System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Standard Products
SBIR offers an extensive line of reliable, high performance test equipment used to characterize and calibrate IR, Visible and Laser systems. Products include blackbodies, visible sources, target wheels, targets, collimators, target projectors, laser test modules/systems and IRWindows™ software for automated testing. These modular, cost effective instruments are user-friendly and easily integrated into automated test systems. For more information, including printable data sheets, select a product from the list.
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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In-Line Debug Press
Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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Multiport Coaxial Switch, DC to 20 GHz, SP4T
87204B
The Keysight 87204B terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204B which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204B is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Rotary Table Test system
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
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G12x - 18 Module Solution
The G12x Receiver has four removable rubber feet below the platform and also allows for permanent tabletop mounting. Available with 15" or 20" platforms. The G12x accepts ITAs designed for both the G12 and G12x allowing versatility with your test system.
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PCI High Density Pecision Resistor Card, 9-Channel, 3Ω To 6.97kΩ
50-298-030
The 50-298-030 is a high density programmable resistor card with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 3.55kΩ
50-297-023
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Automation System for Durability Testing
STARS MATS
STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
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Transformer Bench Tester
KVBT
KV Hipot Power Test Equipment Co.,Ltd
Transformer Test System is applied for ex-work and maintenance detecting on various transformers.
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SAS Protocol Test System
M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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LED Lighting Panel Tester
igentic® 821t
Growing demand for light emitting diode (LED) products combined with increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. Sterner Automation, a leader in LED test technology, provides solutions that address these specialized requirements, including the versatile igentic® 821t panel testing system. The igentic® 821t automated process combines advanced vision technology with flexible positioning and power-up capabilities to detect inconsistencies in individual LEDs at the panel production level. The resulting detection capabilities ensure that the highest standards are met while maintaining the capacity associated with today's high speed automated lines.
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Linear Power Supplies Precision, GPIB or Local Control, Ultra Low Ripple/Noise
Series ATE-DMG
Kepco's 1000 watt instrument-grade digital power supplies, Series ATE-DMG, are linear low-noise power supplies designed to respond very quickly and precisely to voltage and current setting instructions delivered interactively by the GPIB (IEEE 488.2) or from a front panel keypad. When programmed from the bus, the ATE-DMG power supplies respond to the SCPI (Standard Commands for Programmable Instruments) common language for instruments used in an automatic test system.
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Night Vision Test Sets
HGH Infrared Systems NV-2500 is the new standard for digital night vision goggle testing. Designed for testing night vision monocular or binocular systems, the NV-2500 system provides automated testing of all standard NVD tests with unparalleled accuracy and operator ease of use.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PCI Programmable Resistor Card 2-Channel 3 Ohm To 16.3k Ohm - SPST
50-294-131
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Multiport Coaxial Switch, DC to 26.5 GHz, SP6T
87106C
The Keysight 87106C multiport switch improves insertion loss repeatability and isolation, which is necessary for higher performance test systems. The repeatability and reliability of this switch is vital to ATS measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. The Keysight 87106C terminated multiport switch provides the long life and reliability required for automated test and measurement, signal monitoring, and routing applications. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications. Low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy.
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Control System
HICOS
HIGHVOLT Prüftechnik Dresden GmbH
The HiCOS controller is a collection of modules for monitoring test systems and recording, creating, evaluating and evaluating measurement data. It is suitable for mobile and stationary test systems as well as measuring devices. The modular design of the HiCOS controller allows the expansion of functions. Existing test systems from other manufacturers can be upgraded with HiCOS.
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CCD Spectroradiometer
LMS-8000A/LMS-8000
LMS-8000A/LMS-8000 LED Measurement System is an automated measurement system for identifying the performance of individual LED. It is designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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D-Mic Auto Test System
BK9013
If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.
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Electrical Ground Support Equipment:
EGSE
Keysight provides a variety of configurable test systems for satellites and satellite flight hardware; including Solar Array Simulators, Battery Simulation and Conditioning, RF signal simulation and analysis as well as fully custom solutions.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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Torque Instruments
Advanced Force & Torque Indicator
Used with a range of 'plug and play' torque and force sensors - ideal for 'static' or 'dynamic' (rotary) torque measurementCan be used as part of a Mecmesin test system or mounted to one of your own test rigs
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3U Rackmount Appliance for PCI Express® Gen5
R300-G5 Pro
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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Replacement Protective Cover, ICon, Receiver
310113460
The receiver protective cover is designed to protect your modules and contacts while the test system is not in use. A protective cover is included with the iCon Receiver. The receiver protective cover comes with a beaded chain and mounting hardware.
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AUTOMATED SAFETY AND COMPLIANCE
DMC's test and measurement system offerings include designs and development of Automated Safety, Compliance, and Benchmark Testing. These serve interests of commercial product certification, including fire hazards, safety and signaling, lighting, building safety, energy, and hazardous location testing. These also serve interests of product and technology benchmarking, including brand quality protection, consumer quality, and energy efficiency. Test systems have been developed by DMC to support many standards, including UL (Underwriters Laboratories), Consumer Reports, Intertek, Energy Star, and EN / CEN European Standards.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
