Production Test Systems
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Product
Standard Panel & Display Products
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Standard Panel & Display Products by Teledyne Defense & Electronics
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Product
Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Product
High Voltage Products
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Advanced Energy's high voltage products feature high-performance power supplies and amplifiers. Each product line features hundreds of units, options, and accessories to meet your application needs.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-PUSH
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Foerster Instruments, Incorporated
The ROTO-PUSH test station, which is integrated in production lines, serves to test cylindrical components for cracks in the liner surface. The testing configuration has to be rotated for automatic crack testing. After the test, the test pieces are sorted and separated. The continuous test run ensures a high testing rate, which increases profitability.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Thermal Control Products
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
Electronic Ballast Production Line Tester
UI2000-OK
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• Eight windows for displaying input characteristics, output characteristics, convenient for comparison and analysis. • Frequency response for testing input current up to 1 MHz, suitable for precise testing of various kind of electronic ballast. • High speed testing, finish testing input and output characteristics within 1 minute. • Portable with built-in chip micro-processor, particular suitable for development and spot production. • Parameters, waves and curves of input, output and startup can be printed. • Communicating with PC, special software provided and both Chinese version and English version available. Run in WINDOWS3.2, WINDOW95 or WINDOWS98, nice interface between people and computer, easy to operate.
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Product
Flex and Software Products
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FLEXSTAND is a simple to use and flexible interface that significantly reduces the development time of operator interfaces requiring only basic programming skills. By using FLEXSTAND you can create simple or advanced operator interfaces in hours instead of weeks. A specially designed interface (API) hides all the complex TestStand properties and methods that usually make the task of creating operator interfaces difficult. Dynamic Operator interfaces can easily be created that change the User Interface to the task being performed. Not only that the product automatically adjusts the size of the user Interface to fit the size of the LabVIEW™ front panel.
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Product
Photoelectrochemical Test System
ModuLab XM
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The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Product
AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Product
Product Safety Compliance Testing
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Compliance with electrical safety standards and directives is a mandatory requirement worldwide. Our comprehensive NATA accredited safety testing facility at our Sydney Branch (since 1996) and the A2LA accredited Melbourne facilities at Keilor Park , provide a choice of NATA or A2LA accredited testing.
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Thermal Stability Test System
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Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Product
Integrated 5G mmWave Test System
IQgig-5G
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The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Product
LED Test Production System
Lumere-LC
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Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Product
Power Module And Device Testing System
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Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Power Quality Products
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Schaffner offers a unique mix of harmonic filters, output filters, and LCL filters to rebuild and maintain the quality of power that meets local and international standards as well as meeting customer requirements.
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Product
Productivity Software
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From simple connection to programmatic control, Keysight provides all the software tools necessary to accelerate the process. Compatible with the most common interfaces (GPIB, RS-232, LAN, PXI, and USB), Keysight's IO Libraries will quickly discover and configure instruments. Once the connection is established, Command Expert can control instruments using IVI-COM drivers and Standard Commands for Programmable Instruments (SCPI) Command Sets. Instrument drivers provide a higher-level and more abstract view of the instrument. IntuiLink software links an instrument to some PC applications. BenchVue software offers multiple instrument measurement visibility and data capture from a PC or mobile device with no programming.
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Product
Diagnostic Test System™
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The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Measuring Systems For Night Vision Systems
MTF Test Bench For Image Intensifier Tubes (IIT) And Night Vision Devices (NVD)
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Optik Elektronik Gerätetechnik GmbH
The MTF MASTER NVD was specially designed to measure the MTF of Night Vision Devices (NVD) and of Image Intensifier Tubes (IIT).
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Product
PCI / PMC / CompactPCI Test System
PCITS
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The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PD Test Systems
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1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Industrial Control Panel Products
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Limit switches, relays, pushbuttons, timers and counters for every application.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Audio Products
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A range of solutions for audio system needs, including signal distribution, signal processing, and cabling.
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Product
Full Vehicle Test Systems
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MB Dynamics delivers effective, low-cost, and quiet excitation technology to root source S&Rs in vehicles, trimmed bodies, subsystems and components, including 4 poster test rigs. MB’s patented Direct Body Excitation (DBE) Road Simulator and Dynamic Vehicle Torquer (DVT) are advanced vehicle road simulation technologies which help detect vehicle S&Rs during development, launch, and production.
