Structural
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Structural Testing
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Structural testing is used to verify the static strength, or fatigue strength, of a component by applying measured loads. Testing can be done to failure, to contractual requirements, or to validate finite element model predictions.
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Structural Test ICP® Accelerometers
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Conventional structural test data systems use few to several hundred sensors. Cables bundles can be complex and confusing resulting in setup errors. Sensors with TEDS (Transducer Electronic Data Sheet) allow for an internal sensor digital chip to store sensor information. This information contains descriptive identifiers that when connected to a TEDS compatible signal conditioner or data system, reads the descriptive information and automatically aligns the data system. Human error is minimized, reducing time consuming data verification or re-test. The Series 333 ICP® accelerometers, and their accessories, are designed to address the needs of multi-point modal and structural test measurement applications. This equipment was developed in conjunction with the world renowned University of Cincinnati Structural Dynamics Research Laboratory and proven in real-world testing situations. The PCB 333 Series accelerometers delivers rapid system setup, reduces human documentation errors, maintains calibration data of each sensor, allows for “Plug-and-Play” installation, reduces overall test time lowering project test costs.
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Structural Durability Products
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Instron offers a wide range of Durability Testing Products such as Controller and Software modules, Hydropuls actuators (linear & rotary), Servo valves, Sensors, Power Packs & Accessories and Test frames & fixtures.
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TDR Structural Health Monitoring
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Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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Structural Dynamics
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Structural Dynamics by OROS - bump tests, operating deflection shapes, modal analysis, and more
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Structural Monitoring Sensors
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Crouzet also offers services (instrumentation) for the measurement, control and monitoring of your industrial processes, equipment and structures. With our extensive experience and design office, Crouzet can bring you specific solutions that comply with your specifications, while respecting both your technical and financial constraints.
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Structural Testing Application Examples Using EDM Modal
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Illustrated below are some customer applications in varying industries who are using the hardware and software by Crystal Instruments to analyze and understand the structural properties of their test specimen(s). Analyzing the modal characteristics namely natural frequencies, damping and mode shapes of the test unit further helps in improving the design to enhance the mechanical behavior of the test unit.
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SoC Signoff & Structural Verification
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Defacto’s STAR augments existing RTL verification flows by providing fully automated structural checks. Users can also define and build their custom checks.
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Surface Roughness Meter
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Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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XCITE 1100 Laboratory Series
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The Xcite 1100 Laboratory Series is the most popular of the Xcite product line because of its large force capacity and broad frequency range compared to its extremely compact size. The 5 GPM 3-Phase hydraulic power supply used in the system provides a high level of low frequency displacement response for testing system subassemblies and non-linear structures such as suspensions and elastomeric dampers. The small piston area of the exciter and the high performance servovalve combine to provide excitation to over 1000 Hz allowing structure borne noise path evaluations.
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Atomic Layer Deposition Systems
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Atomic Layer Deposition (ALD) is a powerful way to build ultra-thin, super-precise coatings, one atomic layer at a time. It’s especially useful and efficient when working with tiny, complex 3D structures, making it a go-to technique in advanced semiconductor manufacturing.
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Portable Bridge Structures Control System
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Portable bridge structures control system is a set of digital modules and intelligent sensors placed inside of a compact case. Basic delivery scope of the system includes:
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Servopulser Control Unit
4830 Controller
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The 4830 has been developed as a controller for servo control type test devices to have the ultimate in advanced performance and operator ease. A single controller unit allows a variety of tests from testing of static properties through to testing of endurance and dynamic characteristics, and has all functions and performance required of a controller for testing machines for actual objects and structures in addition to materials.
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RF Device Test Socket
Coaxial Socket
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With unparalleled technology, coaxial structure and high-precision machining equipment, LEENO can provide RF test socket with high bandwidth, impedance matching and high frequency up to 100Ghz.
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BOMBARDING A.C. MILLIAMPERES METER
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A Bombarding A.C. Milliamperes Meter is one of the four instruments essential for proper luminous tube processing. This instrument monitors the level of bombarder current in milliamperes that is generated by the bombarder, through the tube being processed. It is necessary to accurately monitor the current for the tubing and electrode sizes used to ensure that the right amount is applied at the appropriate time. To do otherwise may cause damage to the electrodes, fluorescent coating inside the tube and adversely affect the glass structure.
