Probing
See Also: Probers, Probing Stations, Nano Probes
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Single-ended, Direct Connect Probe, 34-Channel, 4 X 160-pin
U4206A
The U4206A is a direct-connect probe/cable with a standard soft touch pro connector at one end that routes to four 160-pin connectors that plug into the front panel connectors of a U4164A logic analyzer module. The U4206A is designed to be used with either the quad state mode or ¼ channel 10 GHz timing mode of the U4164A logic analyzer module. For use in quad state mode only, the U4206A includes two flying leads to connect additional clock qualifier signals into the clock inputs on Pods 3 and 7. Please refer to the U4164A installation guide for specific details on the operation of the U4164A quad sample state or ¼ channel 10 GHz timing modes of operation.
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25H79-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Highpass Filter/SMA
WFIL-H2500-12750F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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iSeries XL
XL-sized backshells offer larger cable exits & increased bend radius. Accommodates larger wire bundles, including high speed and twisted pair. Mating face remains compatible with standard receivers. Slide-off backshells allow easy access to wiring for maintenance and probing.
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Three-axis Fluxgate Magnetometer
TFM1186
The Three-axis Fluxgate Magnetometer TFM1186 is a member of Metrolab's THM1176 family of 3-axis handheld magnetometers. It is a lightweight, low-power, go-anywhere fluxgate magnetometer. Outstanding noise characteristics make fluxgate magnetometers the instrument of choice for measuring minute disturbances in the local magnetic field, for example due to an iron mass or AC power-line noise. The TFM1186 has a range of ±100 µT and a resolution of 4 nT. The TFM1186 simultaneously measures all three axes of the magnetic field, so you get a true field strength reading no matter how you hold the probe. The entire instrument has been reduced to a cable with a few fat spots, which can plug directly into your PC or into a battery-powered handheld computer. 3-axis Teslameter Gaussmeter
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T3CP Series AC/DC Current Probes
T3CP Series
Teledyne Test Tools AC/DC Current Probes are powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range of five current probes includes models with bandwidths up to 100 MHz, peak currents up to 500A and sensitivities to 1 mA/div.
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Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T80-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Sampling Systems And Accessories
Parker's selection of sampling systems and accessories features fuel-drip bunker samplers; mini-sample cylinder valves; ultral-seal constant pressure cylinders for gas or liquid applications; single-flow, dual-flow and hot-tap probes; spun end sample cylinders for sample transportation; heated-enclosure systems for use with natural gas samplers; and composite gas samplers, among other solutions.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1I8-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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POF Ext Ø 1,5mm 600mm, from Light Probe to VPC ITA Contact (R)
YAV90CLR11
600mm Length. 1,5mm External diameter.
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25J-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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4.0mm Hazardous Live Parts Probe
CX-4.0
Shenzhen Chuangxin Instruments Co., Ltd.
Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1L24-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Voltage Non-Contact Current Probe
P02-0802
The TESCO High Voltage Non-Contact Current Probe (Catalog No. P02-802) was developed using current sensor technology. It is a two-piece, True RMS ammeter with a fiber optic link between the high voltage sensor and the readout at ground potential. The sensor is mounted on a hotstick and slipped over a high voltage line.
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High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
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NEXTest 7
PK-2030/2032/2033/2036/2037/2038
NEXTest 7 is an advanced and unique tester in the market. It's designed to check and troubleshoot the pin connections of Display port & HDMI prior to installation on equipment. By using advanced technology to verify the integrity (20 pins + shield) of both display port and HDMI cables, especially for HDTV installation and DIY termination in the field, solving your cable testing need, unlink all of the other testers verify 9 circuits only. It checks for opens, shorts, miswires and intermittent faults in all conductors plus shield continuity, most tester only test for opens. It displays cable map results of both TX (near end) and RX (far end) on the main unit, either on testing before or after installation cables. User can easily read and determine the actual 21 pins configuration on main unit. It employs both auto and manual scanning of 21 wires. Tone Generator mode transmits two selectable tones on each pin for use with Net Probe (PR-06P) optional, enables one to quickly locate a cable. It's capable of testing up to 8 cables and locations at one time. NEXTest 7 especially features a self-learning mode to memorize cable pin out for testing large quantity standard or custom cables for PASS/FAIL a snap, makes testing quick and more efficient.
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Clamp Meters
Basic functions:AC current: 40/400/1000ADC current: 40/400/1000AAC voltage: 4/40/400/750VDC voltage: 400mV/4/40/400/1000VResistor: 400/4/40/400K/4/40MTemperature: -20 to +750°CFrequency: 10/100/1000Hz/10/100kHz/10MHzDuty cycle: 0.1 to 99.9%Capacitance: 5nF/50nF/500nF/5μF/50μF/200μFSpecial functions:Auto rangingNCVDiodeContinuity buzzerLow battery displayData holdRelative data holdAuto/manual range shiftZeroAuto power-offOverload protectionSampling frequency: 3 times/sMaximum display: 3999Maximum open distance of clamp mouth: 55mmGeneral characteristics:Color: iron gray and orangeNet weight: approximately 274gLCD size: 46 x 32mmSize: 245 x 90 x 33mmPower: 1 x 9V and 6F22Packing content:CartonHandheld bagEnglish manualTesting leadBatteryTemperature probe
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Auto Load 4 Moving Probe Tester
AL Series F4H4033AL
Medium and High Volume Production Model with Auto Loader. Max. Test Area 15.7 x 13" (400x330mm). Max. Transferable Panel Size 16.5 x 13.4" (420x340mm). Number of Probes 2 Upper, 2 Under. in. Pad Pitch *4 0.00236" (60µm). Min. Pad Size *5 0.00118" (30µm).
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Digital Pocket Psychrometer
DTH35
UEi Test & Measurement Instruments
Digital pocket psychrometer with probe cover that can be used as an extension
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1 GHz 60 V Common Mode Differential Probe
DL10-HCM
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Wireless Inspection Cameras
General offers three wireless inspection cameras whose probes can be disconnected from the grip and monitor. They are the DCS18HPART (with a 6mm/0.23 in. diameter articulating probe), the DCS1800HP (with a 5.5mm/0.22 in. diameter non-articulating probe), and the DCS500 (with a 9mm/0.35 in. diameter probe and a 5 in. diagonal color LCD). Wireless inspection cameras offer operating flexibility because the user can use both hands to manipulate the probe.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Pile Thickness Tester
TF640
TESTEX Testing Equipment Systems Ltd.
The gauge is positioned on the carpet and six loaded needles penetrate the pile until they make contact with the denser backing. The pile surface is located by a flat probe. The pile thickness can then be read directly from the digital gauge.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Scanning Probes
3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
