Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probing, Monitoring & Setting
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Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Product
Stack Probing Sensor
L722
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The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Product
CMM Contact Measurement (Probing)
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A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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Product
Topside Probing for Functional Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Product
Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Product
Magnetic Probing Systems
MPS-C-300 and MPS-C-350
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MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Product
Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62H-6-S
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 2.40 (68.00) - 6.20 (176.00) Battery Probe
BIP-8
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 188Test Center (mm): 4.78Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 60Recommended Travel (mm): 1.52Overall Length (mil): 396Overall Length (mm): 10.06
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25L18-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25A-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1T30-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1A-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.50 (71.00) - 5.80 (164.00) General Purpose Probe
P2665G-2W2S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
BIP-1 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 16Test Center (mil): 150Test Center (mm): 3.81Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 250,000Overall Length (mil): 323Overall Length (mm): 8.20
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) Bead Probe
BTP-72HC-6
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Push-Back & Push-Back Switch Probes
Switch Probe
Connector assembly check - extreme spring force - used in test modules.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1I-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Flat, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0F-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1T-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1J-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Hand Held Sheet Resistance Measurement Instrument[Replaceable Probe Set (Non-destructive Probe & Contact Probe) ]
DUORES
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Easy to measure sheet resistance & carry aroundReplaceable hand-held probes for Non-destructive & Contact type
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2D-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Ultra High 12.90 (366.00) - 48.00 (1361.00) General Purpose Probe
EPA-5A-2
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Product
CP500X, 500 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784253-01
High Current Probe
The CP500X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 1 meter in length. The CP500X attaches to BNC connections on both the signal input and instrument sides.
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Product
Step Probes (F733SP) F73316B0061G300SP
1000947
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The Step Probes (F733SP) F73316B0061G300SP are precision-engineered components designed for a spectrum of applications in high-reliability environments. With a robust pitch of 4.00 mm (157 mils), these probes can operate effectively across a temperature range from -45°C to +100°C, ensuring adaptability in challenging conditions. The probes feature a durable design with a plunger made of beryllium copper and gold plating, enhancing their conductivity and longevity, while the brass barrel, also gold-plated, ensures superior mechanical integrity and electrical performance. These attributes position the F733SP as a trusted choice for demanding technical tasks.
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Product
Sensor Circuit Probe
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The probe can be used in 12/24 volt system with ECM/ECU either independently or used together with a diagnostic scanner to distinguish faults that lie in the sensor itself or the connection wires. The simulated voltage is used to emulate signals generated by different types of sensors.
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Product
Basic Threaded Probes (F175, F176) F17517B120G150
1017293
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The Basic Threaded Probes (F175, F176) model F17517B120G150 is designed with precision and reliability in mind, making it ideal for various industrial applications. This contact probe features a basic design with a focus on maximizing electrical performance while maintaining mechanical robustness. With a pitch of 1.90 mm and an operating temperature range from -45°C to +100°C, it ensures durability and functionality across challenging environments.
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Product
Basic Contact Probe F79716B100G150
1007277
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The Basic Contact Probes (100 mil) F79716B100G150, with order code 1007277, are engineered to provide reliable electrical performance across a wide range of applications. Designed with a pitch of 2.54 mm (100 mil), these probes are effective at operating temperatures from -45°C to +80°C. Built for continuous operation, they can handle a current of up to 5.00 A with a typical contact resistance of only 25.00 mOhm, ensuring minimal energy loss and optimal conductivity. With a preload of 60.00 cN and a spring force of 150.00 cN, these probes are crafted for precision and durability, making them suitable for environments that demand both high performance and longevity.
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