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*Terahertz Measurement
Terahertz laser power and beam profiling measurement is not a trivial task. But as anyone using or developing THz lasers knows, it is crucial to obtain accurate measurements of your laser. Ophir offers a few choices, depending on what aspect of your laser you need to measure. Read these posts for more about Terahertz measurement.
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PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Tunable Laser Source - MATRIQ
The Laser 1000 Series is a fully-compliant micro-ITLA laser with up to four channels in a compact benchtop form factor.Offering 0.01 pm resolution tunability across C or L bands, exceptional power accuracy up to 16.5dBm, and optional dither suppression, this is a versatile and cost-effective general purpose instrument.
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Fixed Wavelength CW Laser Source (FP) - PXI
Laser 1100 Series
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
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Fixed Wavelength CW Laser Source (DFB)
Laser 1200 Series
The Laser 1200 Series is a highly customizable fixed-wavelength Continuous Wave (CW) laser source available in a wide range of wavelengths and powers.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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Tunable Laser Source - PXI
Laser 1000 Series
The Laser 1000 Series PXIe module is a Continuous Wave (CW), tunable laser source offering high-power output, narrow 100kHz linewidth and 0.01pm resolution tunability.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Fixed Wavelength CW Laser Source (FP) - MATRIQ
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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*Beam Profiling For 266nm To 3000µm
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Ultra-compact Laser Collimated Beam Sensor
HL-T1
Panasonic Industrial Devices Sales Company of America
The HL-T1 Sensor is an ultra-small laser Thru-Beam Sensor with very high resolution.
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Beam Characterization
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Wave Profiler
The Wave Profiler allows the user to measure non-directional wave parameters continuously for long periods of time with high temporal and spatial resolution in deeper water from the safety of an underwater mooring. The instrument is particularly useful for clients who need to measure long-period waves (such as rogue waves or infra-gravity waves), waves in wash and in wakes, and non-linear waves.
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Optical Profilers
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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Beam Profiling System
BeamCheck
BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Wind Profilers
Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
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Laser
BDS-SM Series
*Pulse Width Down to 60 ps*Repetition Rate 20 MHz /50 MHz / 80 MHz / CW (Switchable)*Free Beam or Fiber Output*All Electronics Integrated*No External Driver Unit*Simple +12 V Supply*40 mm x 70 mm x 120 mm
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Beam Profiler Software
RayCi
CINOGY’s beam profilers are available with the specifically designed beam profiling software RayCi, which utilizes new developed correction algorithms and incomparable visualizations modes. This ensures the highest accuracy in beam profile analysis according to ISO standards.
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Ion Beam Etch
Nexus IBE Series
Etch precise, complex features for high-yield production of discrete microelectronic devices and components with the NEXUS® Ion Beam Etch (IBE) Systems.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Beam and Singlepoint Load Cells
We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
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Oven Temperature Profile
Temperature profiling provides an effective method for measuring the actual environmental and product temperature during the cure process - essential for ensuring quality finish and a successful cure of a powder coating.
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Soluble Salt Profiler
130 SSP
The Elcometer 130 Soluble Salt Profiler provides fast and accurate measurement of the level and density of soluble salts - over 4 times faster than other Bresle equivalent methods. The new Elcometer 130 Soluble Salt Profiler allows you to complete a Bresle equivalent test in just over two minutes. The multi-point conductivity sensors enable the Elcometer 130 SSP to accurately display salt concentration, showing exactly where the contamination lies and generating full colour salt density maps in 2D or 3D.
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Bending Beam Load Cell
Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
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Camera BasedBeam Profilers
Our Camera beam diagnostic Line-up offers measuring capabilities starting from sub-micron laser beams to sensors of 1/1.2" with built-in automatic filters wheels. The camera based beam diagnostic offers the intensity measuring profile and the detailed beam power distribution within the profile.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
