Semiconductor Test
prevails upon the DUT to demonstrate It's fulfillment of test requirements.
See Also: ATE
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Product
Packaging Manufacturing
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KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
PXI-5670, 2.7 GHz PXI Vector Signal Generator
PXI-5670 / 778768-01
Vector Signal Generator
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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Product
Highest Throughput For Fragile Devices
Ismeca NY20
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20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Product
PXI Switched Guard Reed Relay Module, 16x 2:1 Multiplexer
40-121-011
Multiplexer Module
The 40-121-011 provides 16x 2:1 multiplexers in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
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Product
Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
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Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Product
Power Device Test Systems
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Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Test Contactor/Probe Head
Hydra
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Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Faraday Cages
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LBA's EMFaraCage® faraday cages are EMI and RFI shielding boxes and RF test enclosures that bring convenience to device testing. Faraday cages are ideal for isolating critical systems in high field RF environments or wherever RF ingress or egress must be minimized. Security, production testing, biomedical research and semiconductor testing are only a few of the many areas where EMFaraCage® faraday shielded enclosures are employed. EMFaraCage® faraday cage enclosure systems are fully featured to support a wide variety of test missions. The standard faraday cages include effective power, dataline and RF signal isolation in large test volumes. EMFaraCage® faraday cages are much more affordable than shielded room solutions and offer the convenience of portability.
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Product
Highest Demanding Finishing Processes
Ismeca NY32
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32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.
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Product
Semiconductor Test Software Solutions
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The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Product
Semiconductor Automatic Test
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Qmax Test Technologies Pvt. Ltd.
Semiconductor Automatic Test by QMax
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Product
Test Handler
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Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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Product
Electrical Probe Systems
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INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Product
LXI High Voltage Matrix 2-Pole 100x2
60-310-102
Matrix Switch Module
The 60-310 is a 2-pole Matrix Module available in 300x2, 200x2 and 100x2 formats. It is capable of cold switching 1000VDC and has a maximum carry current of 1A. It is designed for high voltage applications including circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing. The 60-310 is designed in accordance with the LXI Standard 1.4 and is supplied in a 2U high, full rack width case with 500mm depth.
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Product
PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
Analog Input Module
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
PXIe-5672, 2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator
779900-02
Vector Signal Generator
2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator —The PXIe‑5672 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5672 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks. For specific communications standards, you can use various software add-ons to generate modulated signals according to standards such as WCDMA, DVB‑H, and ZigBee.
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Product
Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
Steam Aging Tester
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Wewon Environmental Chambers Co, Ltd.
These steam aging chamber applied for the testing of sealing property for multi-layer circuit board, IC sealing package, LCD screen, LED, semi-conductor, magnetic materials, NdFeB, rare earths and magnet iron, in which the resistance to pressure and air tightness for above mentioned products can be tested out. Overall of the steam aging tester made of stainless steel SUS # 304HL, simple operation settings. Microcomputer digital LED control with time planning function , the maximum set 9,990 Mins. Parts, connectors, passive components , semiconductors oxidation test pin high temperature and humidity. Metal pin soldering test accelerated aging test. Multiple overtemperature protection / water cut heating and other safety devices. The touch- PID + SSR temperature controller, timer function while a time , set the 9990 maximum fractional unlimited.
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Product
Caibration Equipment For Lab Use
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In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Product
LXI High Voltage Matrix 2-pole 300x2
60-310-302
Matrix Switch Module
The 60-310 is a 2-pole Matrix Module available in 300x2, 200x2 and 100x2 formats. It is capable of cold switching 1000VDC and has a maximum carry current of 1A. It is designed for high voltage applications including circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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Product
Test Data Investment Services
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PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Test Handlers
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Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Product
Semiconductor Electrical Test
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We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
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Product
High-Density Precision SMU (100 PA, 30 V)
PZ2130A
Source Measure Unit
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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Product
Semiconductor
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With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
