Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
Categories
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product
Universal Relay Driver Control - PXIe, 32 Channel Direct Relay Drivers
33011
PXI-e based universal relay control for semiconductor load boards, 32CH direct relay drivers, 2 lanes of SPI relay control interface
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Electrical 5-in-1 Production Safety Analyzers
Model 19032/19032-P
Electrical Safety Test (EST) Analyzer that combines the functions of impulse test, hipot, insulation resistance and DC resistance measurements. It has 5kVac/ 6kVdc high voltage output, 5kV insulation resistance, 6kV layer short impulse voltage and 4-wire DC resistance measurement that can comply with the wound components test demands by providing maximum 10 channels output for multichannel scanning tests to save time and labor costs.
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Package Level Test
Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel
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Server Power And Back Up Unit Test Solutions
Built on the proven Chroma 8000 ATS platform, these customizable solutions are specifically designed for automated testing of server PSUs, power shelves, rack power systems, bidirectional DC/DC converters for BBUs, and low-voltage high-current DC/DC converters for motherboards.
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AC Power Source
6500 series
The global AC power testing requirements demand more sophisticated AC Power Source that is capable of simulating a wide variety of AC line conditions, harmonic waveforms, accurate power measurement and analysis. The Chroma 6500 series Programmable AC Power Source delivers the right solution to simulate all kinds of normal/abnormal input conditions and measure the critical characteristics of the product under test. It can be used for R&D design characterization, production testing, and QA verification of commercial, industrial, and aerospace electronic products. The Chroma 6500 series delivers maximum rated power for any output voltage up to 300 Vac, and at any frequency between 15Hz to 2000Hz. It is suitable for commercial applications (47-63Hz); for avionics,marine, military applications at 400Hz or higher frequency; or for electrical motor, air-conditioner test applications at 20Hz. All models generate very clean sine or square waveforms output with typical distortion less than 0.5%. The Chroma 6500 series has built-in Direct Digital Synthesis (DDS) Waveform Generator to provide user programmable high precision waveform. For testing products under AC line distortion conditions, clipped sinewave can be generated with 0% to 43% distortion and amplitude from 0% to 100%. It also can simulate all kinds of power line disturbances such as cycle dropout, transient spike, brown out, phase angle, voltage and frequency ramp up (ramp down), etc.. Up to 30 harmonic waveforms are factory installed, and testing for compliance to AC line harmonic immunity standards can be easily achieved in the field.
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AC Electronic Load
AC&DC Electronic Loads are design for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources and other power devices such as switches, circuit breakers, fuses and connectors.
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FPD Tester Signal Module
A291800-03
The A291800 is an LVDS signal model that can be used with FPD Tester to provide LVDS panel standard signals and related controls for LVDS inspection.
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RF ATE Tester
ADIVIC MP5800/MP5806
MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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LED Load Simulator
63110A/ 63113A/63115A
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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Multi-Channel Power Module
67394
The 67394 Multi-Channel Power Module is a new generation of compact, stable and high reliability AC to DC power supply that can test the small size panels. It has multiple power sources with voltage/timing adjustable functions, protection functions and measurement circuits. Its modular design can work with FPD tester and PG card to provide standard power source for testing the panels.
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Wafer Level Test
Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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PCBA Pattern Analyzer
A222918
The test method in the PCBA mainboard production line today mainly depends on the operator judgment. It is "subjective" testing and the accuracy decreased when the operator works for a long time.
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Component Test Scanner
Model 13001
Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications






















