Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, increase your throughput and help the world’s leading R&D labs with testing applications as diverse as your requirements.
- 949-600-6400
- 949-600-6401
- 19772 Pauling
Foothill Ranch, CA 92610
United States of America
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Digital MultiMeters
Chroma 12061
Chroma Systems Solutions, Inc.
Built-in high speed, low interference A/D converter with a maximum speed of 2000 rdgs/s; the best solution for high speed measurement.
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Instrument SoftPanels
Chroma Systems Solutions, Inc.
Chroma softpanels make bench DVT testing easy. Dedicated PC control for individual instruments provides quicker connection and configuration getting your test sequence up and running faster. Run from a USB, GPIB or RS-232 interface, your saved configurations shorten your process and measurements are presented in an easy to read graphical interface.
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Benchtop DC Electronic Load
63000
Chroma Systems Solutions, Inc.
The 63000 series programmable DC electronic loads are reliable, precision instruments primarily designed to test switching power supplies, A/D power supplies, power electronic components, adapters, 3C batteries and chargers. Its maximum 350W rated power makes it suitable for testing numerous types of lower power devices.
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Ultra-High Stability DC Power Supply
62075H-30N
Chroma Systems Solutions, Inc.
Chroma’s new 62075H-30N ultra-high stability DC power supply offers many unique advantages for magnet power supply systems in synchrotron applications. These advantages include an excellent current stability of 1.25mA/0.5 hour and 2.5mA/8 hour, extremely low current ripple of 2.5mA, current reproducible within 10mA, precision setting and readback of output current via 20 bit DAC/24 bit ADC.
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Medical System
Sentinel III
Chroma Systems Solutions, Inc.
The Sentinel III System provides complete Electrical Safety Testing to IEC60601-1 and IEC 60601-2-49 (Multifunctional Patient Monitoring Equipment) in a fully automated fashion. The Sentinel III saves time by scanning patient connections for leakage current without powering down the device.
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Low Power Programmable AC Source
61600 Series
Chroma Systems Solutions, Inc.
Power:500VA (61601)1000VA (61602)1500VA (61603)2000VA (61604)4000VA (61605)Voltage range: 0-150V/0-300V/AutoFrequency: 15Hz 1000HzCompact size and weight attributable to advance PWM technologyBuilt-in PFC, provide input power factor over 0.98 (full load)AC+DC output mode for voltage DC offset simulationProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage, current limitOne-key recall for 9 different voltage and frequencyLow output impedance for testing IEC 61000-3-2 ( 61605 )Comprehensive measurement capability, V, Irms, Ipk, Inrush, P, Q, S, PF, CF of current and etc.High output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates ON/OFFAnalog programming interface3 units combined to 3-phase power outputEasy-use software for operation and ON/OFF testOptional GPIB and RS-232C interfaceFull protection: OP,OC,OV and OT protection
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Battery Cycle Test Systems
Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
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Thermal/Multi-Function Data Logger
51101
Chroma Systems Solutions, Inc.
Models with 1, 8, and 64 channels on-line data recording. Multi-sets linked to a PC for hundreds of channels are doableSupports B, E, J, K, N, R, S, and T type thermal couples with ITS-90 defined temperature rangeIndividual channel cold junction compensation withTemperature resolution up to 0.01℃, error down to (0.01% of reading+0.3℃)Voltage full range ±480VDC, ±10VDC; resolution 1mV, 10uV; error down to (0.1% of reading+1mV), (0.015% of reading+100uV)1000VDC channel to channel isolation, full protection for testing points with charge and guarantee for accurate measurementsThermal couple open circuit detectionPC-based operation with powerful software for recording and analyzing data1 and 8 channel models are USB powered. No battery or external power supply is required
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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50Hz-100kHz LCR Meter
11022/11025
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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Milliohm Meter
16502
Chroma Systems Solutions, Inc.
Basic accuracy : 0.05%Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurementDC test current output mode is used to fasten measurement speed for inductive DUTDry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mVTemperature correction (TC function) regardless of material or temperatureUseful temperature conversion function for motor/ coil evaluation4 channels R scan with balance check function for fan motor (combined with A165017 option)0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolutionStandard RS-232 interfaceOptional GPIB & Handler interfaceBin-sorting functionComparator and pass/fail alarming beeper functionLarge LCD display (240 x 64 dot-matrix)Friendly user interface
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Solar
Chroma Systems Solutions, Inc.
This auto test system uses the unique test command optimization technology to prevent the repeating control commands from sending to the system hardware devices. This improves the system test speed dramatically and makes Chroma 8000, which uses open software architecture, highly efficient as a close or optimized auto test system.
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Production – High Speed Functional Test Systems
Chroma Systems Solutions, Inc.
Built for production, our high speed functional automated test system is based on our C8000 platform which uses a unique test command optimization technology to prevent sending repetitive control commands to the system hardware devices. This improves system test speed dramatically and, when used with our PowerPro III software, makes it highly efficient as a closed or optimized auto test system.