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Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion beam into the TOF mass spectrometer. This increases the sensitivity dramatically and also improves the instrument’s mass resolving power. Utmost resolution, sensitivity and lowest real-time detection limit are now available in a robust, transportable platform that is smaller and lighter than previous products.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Ion Beam Etch
Nexus IBE Series
Etch precise, complex features for high-yield production of discrete microelectronic devices and components with the NEXUS® Ion Beam Etch (IBE) Systems.
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Ion Beam Deposition
Create ultra-precise, high-purity, thin film layer devices with maximum uniformity and repeatability with Ion Beam Deposition (IBD) Systems.
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Ion Meter
It can measure pH value, and several kinds of buffer solutions can be selected to have one-point or two-point (up to5-point) calibration. The user can establish standard buffer groups and the meter can recognize 10 kinds of buffer solutions.
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Ion Chromatography
Eco IC
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
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ION Meters
GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
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Beam Characterization
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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pH Ion Meter
pH Ion Meters can be used in research institutions, and at a variety water quality related production sites in the mining, agriculture, forestry and fishery industries, for measuring the ionic concentration and various laboratories for the researches and drug manufacture processes. In addition, it is used in agriculture to measure the salinity levels of surface water and of soil samples and also measure the quality of water.
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Ion Blower Nozzles
VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Focus Indicator
FM1
This unit will allow fine adjustment of overall focus of a CCTV camera, especially useful whenever a monitor is not available. It operates by analysing the detail in the centre of the picture and provides a 10 bar LED readout, displaying maximum output when the camera image is in sharpest focus. An input impedance switch provides selection between terminated (75Ω) and unterminated (high impedance) input.
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Micro Focus A-Z
Buy solutions that help you build, test, and secure the apps your enterprise needs.
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Ion 700 Benchtop Meters
Oakton benchtop 700-series meters are designed for use in crowded laboratory settings. Compact footprint of less that 6" x 7" (16 x 18 cm) conserves valuable space, while the large, dual-display LCD provides excellent visibility—even from a distance. Ion 700 meter measures pH, mV, relative mV, ion concentration and temperature. Automatic temperature compensation (ATC) maintains reading accuracy even with fluctuating temperatures. Models feature five-point pH calibration with automatic buffer recognition for both USA (pH 1.68, 4.01, 7.00, 10.01, 12.45) and NIST (pH 1.68, 4.01, 6.86, 9.18, 12.45) pH buffers. Meters additionally feature ion concentration calibration of up to 5 points. Meter features include Auto-Hold, selectable °F or °C measurement, and easy recall of electrode slope or offset. The convenient pull-out quick reference card keeps procedures handy at all times. Use 700-series meters with any pH, ORP, or ISE electrodes with a BNC connector.
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Beam and Singlepoint Load Cells
We have trimmed all the non-essential fat off these load cells, however you can be sure that nothing has been trimmed from the actual load cells, they are precision tested and certified to meet all the exacting requirements on the downloadable technical specifications shown below.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Ion Chromatography
940 Professional IC Vario
High-end ion chromatography system for research applications and method development
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Focus Control And Stabilization
Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
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Bending Beam Load Cell
Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
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Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Salt-22
The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B) and converts it into salinity or NaCl salt concentration. No need for a beaker to calibrate the meter or measure a sample. Just place few drops of the standard or sample onto the sensor. This procedure saves you time and prevents wasting your precious sample.
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Carbon Fibre Beam Gauge
Designed to measure both internal and external diameters and lengths, the high modulus carbon fibre beam is stiff, lightweight and has an extremely low co-efficient of thermal expansion (CTE). Suitable for measuring high accuracy diameters and lengths up to 4000mm+.
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Water-soluble Ion Analyzer
WAGA-100
Sample gas passes through denuder, and soluble gas will be analyzed by ion chromatograph first; the aerosol will then be inflated and given into ion chromatography to analyze soluble aerosol.
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Electron Beam Lithography System
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Secondary Ion Mass Spectrometry (SIMS Analysis)
Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Configurable CAN FD Module With A Focus On Analog I/Os
PCAN MicroMod FD Analog 1
The PCAN-MicroMod FD breadboard can be purchased together with ready-to-use motherboards that provide peripherals for specific requirements. Spring clamp connectors are used to connect CAN, I/O and supply. The motherboard PCAN-MicroMod FD Analog 1 focuses on analog inputs and outputs, which are provided with the appropriate protective circuit.
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Beam Directional Power Supply Mains
SiteX CP160D
The CP160D is the lightest and most compact generator of the CPSERIES. Featuring a built-in Beryllium window, it is the perfect generator for the inspection of light alloys such as aluminum, magnesium or fiber based materials like glass and carbon, as well as the greater thickness of steel. In fact, with its penetration capacity that is capable of reaching up to 37 mm of steel, the CP160D is able to execute many different types of NDT tasks without the need to ever have to add extra accessories.