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3D Laser Scanning Systems
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3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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Passive Waveguide Components
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We cover all kinds of connections between waveguide, coaxial, micro-strip and co-planar lines. Filters are available in waveguide technology as well as in stripline/micro-strip. Passive structures such as power splitter, power combiner, ortho-mode transducer and hybrids mostly are designed to meet the specific goals of the customer.
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Ultra-Low Frequency Spring Activated Vibration Isolation Workstation
MK26 Series
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The New MK26 Series Vibration Control Workstation with more ergonomic comfort is designed specifically for ultra-low natural frequency applications. Kinetic Systems manufactures the system utilizing the Minus K patented negative stiffness vibration isolators in order to provide a compact, passive Vibration Isolation Workstation with ultra-low natural frequencies, higher internal structural frequencies, and excellent vertical and horizontal isolation efficiencies. The MK26 has also been upgraded to provide much better user comfort and additional leg space.
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High Pressure Foam Analyzer
HPFA
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Our High-Pressure Foam Analyzer – HPFA is the world’s only measuring instrument for simultaneously analyzing the amount and structure of liquid foams under high pressure. The instrument provides various options for investigating foam behavior under the real process conditions of foam-assisted flooding methods in EOR as well as hydraulic fracturing.
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8 CHANNELS ARINC 429 Simulator Analyzer Tester
CIC429
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The CIC429 is a full featured, high performance Serial bus Simulator Analyzer Tester developed by Andor Design for test and simulation of ARINC 429 or similar Avionic buses. The CIC429 is designed as a 5/8 size plug-in card for an ISA bus. An on board microprocessor off loads the host by organizing the data in a predefined structure in the dual port RAM. Programming the CIC429 consists of changing this data, which can be done on the fly for real time applications
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Automatic Bias Controller
MATRIQ-IQABC
Controller
Optimizing DC bias points of an IQ modulator is no trivial task. There are six different Mach-Zehnder structures inside one dual polarization IQ modulator, all simultaneously influencing the properties of a single optical signal. Trying to optimize bias points using just the intensity measurement of the optical signal is time consuming, inaccurate and it requires a lot of knowledge and experience.
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Boundary-Scan Test Executive
ScanExpress Runner
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Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.
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Flat Carbon Sensor Conductivity meter
HE-960LF / FS-09F-1/2
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It is effective to keep the dilution of Slurry constant. Maintaining an appropriate conductivity value contributes to process stability in the wafer polishing process. Even highly viscous sample liquids such as CMP Slurry can be measured without problems because they use a sensor structure that reduces the risk of the sample liquid sticking to the electrodes. In addition, the sensor is made of a wetted material with excellent chemical resistance, which meets the cleanliness requirements of semiconductor processes. In addition to the above, it can also be used for introduction at the semiconductor process development stage and conductivity control of special chemicals.
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Test Equipment
ST9001D5
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Shenzhen Star Instrument Co., Ltd.
The ST9001D5 three-phase energy meter test equipment is full-featured and stable. Optional accuracy classes are 0.05, 0.02 and 0.01. The product series include: universal type, smart meter type, high-class reference meter type, and equipotential isolation type. As divided by structure there are combined type and integrated type. The meter test equipment is controlled via PC-based software. Choices of meter position are 3, 6, 8, 12, 24, 32 and 48.
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Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Configurable Data-Logging System
NI CompactDAQ
Data Acquisition System
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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Low Power SNMP AGC FTTB Optical Receiver
BGL2000
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Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai BGL2000 product series, is a low power consumption, high index, with SNMP network management, AGC, full function FTTB optical receiver. 2000 series' shells are structure compact aluminum wall hung ( without rain-proof ), RF interface horizontal output, Nixie tube displaying parameters. RF Overlay interface can be optional for IP/QAM and EOC insert, also can used for local program insert.
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Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Draw Tower Grating
(DTG)
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The Draw Tower Grating Chain consists of high strength coated FBGs which are positioned in a serial configuration. Thanks to the special production process, writing the Fibre Bragg Gratings during the drawing of the Fibre, the array can be made without any splices. Furthermore the FBGs can be mounted directly on a structure without coating removal for sensing applications. The different sensing points make use of the inherent temperature and strain sensitivity of the fiber to measure temperature or strain respectively.
