Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
-
Product
Ar Gas Cluster Ion Source
GCIS
-
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
-
Product
Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
-
Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
-
Product
Beam and Singlepoint Load Cells
-
We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
-
Product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
-
The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
-
Product
Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
-
HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
-
Product
MALDI Digital Ion Trap Mass Spectrometer
MALDImini-1
-
With its simple configuration and compact size, it is possible to install the MALDImini-1 in places where mass analysis devices could not previously be used. Through ingenious engineering and innovation its footprint has been reduced to the size of a piece of paper.
-
Product
Compact Type 4 Safety Beam Sensor
ST4
-
Panasonic Industrial Devices Sales Company of America
Panasonic's concept of connecting 6 sets of Sensor heads to 1 Controller in series offers maximum flexibility to solve a wide range of safety applications. Just configure exactly the number of Sensor heads and controllers required to protect the area in question, e.g. small openings or irregularly shaped spaces impractical for Safety Light Curtains. A beam interruption indicator is incorporated in both the emitter and receiver to indicate operation and assist with beam alignment.
-
Product
40 Mm Beam Pitch General Purpose Area Sensor
NA40
-
Panasonic Industrial Devices Sales Company of America
The NA40 General Purpose Area Sensor from Panasonic offers a slim body design, failure monitoring and easy modification of length with robust aluminum enclosure.
-
-
Product
Laser Beam Alignment
-
The alignment product line provides full solutions for applications such as: alignment of laser cavities, straightness measurement, machine alignment, wide-bed printers alignment and others. The AlignMeter system simultaneously measures incoming laser beam position (in µm) and angle (in µRad).It is a powerful compact device perfect for alignment monitoring, for testing the drift, centration and beam alignment relative to the outer housing or tube.
-
Product
Shear Beam Force Sensors For Pull/push Direction
-
INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges
-
Product
UV-Vis Double Beam Research Spectrophotometer
UVD-3400
-
UVD-3400 has an excellent performance blazed holographic grating optimized and optional reflectance attachment CT-type Monochromator and reduces stray light and widen the photometric range. Wavelength range: 190 nm – 900 nm ; Spectral bandwidth: 2nm
-
Product
Gridded RF Ion Sources
-
Veeco's gridded RF ion sources are designed for improved production of long-run ion beam deposition processes.
-
Product
Ion Chromatography
Metrohm IC Driver 2.1 for Empower®
-
Software drivers for integrating Metrohm IC instruments in "Empower® 3" made by Waters. One license per computer authorizes the operation of IC systems under "Empower® 3".
-
Product
Spectro UV-Vis Dual Beam PC Scanning Spectrophotometer
UVS-2800
-
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
-
Product
ION 100 Portable Ion Meter
-
The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
-
Product
Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
-
Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
-
Product
*High Power Laser Beam Dumps & Low Power Beam Traps
-
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
-
Product
Ion Chromatography
IC Software- MagIC Net
-
MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
-
Product
Chloride Ion Test Kit for Surfaces
134S
-
Elcometer 134S test method: a latex sleeve is filled with a Chlor*Rid extract solution and stuck to the test surface where the solution is worked against the surface to extract the salts. The titration tube is inserted and the results can be recorded.
-
Product
Beam Profiler
BladeCam Series
-
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
-
Product
Neutrals, Radicals and Ions Analysis
HPR-60 MBMS
-
The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS for the analysis of atmospheric plasma and reactive gas phase intermediates.
-
Product
Beam Position Detectors
-
We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
-
Product
Ion Sources
-
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
-
Product
Chloride Ion Test Kit for Water
134W
-
The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
-
Product
Laser Diode Modules: 635nm-660nm Visible Wavlength, Elliptical Beam
-
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
-
Product
Beam Directional Power Supply Battery 40 to 120 kV
CP120B
-
This ultra-light, compact and battery operated constant potential portable X-Ray generator is the perfect tool for specific NDT applications that require repetitive short exposures. Its versatility also makes it the ideal piece of equipment for security applications. In fact, in combination with the FLATSCAN15, the FLATSCAN30 and other digital X-Ray detectors, the CP120B will – thanks to its small focal spot and constant potential X-Ray output – enhance image quality and definitely contribute to a reduced exposure time.
-
Product
Ion Sensor
984v2
-
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
-
Product
Force Sensors, Load Cells, Shear Beam
-
INELTA Sensorsysteme GmbH & Co. KG
Exact force measurement and weight measurement
-
Product
*Beam Profiling For 266nm To 3000µm
-
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
