Flying Probes (For Seica Test Systems) FL10030S060P300E21M

1142224 - FEINMETALL GmbH

The Flying Probes (For Seica test systems) FL10030S060P300E21M represents a sophisticated solution tailored for high-precision testing environments. Designed with a basic contact probe mechanism, it ensures reliable connectivity with circuit boards and other electronic components. The probe maintains a versatile operational temperature range from -45°C to +100°C, making it suitable for various applications across differing environments. With a pitch of 2.54mm (100 mil), it is ideal for densely packed circuits, facilitating seamless testing without compromising precision or reliability.