System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Production – High Speed Functional Test Systems
Chroma Systems Solutions, Inc.
Built for production, our high speed functional automated test system is based on our C8000 platform which uses a unique test command optimization technology to prevent sending repetitive control commands to the system hardware devices. This improves system test speed dramatically and, when used with our PowerPro III software, makes it highly efficient as a closed or optimized auto test system.
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PCI Precision Resistor Card 6-Channel, 3Ω To 5.82MΩ
50-297-052
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 3-Channel, 2.5 to 102k
40-297-140
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Spin Testers and Bearing Assemblies
Vidac has created several spin test systems ranging from the basic manually operated model shown here to fully automated machines that can spin the customers components to a specific speed profile. Our 3D design capability ensures the tight tolerance fit required for high speed rotation.
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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CCD Spectroradiometer Integrating Sphere Compact System
LPCE-3
LPCE-3 is a CCD Spectroradiometer Integrating Sphere Compact System for LED Testing. It is suitable for photometric and colorimetric measurement of luminaries such as LEDs, LED luminaires, Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps) and CCFL. The measured data meets the requirements of CIE, EN and LM-79 clause 9.1 for the measurement of photometry and colorimetry.
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PXI Resistor Module 2-Channel 1.5R to 4.09k
40-293-023
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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DynoLAB Test Cell Supervisory System
SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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Quality Control for more Precision in Press Hardening
PRESS-CHECK
The automated test system PRESS-CHECK works with two powerful high-end thermographic cameras for continuous measurement of two-dimensional temperature distribution. This measurement is carried out before the pressing operation on the surfaces of the boards to be processed and subsequently on the resulting molded parts, ultimately enabling exact compliance with the thermal process parameters.
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Functional Test Fixtures
RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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PCI Resistor Card 2-Channel 1.5 Ohm To 8.19k Ohm
50-293-024
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, MCX
40-878-242
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Food Grips and Fixtures
AMETEK Sensors, Test & Calibration
We supply material testing instruments to some of the world’s most innovative companies within the food industry. The reason for this is our extensive experience within food testing, combined with our high precision texture analysis and packaging test systems.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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PXIe-2526 , 158‐Channel, 2 A PXI Multiplexer Switch Module
780587-26
158‐Channel, 2 A PXI Multiplexer Switch Module—The PXIe‑2526 is a high‐density PXI multiplexer switch module that is ideal for routing signals within automated test systems. It uses electromechanical relays to perform immediate switch operations in either a 158x1 1‑wire or 79x1 2‑wire multiplexer topology. The PXIe‑2526 also features onboard relay counting for relay monitoring.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, SMB
40-878-211
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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PXI Precision Resistor Module 4-Channel, 1.5 to 472
40-297-120
This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
783283-01
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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CMK Mechanical Kits
Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
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PCI 3-Channel Precision Resistor Card
50-297-103
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Test Points
TestStation LX2
TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 395kΩ
40-298-142
The 40-298-142 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Resistance Measurement
PROMET 100 / 200 / 600 high-accuracy, precision ohm meters deliver an adjustable test current up to 600 A which is independent of the supply voltage. They utilize the four-wire resistance measurement method, enabling them to meet extremely stringent accuracy requirements when determining resistance values in the micro-ohm range.State-of-the-art power electronics coupled with a robust design guarantee maximum reliability, even when used as portable devices in switching stations or industrial environments.The modern operating concept, an interface to the test systems of the ACTAS product line and an optional remote control unit make these micro-ohm meters flexible and versatile.
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PCI Precision Resistor Card 6-Channel, 2.5Ω To 102kΩ
50-297-040
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - China 220VAC
781630-10
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
