A
Beam Splitter
The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
-
Product
50% Beam Splitter
10701A
Beam Splitter
The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
-
Product
Beam Bender BK7, Fixed Horizontal-Bend Mount
E1834M
Beam Bender
The E1834M is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance horizontal mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
-
Product
15% Beam Splitter
10725C
Beam Splitter
The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
-
Product
Beam Bender
10707A
Beam Bender
The Keysight 10707A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 6 mm or less . Includes a housing for standard mounting.
-
Product
67% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834J
Beam Splitter
The E1834J is a 67% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
-
Product
Beam Bender BK7, Fixed Vertical-Bend Mount
E1834Z
Beam Bender
The E1834Z is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance vertical mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
-
Product
50% Beam Splitter
10725A
Beam Splitter
The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
-
Product
33% Beam Splitter - BK7, fixed horizontal-bend mount
E1834E
Beam Splitter
The E1834E is a 33% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
-
Product
Ion Chromatography
IC Software- MagIC Net
-
MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
-
Product
Ion Chambers
-
0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
-
Product
Ion Sensor
984v2
-
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
-
Product
Ion Chromatography
Eco IC
-
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
-
Product
Beam Probes
-
The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
-
Product
Technology that Focuses on Measurable Safety
Foretify™
-
A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
-
Product
Beam Diagnostics
-
We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
-
Product
Laser Beam Positioning
-
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
-
Product
*Beam Propagation Analysis
M²
-
M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
-
Product
Shear Beam LoadCells
-
Shear Beam LoadCells are designed for low profile scales and process applications. These loadcells should be mounted on a smooth flat surface using high strength hardend bolts. The mountaing holes are at the opposite end to where the cell is loaded. Some of the larger Shear Beam Loadcells use multiple mounting holes to allow extra bolts to hold them in place and keep them from stretching under the stress.
-
Product
Ion Beam Milling Systems
-
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
-
Product
Beam Characterization
-
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
-
Product
Ion Blower Nozzles
-
VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
-
Product
4% Beam Splitter
10725B
Beam Splitter
The 10725B 4% beam splitter, designed for beam diameters of 9 mm or less, reflects 4% of the total incoming laser beam and transmits 96% straight through. This optic is without housing and requires a user-supplied mount.
-
Product
Carbon Fibre Beam Gauge
-
Designed to measure both internal and external diameters and lengths, the high modulus carbon fibre beam is stiff, lightweight and has an extremely low co-efficient of thermal expansion (CTE). Suitable for measuring high accuracy diameters and lengths up to 4000mm+.
-
Product
*High Power Laser Beam Dumps & Low Power Beam Traps
-
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
