Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
Categories
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product
Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Brick Power Module Test
Modern servers, workstations, and telecom equipment often use an Intermediate Bus Architecture (IBA) powered by isolated DC/DC converters known as "brick" modules. These brick converters step down the input voltage to a lower DC bus voltage, enabling designers to implement efficient, high-density, non-isolated Point-of-Load (POL) regulators that power components such as microprocessors, FPGAs, and ASICs on system boards. With smaller voltage step-down ratios now common, designing POL regulators has become more straightforward. Brick modules are so named for their standard physical formats (1/4 Brick, 1/2 Brick, Full Brick, etc.), making them easy to integrate and replace.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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product
Electrical Safety Test Solutions
Hipot Analyzers with 500VA output rating can be used to test and analyze the withstand voltage of high power and leakage current for the products like motor stators and rotors with high parasitic capacitance. Corona detection can be used for turn-to-turn or turn-to-ground test to avoid winding insulation failure from corona discharge.
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product
Introduction to Graphical User Interface - Softpanel
61800 Series
The increased demand for Distributed Energy Resource (DR) products such as PV Inverter and Wind Energy systems, have increased the demand for regulation test standards to insure proper operation and safety of on-grid products. Manufacturers testing to prove compliance, need test equipment that can simulate and measure and test their products. Chroma’s 61800 family of Regenerative Grid Simulators provide a full 4 quadrant, regenerative, grid simulation for compliance, safety, and product verification testing
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product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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product
Wi-Fi / Bluetooth / GPS Tester
MP5010
wi-fi, Bluetooth, GPS test capabilities in one box, high speed production tester for mobile communication devices.
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product
Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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product
Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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product
Thermal Data Logger
51101 Series
It is a general requirement to record temperatures, voltages, currents, and many physics quantities during research, product development, productions, and quality assurance processes. The number of record channels can be a simple one to several complicated set of hundreds. Thermal/multi-function data loggers are prefect solutions to serve for these measurement and tracking needs.
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Passive Component ATS
Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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Automated Optical Inspection Solutions
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system






















