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NF
1) EMF closest to the antenna. 2) Near-field optics.
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Near Field Strength Monitor / Bug Detector
NFSM-2000
Locate and Identify Hidden Radio Transmitters with an all Digital Display, earphone and accompanied tool for finding hidden RF Wireless Cameras.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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RGO-2000P Robotic Goniophotometer For Plant Lighting
Hangzhou Everfine Photo-E-Info Co., LTD
RGO-2000P proposed a solution based on the plant lighting requirement to measure and evaluate the spatial light distribution performance of plant lighting based on the limitations of far-field measurement and ILMD near field distribution goniophotometer.
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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LED626/620 Goniophotometer For LEDs
Hangzhou Everfine Photo-E-Info Co., LTD
It can measure the luminous intensity data and automatically plot the luminous intensity distribution curve and luminous flux, and the test conditions meet the CIE condition A (far field) or condition B (near field).In addition, the software can provide customers with 3D luminous intensity distribution graphic.
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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EMC Scanner
EMxpert
EMXpert is a unique magnetic near field scanning system that helps designers be highly productive in understanding and diagnosing these problems, quickly and early in the development cycle.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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NF-Series Standard Plus Models
The E-DRIV® NF-Series standard plus models feature a selectable Double Hit Mode for soft joint applications and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Near Field Probes
Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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C-Band Separate Raman Fiber Amplifier
RFA5000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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NF-Series Angle And Auto Reverse Models
The E-DRIV® NF-Series angle and auto reverse models is designed for installing heli-coil screw thread inserts, as well as light tapping and gauging applications. The assembly power tools feature the brushless motor technology and is engineered for precision torque control. These installation tools feature the ability to set and adjust the speed, the rotation (number of turns), as well as program an auto reverse function. Using the assembly tool in conjunction with a torque arm enhances the installation process. The electric screwdriver offers an adjustable speed setting. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Shielding Effectiveness/ Conductivity Test
EM-2107A | 30 MHz – 1.5 GHz
The EM-2107A is a standard test fixture for evaluation of the electromagnetic shielding effectiveness of planar material. The fixture is an enlarged section of coaxial transmission line and complies fully with the requirements of ASTM test method D4935-1. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred. The EM-2107A is provided with a reference standard test specimen, a dynamic range specimen. Dynamic range of greater than 80dB is achievable, although the cables and other test system components usually establishes the limiting factors.
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Low Noise Amplifiers (NF < 3 DB)
Qorvo offers a variety of transistors and amplifiers with industry-leading low noise performance. We provide multiple product solutions, ranging from discrete transistors, packaged MMIC solutions incorporating internal matching and on-chip linearization, and dual amplifiers for use as push-pull or balanced amplifier configurations. Qorvo's LNAs are manufactured using our pHEMT processes with 0.15 µm, 0.25 µm or 0.5 µm gate lengths.
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RF Near Field Scanner
The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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IRIG Time Code Receiver for Computers (PCI Express)
TCR180PEX-EL
Meinberg Funkuhren GmbH & Co. KG
The TCR180PEX-EL receives IRIG-A/B/G, IEEE 1344, IEEE C37.118 or AFNOR NF S87-500 time codes and can be used for synchronizing the system time of its host PC. The IRIG output of this card can generate an IRIG signal for other IRIG time code readers. It is used in applications like data acquisition, standalone computer time synchronization (for systems without a network connection or higher accuracy requirements).
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Variable Gain Amplifiers
50 dB Gain, 14 dBm P1dB, 100 MHz to 18 GHz, Rack Mount, Variable Gain Amplifier, 6.5 dB NF, SMA
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V-Band Low Noise Amplifier 50 to 75 GHz, 35 dB Gain, 5 dB NF
SBL- 5037533550-1515-E1
50 to 75 GHz, 35 dB Gain, 5 dB Noise Figure V Band Low Noise Amplifier for IEEE 802.11.ad WiGig. Model SBL-5037533550-1515-E1 is a low noise amplifier with a typical small signal gain of 35 dB and a nominal noise figure of 5 dB across the frequency range of 50 to 75 GHz. The DC power requirement for the amplifier is +8 VDC/150 mA. The mechanical configuration offers an in-line structure with WR-15 waveguides and UG-385/U flanges.
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Preamplifier
Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
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Antennas
Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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EMC Near Field Probes
TBPS01
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
