Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
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Product
2D/3D Wafer Metrology System
7980
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Chroma 7980 provides accurate and reliable profile information. 7980 adopts new BLiS technology and specially designed platform to achieve 2D/3D nanoscale measurement.
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Product
FPD Tester Signal Module
A291800-03
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The A291800 is an LVDS signal model that can be used with FPD Tester to provide LVDS panel standard signals and related controls for LVDS inspection.
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Product
Wi-Fi / Bluetooth / GPS Tester
MP5010
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wi-fi, Bluetooth, GPS test capabilities in one box, high speed production tester for mobile communication devices.
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Product
DC Power Supply
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DC power supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals as well as the ability to create complex DC transient waveforms to test device behavior for spikes, drops, and other voltage deviations.
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Product
Battery Cell Surge Tester
19311
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The Chroma 19311 series battery cell surge tester is designed for testing the insulation quality between the positive and negative plates of the lead-acid battery cell. This is done by applying a high voltage surge/impulse before the electrolyte injection. Its output voltage can reach up to 6kV. It also has four terminal measurement and 200MHz sampling rate. The Chroma 19311 series has single channel (19311) and multi-channel (19311-10) tester.
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Product
Advanced SoC/Analog Test System
3650
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Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Flat Panel Display Test Solutions
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Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Product
Octal Test Site Handler
3180
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The Chroma 3180 is a productive pick & place system for high-volume multi-site IC testing.
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Product
Ultra-High Stability DC Power Supply
62075H-30N
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The 62075H-30N output power has maximum 7.5kW/30V/250A power module designed with 4U height that can be connected easily as master or slave with three units to 22.5kW/30V/750A in parallel or two units to 15kW/60V/250A in series and operated as a standalone unit via system bus. The 62075H-30N provides stable DC output cur rent sour ce and powe r for pre c i s ion measurement. It offers an advanced 250A/30V ultra high-stable ±10 ppm (current stability ±1.25 mA) with high eciency and high power factor in compliance with energy savings. In addition it has a 20 bit digital control with bright vacuum fluorescent display readout.
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Product
Passive Component ATS
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Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Wound Component EST Analyzer
19036
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Chroma 19036 is the industry's first wound component electrical safety test (EST) analyzer that combines the functions of impulse test, hipot, insulation resistance and DC resistance measurements. It has 5kVac/ 6kVdc high voltage output, 5kV insulation resistance, 6kV layer short impulse voltage and 4-wire DC resistance measurement that can comply with the wound components test demands by providing maximum 10 channels output for multichannel scanning tests to save time and labor costs.
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Product
FPD Tester Power Module
67393-120-480
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The 67393-120-480 FPD Tester Power Module is a new generation of small, stable, high reliability AC to DC power supply. It adopts compact mechanical design and uses Chroma FPD Tester for signal input/output that can provide a total solution for testing the signal, control and power of diversified panels.
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Product
PCBA Pattern Analyzer
A222918
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The test method in the PCBA mainboard production line today mainly depends on the operator judgment. It is "subjective" testing and the accuracy decreased when the operator works for a long time.






















